Abstract: Provided is a radiation monitor, including: a radiation detection unit which includes a radiation detection element, the radiation detection element emitting light of a predetermined light emission wavelength; a light emission unit which emits light of a wavelength different from the light emission wavelength; a wavelength selection unit which passes the light of the light emission wavelength, and is set to a first mode to block the light from the light emission unit; an optical transmission line which transmits the light; a light detection unit which converts the light passing through the wavelength selection unit into an electric pulse; and a control unit which measures a count rate of the electric pulse, and determines whether at least the light emission unit is degraded on the basis of the count rate and a light intensity of the light emission unit.

Abstract: Provided is a radiation monitor, including: a radiation detection unit which includes a radiation detection element, the radiation detection element emitting light of a predetermined light emission wavelength; a light emission unit which emits light of a wavelength different from the light emission wavelength; a wavelength selection unit which passes the light of the light emission wavelength, and is set to a first mode to block the light from the light emission unit; an optical transmission line which transmits the light; a light detection unit which converts the light passing through the wavelength selection unit into an electric pulse; and a control unit which measures a count rate of the electric pulse, and determines whether at least the light emission unit is degraded on the basis of the count rate and a light intensity of the light emission unit.

Abstract: An ?-ray measuring apparatus is provided for accurately analyzing the energy of a trace of ?-rays emitted from a sample in a short time using semiconductor detectors which excel in energy resolution. The ?-ray measuring apparatus comprises an ?-ray detector including a plurality of semiconductor detectors, an adder for adding output signals from the respective semiconductor detectors, an anticoincidence counter for anticoincidently counting the output signals from the respective semiconductor detectors, and a peak analyzer for analyzing an energy distribution of the ?-rays based on an addition of the output signals from the semiconductor detectors which are not anticoincidently counted. Since the output signals from the plurality of semiconductor detectors are added to increase the area of a sample under measurement and also remove background noise, the ?-ray measuring apparatus can more accurately analyze the energy of the ?-rays while reducing a measuring time.

Abstract: An &agr;-ray measuring apparatus is provided for accurately analyzing the energy of a trace of &agr;-rays emitted from a sample in a short time using semiconductor detectors which excel in energy resolution. The &agr;-ray measuring apparatus comprises an &agr;-ray detector including a plurality of semiconductor detectors, an adder for adding output signals from the respective semiconductor detectors, an anticoincidence counter for anticoincidently counting the output signals from the respective semiconductor detectors, and a peak analyzer for analyzing an energy distribution of the &agr;-rays based on an addition of the output signals from the semiconductor detectors which are not anticoincidently counted. Since the output signals from the plurality of semiconductor detectors are added to increase the area of a sample under measurement and also remove background noise, the &agr;-ray measuring apparatus can more accurately analyze the energy of the &agr;-rays while reducing a measuring time.