Patents by Inventor Toshihiro Ishizuka

Toshihiro Ishizuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170332965
    Abstract: A head mount apparatus mounted on a head of a user is disclosed, which includes: detection means to detect a variation of a bloodflow rate of the head; and transfer means to transfer a detection value of the detection means to a predetermined transfer destination. An information processing apparatus is also disclosed, which includes; receiving means to receive a detection value transferred from transfer means; and service providing means to provide a user with a service based on the received detection value.
    Type: Application
    Filed: November 25, 2015
    Publication date: November 23, 2017
    Inventors: Kiyoshi HASEGAWA, Kiyoshi NASU, Shigeya TANAKA, Toshihiro ISHIZUKA
  • Patent number: 7868635
    Abstract: An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a test for conductivity of a conductive wiring in a hole such as a through hole or a contact hole provided in a circuit board. The probe (10) is provided with an elastically deformable leg portion (11) and a contact portion (13) provided on a tip side of the leg portion (11) to be brought into contact with the conductive wiring (21) provided in a through hole (22). The contact portion (13) is formed to be in a shape and size so as to be prevented from entering the through hole (22).
    Type: Grant
    Filed: February 29, 2008
    Date of Patent: January 11, 2011
    Assignee: Fujitsu Limited
    Inventor: Toshihiro Ishizuka
  • Publication number: 20100105297
    Abstract: A polishing apparatus includes a cyclic mechanism moving cyclically in a certain direction, a holder moving cyclically by the cyclic mechanism in a direction parallel to an object to be polished, a plurality of polishing pins held on the holder, a magnet member including a first part which is exposed on a front face side of the polishing pin and a second part which is not exposed on the front face side of the polishing pin, a part of the second part being covered with a non-magnetic material, and a polishing member held on the polishing pin by magnetic force of the magnet member and polishing a tip of the object to be polished by the cyclic motion of the cyclic mechanism, wherein a contact area of the polishing member and the polishing pin includes a contact area of the magnet member and the polishing member.
    Type: Application
    Filed: October 23, 2009
    Publication date: April 29, 2010
    Applicant: FUJITSU LIMITED
    Inventors: Toshihiro Ishizuka, Masaharu Suzuki, Yutaka Noda
  • Publication number: 20100007365
    Abstract: A socket for a double ended probe with a first probe and a second probe includes a hollow pipe member housing the first probe and the second probe, the first probe and the second probe are arranged in an axial direction of the socket, and the socket includes an abutment holding the first probe and the second probe at predetermined positions on an inner side of the hollow pipe member.
    Type: Application
    Filed: July 1, 2009
    Publication date: January 14, 2010
    Applicant: FUJITSU LIMITED
    Inventors: Toshihiro Ishizuka, Takeo Ogawa
  • Patent number: 7612572
    Abstract: A probe 10 to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member 3 forming a main body; a nickel plating layer 4 constituting a ground layer and a gold plating layer 5 constituting an outermost layer formed on a surface of the base member 3; and a plurality of square-pyramidal 1 protrusions formed in a lattice-like fashion at one end of the base member 3 and brought into contact with the object of inspection.
    Type: Grant
    Filed: July 10, 2006
    Date of Patent: November 3, 2009
    Assignee: Fujitsu Limited
    Inventor: Toshihiro Ishizuka
  • Publication number: 20080157797
    Abstract: An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a test for conductivity of a conductive wiring in a hole such as a through hole or a contact hole provided in a circuit board. The probe (10) is provided with an elastically deformable leg portion (11) and a contact portion (13) provided on a tip side of the leg portion (11) to be brought into contact with the conductive wiring (21) provided in a through hole (22). The contact portion (13) is formed to be in a shape and size so as to be prevented from entering the through hole (22).
    Type: Application
    Filed: February 29, 2008
    Publication date: July 3, 2008
    Applicant: FUJITSU LIMITED
    Inventor: Toshihiro Ishizuka
  • Publication number: 20070229097
    Abstract: An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a test for conductivity of a conductive wiring in a hole such as a through hole or a contact hole provided in a circuit board. The probe (10) is provided with an elastically deformable leg portion (11) and a contact portion (13) provided on a tip side of the leg portion (11) to be brought into contact with the conductive wiring (21) provided in a through hole (22). The contact portion (13) is formed to be in a shape and size so as to be prevented from entering the through hole (22).
    Type: Application
    Filed: May 24, 2006
    Publication date: October 4, 2007
    Applicant: FUJITSU LIMITED
    Inventor: Toshihiro Ishizuka
  • Publication number: 20070200582
    Abstract: A probe 10 to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member 3 forming a main body; a nickel plating layer 4 constituting a ground layer and a gold plating layer 5 constituting an outermost layer formed on a surface of the base member 3; and a plurality of square-pyramidal 1 protrusions formed in a lattice-like fashion at one end of the base member 3 and brought into contact with the object of inspection.
