Patents by Inventor Toshiaki HAMANO
Toshiaki HAMANO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240092084Abstract: A technique capable of certainly suppressing adhesion of waste ink to hands, clothes, and the like during replacement of a waste ink tank is provided. There are included a container portion provided with an insertion port which a discharge member discharging waste ink can be inserted into and pulled out from and a shielding portion movable between a shielding position where the insertion port is shielded and an open position where the insertion port is opened.Type: ApplicationFiled: September 11, 2023Publication date: March 21, 2024Inventors: KOKI SHIMADA, TOSHIAKI SOMANO, YUTA ARAKI, KAORI KATAYAMA, YUSUKE TANAKA, TETSU HAMANO, ERIKA IYAMA, FUMIE KAMEYAMA, NOBUHIRO TOKI, YASUYUKI TAKANAKA, DAIJU TAKEDA
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Patent number: 11875497Abstract: An ultrasonic flaw detection device (A) includes: an ultrasonic probe (2) that emits ultrasonic waves to an inspection object (P) and detects reflected waves; a sheet material (1) attached to a surface of the inspection object and having two-dimensional patterns, the two-dimensional patterns being arranged on the inspection object and indicating positions on the inspection object; an imaging device (3) attached to the ultrasonic probe and imaging the two-dimensional patterns (1a); and a processing unit (21) that reads position information indicating a position on the inspection object from a captured image captured by the imaging device and relates a detection result of the ultrasonic probe to the position information, wherein the processing unit determines an index indicating the degree of quality of the detection result based on an air pocket area (HA) that is an area in which air pockets are shown in a predetermined area (H) of the captured image.Type: GrantFiled: August 26, 2021Date of Patent: January 16, 2024Assignee: IHI CORPORATIONInventor: Toshiaki Hamano
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Publication number: 20220137002Abstract: An ultrasonic flaw detection device includes: an ultrasonic probe that detects waveform data of ultrasonic echoes emitted to an inspection area of an inspection target; a processing unit that stores pieces of sampling data obtained by sampling the waveform data obtained by the ultrasonic probe at predetermined sampling intervals in a storage unit continuously in time series; and a display control unit that divides the inspection area into a plurality of divided areas and displays each of the plurality of divided areas on a display, wherein the processing unit directly or indirectly links a divided area of the plurality of divided areas to one or more waveform data containing sampling data of one or more sampling point included in the divided area.Type: ApplicationFiled: February 28, 2020Publication date: May 5, 2022Applicant: IHI CORPORATIONInventor: Toshiaki HAMANO
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Publication number: 20210390680Abstract: An ultrasonic flaw detection device (A) includes: an ultrasonic probe (2) that emits ultrasonic waves to an inspection object (P) and detects reflected waves; a sheet material (1) attached to a surface of the inspection object and having two-dimensional patterns, the two-dimensional patterns being arranged on the inspection object and indicating positions on the inspection object; an imaging device (3) attached to the ultrasonic probe and imaging the two-dimensional patterns (1a); and a processing unit (21) that reads position information indicating a position on the inspection object from a captured image captured by the imaging device and relates a detection result of the ultrasonic probe to the position information, wherein the processing unit determines an index indicating the degree of quality of the detection result based on an air pocket area (HA) that is an area in which air pockets are shown in a predetermined area (H) of the captured image.Type: ApplicationFiled: August 26, 2021Publication date: December 16, 2021Applicant: IHI CORPORATIONInventor: Toshiaki HAMANO
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Patent number: 10801996Abstract: An inspection system includes: a sheet material that is attached to a surface of a pipe and has two-dimensional patterns drawn thereon that are arranged on the pipe and indicate positions on the pipe; a reader that is mounted to an ultrasonic probe and reads the two-dimensional patterns; and a calculation unit that acquires position data on the pipe based on the two-dimensional patterns read by the reader. The inspection system associates the position data with a flaw detection result obtained from a detection result based on the ultrasonic probe.Type: GrantFiled: April 21, 2016Date of Patent: October 13, 2020Assignee: IHI CORPORATIONInventors: Eisuke Shiina, Toshiaki Hamano, Takuya Shimomura
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Patent number: 10365151Abstract: Disclosed is an inspection probe of an inspection system that includes an ultrasonic probe that is freely movable on a test object and irradiates the test object with an ultrasonic wave to detect a reflected wave, and a calculation unit that executes arithmetic processing according to a detection result according to the ultrasonic probe to acquire a flaw detection result of the test object. The inspection probe includes a chassis that is freely movable on a sheet material where a two-dimensional pattern disposed on the test object and indicating a position on the test object is drawn. The ultrasonic probe is fixed to the chassis so that an incident point of an ultrasonic wave that is incident onto an opposing surface of the test object from the ultrasonic probe is within an angle of view of the reader which reads the two-dimensional pattern.Type: GrantFiled: April 19, 2017Date of Patent: July 30, 2019Assignee: IHI CORPORATIONInventors: Toshiaki Hamano, Eisuke Shiina
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Publication number: 20170219422Abstract: Disclosed is an inspection probe of an inspection system that includes an ultrasonic probe that is freely movable on a test object and irradiates the test object with an ultrasonic wave to detect a reflected wave, and a calculation unit that executes arithmetic processing according to a detection result according to the ultrasonic probe to acquire a flaw detection result of the test object. The inspection probe includes a chassis that is freely movable on a sheet material where a two-dimensional pattern disposed on the test object and indicating a position on the test object is drawn. The ultrasonic probe is fixed to the chassis so that an incident point of an ultrasonic wave that is incident onto an opposing surface of the test object from the ultrasonic probe is within an angle of view of the reader which reads the two-dimensional pattern.Type: ApplicationFiled: April 19, 2017Publication date: August 3, 2017Applicant: IHI CORPORATIONInventors: Toshiaki HAMANO, Eisuke SHIINA
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Publication number: 20160231284Abstract: An inspection system includes: a sheet material that is attached to a surface of a pipe and has two-dimensional patterns drawn thereon that are arranged on the pipe and indicate positions on the pipe; a reader that is mounted to an ultrasonic probe and reads the two-dimensional patterns; and a calculation unit that acquires position data on the pipe based on the two-dimensional patterns read by the reader. The inspection system associates the position data with a flaw detection result obtained from a detection result based on the ultrasonic probe.Type: ApplicationFiled: April 21, 2016Publication date: August 11, 2016Applicant: IHI CORPORATIONInventors: Eisuke SHIINA, Toshiaki HAMANO, Takuya SHIMOMURA