Abstract: Proposed is a technique for implementing data communication and distance measurement even in a case where data communication and distance measurement share the physical layer. A wireless communication apparatus includes a radio unit and a distance measuring unit. The radio unit performs communication using a frame that includes at least a data period for transferring data and a beacon period for transmitting a beacon. The distance measuring unit utilizes the beacon period to measure the distance from the wireless communication apparatus to a target object whose distance is to be measured.

Abstract: A sheet supplying unit having no need to place a great many skew sensors and enabling printing apparatus to simplify structure and to reduce cost. The sheet supplying unit moves a skew sensor to a most left sensor position in which the table sensor detected that the print medium exists, detects the upper edge of print medium, and executes a skew detection; in the case that the print medium is narrow, moves a skew sensor, detects the upper edge of print medium, and executes a skew detection; in the case that a position of skew sensor does not place at a position keeping a predetermined margin at the inside of the print medium, moves skew sensor to the inside of the print medium and executes again an inclination detection; or according to print medium width and skew sensor width, changes a skew judgment quantity.

Abstract: An image pickup apparatus which is capable of interrupting a data searching process quickly without detecting a user pressing a search interruption button. A system controller circuit carries out a searching process for searching least one desired data from a plurality of data stored in a nonvolatile memory or a memory card. When a change-of-status of the image pickup apparatus is detected, for example, when a shutter button has been pressed halfway, the system controller circuit interrupts the searching process and executes an interruption process.

Abstract: A dimension measurement method includes: irradiating a measurement mark with light, the measurement mark being formed on a sample on which a pattern to be measured is formed, the measurement mark comprising measurement patterns of the same shape as at least part of the pattern to be measured, the measurement patterns being arranged in a matrix constituted of measurement pattern columns which are repetitively disposed with a predetermined space in the direction of an arbitrary measurement direction which would provide a measurement target dimension of the pattern to be measured, the measurement pattern column being composed of the measurement patterns disposed with a predetermined period in the direction perpendicular to the measurement direction, and the light being fallen from the measurement direction; detecting reflected diffracted light from the measurement mark to measure intensity thereof; calculating a theoretical value of the intensity of the reflected diffracted light from a plurality of candidate va

Abstract: A first beam radiation is effected by uniformly radiating an electron beam on a vicinity of an underlying mark formed on a sample. The underlying mark is formed of a material with an emission efficiency of secondary electrons different from that of the other part of the sample. Thus, a surface of the sample is charged. A second beam radiation is effected by radiating an electron beam under conditions different from those of the first beam radiation, thereby scanning the mark. Secondary electrons from the surface of the sample are detected to determined the mark position. On the basis of the mark position, an alignment exposure is effected.

Abstract: A mounting assembly for a first ornamental molding (2), comprises a second molding (10) independent of the first ornamental molding (2) and integrally fixed to and along the periphery of a window glass (1), and a molding clip (6) for holding the first molding (2). The molding clip (6) is fixed to the second molding (10 upon a molding process of the second molding. The molding clip (6) includes a body portion (17) defining therein a space for receiving an engagement portion (29) of the first molding, an engagement pawl (18) disposed on the inside of the body portion and adapted to engage with the engagement portion (29) of the first molding, and a flange (19) formed on the outside of the body portion and enclosed in the second molding (10) so as to fix the molding clip (6) to the second molding (10). The molding clip (6) is adapted to be positioned in a gap between the periphery of the window glass and a window frame (11) of a vehicle body by placing the window glass (1) on the window frame (11).

Abstract: A sample has a first mark and a second mark formed in a layer upper than the first mark on a Si substrate. The first and second marks are arrange such that they do not have an overlapping area in a direction in which relative positions of the first and second marks are measured. The sample is scanned with an electron beam, detecting a first scattered-electron signal from the sample on a line including the first mark, and a second scattered-electron signal from the sample on a line including the second mark. Based on the first and second scattered-electron signal, representative positions of the first and second marks are obtained, and a positional misalignment amount of the first and second marks is further obtained.

Abstract: A jig for inspecting the appearance of small parts with an optical microscope, the jig is equipped with a base, having an upper flat surface which becomes a mounting stage of the optical microscope, and is also provided with a member for moving the upper flat surface at least in a direction approximately parallel to a direction of an optical axis of an objective lens of the optical microscope in order to focus the optical microscope on an inspection portion of the small parts mounted on the upper flat surface. The jig is also equipped with an inspection-object supporting portion, provided with a member for supporting the small parts at the predetermined portion on the base. Furthermore, the jig is equipped with reflecting mirrors which have a mirrorlike surface with an inclined angle of approximately 45 degrees to the upper flat surface of the base.

Abstract: A mounting assembly for a first ornamental molding 2, comprises a second molding 10 independent of the first ornamental molding 2 and integrally fixed to and along the periphery of a window glass 1, and a molding clip 6 for holding the first molding 2. The molding clip 6 is fixed to the second molding 10 upon a molding process of the second molding. The molding clip 6 includes a body portion 17 defining therein a space for receiving an engagement portion 29 of the first molding, an engagement pawl 18 disposed on the inside of the body portion and adapted to engage with the engagement portion 29 of the first molding, and a flange 19 formed on the outside of the body portion and enclosed in the second molding 10 so as to fix the molding clip 6 to the second molding 10. The molding clip 6 is adapted to be positioned in a gap between the periphery of the window glass and a window frame 11 of a vehicle body by placing the window glass 1 on the window frame 11.

Abstract: An apparatus for serial communication includes a communication function block unit which transmits a serial communication output, a logical operation unit which performs an logical operation on the serial communication output, a register which stores settings therein indicative of an error detection condition and an error correction condition, and an error correction unit which controls said logical operation unit according to the error correction condition in such a manner as to correct an error of the serial communication output upon detecting the error according to the error detection condition.

Abstract: A sample has a first mark and a second mark formed in a layer upper than the first mark on a Si substrate. The first and second marks are arrange such that they do not have an overlapping area in a direction in which relative positions of the first and second marks are measured. The sample is scanned with an electron beam, detecting a first scattered-electron signal from the sample on a line including the first mark, and a second scattered-electron signal from the sample on a line including the second mark. Based on the first and second scattered-electron signal, representative positions of the first and second marks are obtained, and a positional misalignment amount of the first and second marks is further obtained.

Abstract: A charged beam applying apparatus comprises a column at least having a charged beam generation section and optical system for controlling the charged beam and a chamber for holding a specimen in place which is exposed with the charged beam. At least one inner portion of the column is formed of a specific material whose an atomic number is equal or less than 22. When a contamination is cleaned off in the column through the utilization of an oxidation effect, an oxide film is sometimes formed inside the column. The electric charging of the oxide film causes a beam control error. The specific material such as the metal of the atomic number causes very much less such error. This is because such specific material involves less emission of secondary electrons and less electric charging in the oxide film formed.