Patents by Inventor Toshiharu Shimamaki

Toshiharu Shimamaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8519073
    Abstract: A compound represented by general formula (I); and a polymeric compound including a structural unit (a1) represented by general formula (II). wherein R represents a hydrogen atom, a halogen atom, a lower alkyl group or a halogenated lower alkyl group; each of R1 to R3 independently represents an alkyl group or a fluorinated alkyl group, with the provision that no fluorine atom is bonded to a carbon atom adjacent to the tertiary carbon atom to which R1 to R3 are bonded, and at least one of R1 to R3 represents a fluorinated alkyl group; and R2 and R3 may form a ring structure.
    Type: Grant
    Filed: October 15, 2007
    Date of Patent: August 27, 2013
    Assignees: Tokyo Ohka Kogyo Co., Ltd., Daito Chemix Corporation
    Inventors: Yoshiyuki Utsumi, Hiroaki Shimizu, Kyoko Ohshita, Toshiharu Shimamaki, Kenshin Niwa, Seihin Shu
  • Patent number: 8324331
    Abstract: A compound represented by general formula (a-i) below, and a polymeric compound having a structural unit represented by general formula (a-ii) below (wherein R represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group; X represents a divalent organic group represented by general formula (x-1) below; and R1 represents an organic group having a fluorine atom).
    Type: Grant
    Filed: December 16, 2009
    Date of Patent: December 4, 2012
    Assignee: Daito Chemix Corporation
    Inventors: Toshiharu Shimamaki, Kenji Uenaga
  • Publication number: 20100168358
    Abstract: A compound represented by general formula (a-i) below, and a polymeric compound having a structural unit represented by general formula (a-ii) below (wherein R represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group; X represents a divalent organic group represented by general formula (x-1) below; and R1 represents an organic group having a fluorine atom).
    Type: Application
    Filed: December 16, 2009
    Publication date: July 1, 2010
    Applicant: DAITO CHEMIX CORPORATION
    Inventors: Toshiharu SHIMAMAKI, Kenji UENAGA
  • Publication number: 20100069590
    Abstract: A compound represented by general formula (I); and a polymeric compound including a structural unit (a1) represented by general formula (II). wherein R represents a hydrogen atom, a halogen atom, a lower alkyl group or a halogenated lower alkyl group; each of R1 to R3 independently represents an alkyl group or a fluorinated alkyl group, with the provision that no fluorine atom is bonded to a carbon atom adjacent to the tertiary carbon atom to which R1 to R3 are bonded, and at least one of R1 to R3 represents a fluorinated alkyl group; and R2 and R3 may form a ring structure.
    Type: Application
    Filed: October 15, 2007
    Publication date: March 18, 2010
    Applicants: Tokyo Ohka Kogyo Co., Ltd., Daito Chemix Corporation
    Inventors: Yoshiyuki Utsumi, Hiroaki Shimizu, Kyoko Ohshita, Toshiharu Shimamaki, Kenshin Niwa, Seihin Shu
  • Patent number: 6153733
    Abstract: Disclosed is a poly(disulfonyl diazomethane) compound as a class of novel compounds represented by the general formula ##STR1## in which the subscript n is 1 to 5, each R is a monovalent hydrocarbon group and Z is a divalent hydrocarbon group. The invention also discloses a chemical-amplification positive-working photoresist composition which comprises the above mentioned poly(disulfonyl diazomethane) compound as the radiation-sensitive acid-generating agent in combination with a film-forming resin capable of being imparted with increased solubility in an aqueous alkaline solution by the interaction with an acid, such as a polyhydroxystyrene resin of which a part of the hydroxyl groups are substituted by acid-dissociable solubility-reducing groups, e.g., tert-butoxycarbonyl groups.
    Type: Grant
    Filed: May 13, 1999
    Date of Patent: November 28, 2000
    Assignees: Tokyo Ohka Kogyo Co., Ltd., Daito Chemix Corporation
    Inventors: Hiroto Yukawa, Waki Ohkubo, Kouki Tamura, Toshiharu Shimamaki, Kei Mori
  • Patent number: 5945517
    Abstract: Proposed is a positive- or negative-working chemical-sensitization photoresist composition having advantages in respect of the contrast and resolution of patterning, photo-sensitivity and cross sectional profile of the patterned resist layer as well as in respect of stability of the latent image formed by pattern-wise exposure to light before post-exposure baking treatment. The composition comprises: (A) 100 parts by weight of a film-forming resinous ingredient which causes a change, i.e. increase or decrease, of solubility in an aqueous alkaline solution by the interaction with an acid; and (B) from 0.5 to 20 parts by weight of a radiation-sensitive acid-generating agent which is a diazomethane compound represented by the general formulaR.sup.1 --SO.sub.2 --C(=N.sub.2)--SO.sub.2 --R.sup.2,in which R.sup.1 and R.sup.2 are each, independently from the other, a monovalent cyclic group substituted on the cyclic nucleus by an acid-dissociable group such as a tert-butoxycarbonyl and acetal groups.
    Type: Grant
    Filed: July 21, 1998
    Date of Patent: August 31, 1999
    Assignees: Tokyo Ohka Kogyo Co., Ltd., Daito Chemix Corporation
    Inventors: Kazuyuki Nitta, Kazufumi Sato, Toshiharu Shimamaki, Kunio Hayakawa, Shin-ya Kuramoto