Patents by Inventor Toshifumi Higuchi

Toshifumi Higuchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11867646
    Abstract: Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.
    Type: Grant
    Filed: November 1, 2021
    Date of Patent: January 9, 2024
    Assignee: RIGAKU CORPORATION
    Inventors: Makoto Kambe, Kazuhiko Omote, Toshifumi Higuchi, Tsutomu Tada, Hajime Fujimura, Masahiro Nonoguchi, Licai Jiang, Boris Verman, Yuriy Platonov
  • Publication number: 20230400423
    Abstract: Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.
    Type: Application
    Filed: November 1, 2021
    Publication date: December 14, 2023
    Inventors: Makoto KAMBE, Kazuhiko OMOTE, Toshifumi HIGUCHI, Tsutomu TADA, Hajime FUJIMURA, Masahiro NONOGUCHI, Licai JIANG, Boris VERMAN, Yuriy PLATONOV
  • Patent number: 6273236
    Abstract: A pallet exchange apparatus for a machine tool includes a horizontal rotary support for rotation about a vertical axis. A drive unit vertically moves and rotates the rotary support. The rotary support is flanked by a setup stand which is pivotable between a lying position for receiving a pallet and an upright position for transferring the received pallet onto the rotary support. Further, the rotary support has a plurality of pallet receivers each provided on the rotary support for receiving the pallet in an erect posture from the setup stand which has been pivoted to the upright position.
    Type: Grant
    Filed: February 14, 2000
    Date of Patent: August 14, 2001
    Assignee: Yasda Precision Tools K. K.
    Inventors: Yukihiko Yasuda, Tsuneto Sumida, Yoji Tanabe, Toshifumi Higuchi