Patents by Inventor Tor Slettnes

Tor Slettnes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9984302
    Abstract: A computer-implemented method for detecting a presence of an object-of-interest in a system is provided. The method includes imaging the first object-of-interest including an identifier, wherein the imaging generates a first set of image data and determining the portion of the image data including the identifier based on a predetermined location. The method further includes dividing the portion of the image data including the identifier into at least two segments Next, the presence of the object-of-interest is determined by determining if intensity values within each segment exceed a presence threshold.
    Type: Grant
    Filed: May 22, 2014
    Date of Patent: May 29, 2018
    Assignee: LIFE TECHNOLOGIES CORPORATION
    Inventors: Tor Slettnes, Sylvia H. Chang, Swati Goyal, David Comstock
  • Publication number: 20160110624
    Abstract: A computer-implemented method for detecting a presence of an object-of-interest in a system is provided. The method includes imaging the first object-of-interest including an identifier, wherein the imaging generates a first set of image data and determining the portion of the image data including the identifier based on a predetermined location. The method further includes dividing the portion of the image data including the identifier into at least two segments Next, the presence of the object-of-interest is determined by determining if intensity values within each segment exceed a presence threshold.
    Type: Application
    Filed: May 22, 2014
    Publication date: April 21, 2016
    Applicant: LIFE TECHNOLOGIES CORPORATION
    Inventors: Tor Slettnes, Sylvia H. Chang, Swati Goyal, David Comstock
  • Patent number: 7423255
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: September 9, 2008
    Assignee: Applera Corporation
    Inventors: Dmitry M. Sagatelyan, Tor Slettnes
  • Patent number: 7423251
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Grant
    Filed: June 26, 2006
    Date of Patent: September 9, 2008
    Assignee: Applera Corporation
    Inventors: Dmitry M. Sagatelyan, Tor Slettnes
  • Publication number: 20070145243
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Application
    Filed: June 26, 2006
    Publication date: June 28, 2007
    Inventors: Dmitry Sagatelyan, Tor Slettnes
  • Publication number: 20070139531
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Application
    Filed: December 29, 2006
    Publication date: June 21, 2007
    Applicant: APPLERA CORPORATION
    Inventors: Dmitry Sagatelyan, Tor Slettnes
  • Patent number: 7067791
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Grant
    Filed: February 17, 2005
    Date of Patent: June 27, 2006
    Assignee: Applera Cororation
    Inventors: Dmitry M. Sagatelyan, Tor Slettnes
  • Publication number: 20050145780
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Application
    Filed: February 17, 2005
    Publication date: July 7, 2005
    Inventors: Dmitry Sagatelyan, Tor Slettnes
  • Patent number: 6894264
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Grant
    Filed: October 15, 2002
    Date of Patent: May 17, 2005
    Assignee: Applera Corporation
    Inventors: Dmitry M. Sagatelyan, Tor Slettnes
  • Publication number: 20040069928
    Abstract: A photo-detector generated signal is measured as a sample set comprising a long signal and a short signal. The short signal is scaled to the value of the long signal if the long signal exceeds a dynamic range associated with the photo detector. In one embodiment, the short signal is obtained during a short time interval that is at the approximate middle of a long time interval such that the short and long intervals share a common median time value. Given such symmetry, an approximately linear signal yields a proportionality parameter between the long and short signals thereby allowing the short signal to be scaled. The proportionality parameter facilitates determination of an integration independent component of the photo detector signal that should be removed from the measured long and short signals before scaling. A plurality of sample sets can also be processed such that each sample set overlaps with its neighboring sample set, thereby increasing the effective number of sample sets.
    Type: Application
    Filed: October 15, 2002
    Publication date: April 15, 2004
    Inventors: Dmitry M. Sagatelyan, Tor Slettnes
  • Patent number: 6040586
    Abstract: A data collection method for scanning a scan window comprising one or more channels is described. In the method of the invention an integrated signal (S) is measured across a scan window including one or more channels using an integrating detector. Next, a velocity-normalized integrated signal (Sn) is determined based on the integrated signal (S) and a scan velocity.
    Type: Grant
    Filed: May 5, 1998
    Date of Patent: March 21, 2000
    Assignee: The Perkin-Elmer Corporation
    Inventor: Tor Slettnes
  • Patent number: RE38817
    Abstract: A data collection method for scanning a scan window comprising one or more channels is described. In the method of the invention an integrated signal (S) is measured across a scan window including one or more channels using an integrating detector. Next, a velocity-normalized integrated signal (Sn) is determined based on the integrated signal (S) and a scan velocity.
    Type: Grant
    Filed: February 14, 2002
    Date of Patent: October 11, 2005
    Assignee: Applera Corporation
    Inventor: Tor Slettnes
  • Patent number: D740848
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: October 13, 2015
    Assignee: Life Technologies Corporation
    Inventors: Ronald Bolts, Tor Slettnes
  • Patent number: D795283
    Type: Grant
    Filed: September 23, 2015
    Date of Patent: August 22, 2017
    Assignee: LIFE TECHNOLOGIES CORPORATION
    Inventors: Ronald Bolts, Tor Slettnes
  • Patent number: D795913
    Type: Grant
    Filed: September 23, 2015
    Date of Patent: August 29, 2017
    Assignee: LIFE TECHNOLOGIES CORPORATION
    Inventors: Ronald Bolts, Tor Slettnes
  • Patent number: D1023027
    Type: Grant
    Filed: September 15, 2021
    Date of Patent: April 16, 2024
    Assignee: 10X GENOMICS, INC.
    Inventors: Tor Slettnes, Christopher Wing