    Type: Application
    Filed: July 10, 2006
    Publication date: August 30, 2007
    Applicant: FUJITSU LIMITED
    Inventor: Toshihiro Ishizuka
  • Patent number: 7053367
    Abstract: In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section.
    Type: Grant
    Filed: November 7, 2001
    Date of Patent: May 30, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomoyuki Tobita, Toshihiro Ishizuka, Masaru Tomioka, Kiyomi Yoshinari, Masami Sakamoto
  • Publication number: 20040262512
    Abstract: In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section.
    Type: Application
    Filed: April 30, 2004
    Publication date: December 30, 2004
    Inventors: Tomoyuki Tobita, Toshihiro Ishizuka, Masaru Tomioka, Kiyomi Yoshinari, Masami Sakamoto
  • Patent number: 6157030
    Abstract: Disclosed is an ion trap mass spectrometer improved to obtain a high sensitivity without the lowering of resolution. By fitting a mesh electrode to an aperture (an ion sampling aperture or an ion extracting aperture) made in endcap electrodes constituting an ion trap mass analysis region, a radio frequency electric field in the mass analysis region is not disturbed even if the diameter of the aperture is set to a large value to heighten ion transmission efficiency. By fitting a shield electrode for preventing collision of ions with an insulated ring constituting an outer wall of the mass analysis region, charging up of the insulated ring is prevented to improve stability of detection signals. Furthermore, by arranging a shield member for shielding stray charged particles detouring through the circumference of the mass analysis region to approach an ion detector, generation of noises based on these stray charged particles is prevented.
    Type: Grant
    Filed: August 28, 1998
    Date of Patent: December 5, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Minoru Sakairi, Tadao Mimura, Toshihiro Ishizuka, Masaru Tomioka, Yasuaki Takada, Takayuki Nabeshima
  • Patent number: 5888766
    Abstract: The present invention relates to a method for producing human myoglobin by inserting a DNA sequence comprising a human myoglobin gene into a tryptophan promoter-containing vector, followed by making E. coli with the thus-obtained expression vector express a holo-type human myoglobin. Using this method, it is possible to directly and efficiently produce a heme-structured, holo-type human myoglobin by gene recombination technology.
    Type: Grant
    Filed: September 29, 1995
    Date of Patent: March 30, 1999
    Assignee: Oriental Yeast Co., Ltd.
    Inventors: Toshihiro Ishizuka, Yasunori Kihira, Toshio Tanaka, Yushi Matuo
  • Patent number: 5261403
    Abstract: In an MR imaging apparatus, a receiving coil comprising an upper coil and a lower coil which jointly sandwitch a desired part of a body to be inspected in an openable and closable manner, the upper and the lower coils being connected by connection means comprised of flexible and electrically conductive member to form a single coil. NMR signals can be detected at a high sensitivity, enabling an image of a high S/N ratio and measurement of a wide detection region.
    Type: Grant
    Filed: January 21, 1992
    Date of Patent: November 16, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Minoru Saito, Toshihiro Ishizuka, Yasuo Wada
  • Patent number: 5245285
    Abstract: A quadrature detection device for magnetic resonance imaging includes a pair of probes each having a pair of first conductors with a vertical arm and wings formed at both ends of the vertical arm and guard rings disposed inside the wings to oppose them and predetermined capacitors. In each probe, the resonance characteristics of the probe has two peaks. Symmetry of the peak existing in the resonance frequency range is effected by spacing the peak existing in a frequency range other than the resonance frequency range apart from the former. Thus, uniformity of the resulting image can be improved. The drop of the Q value of the probe is prevented by shifting the former peak to a higher frequency range than the latter peak. Also, electric symmetry of the probe is maintained.
    Type: Grant
    Filed: June 24, 1991
    Date of Patent: September 14, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Toshihiro Ishizuka, Munetaka Tsuda, Masao Yabusaki, Yasuo Wada, Takayuki Shimizu
  • Patent number: 5109198
    Abstract: In a nuclear magnetic resonance imaging apparatus including a first probe circuit for detecting magnetic flux in a first direction and a second probe circuit for detecting magnetic flux in a direction perpendicular to the first direction, the arm angle of conductor arms to form the first probe circuit and the arm angle of conductor arms to form the second probe circuit are different from each other.
    Type: Grant
    Filed: January 24, 1990
    Date of Patent: April 28, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Yoshiki Murakami, Etsuji Yamamoto, Masao Yabusaki, Hideki Kohno, Munetaka Tsuda, Toshihiro Ishizuka
  • Patent number: 4814709
    Abstract: This invention relates to a selection method of a specific region of a sample which is suitable for use in a nuclear magnetic resonance (NMR) imaging. Selection of a specific region suitable for obtaining multi-dimensional spatial information can be preferably made. To satisfy this requirement, the spin of the specific region of the sample is brought down in a direction at right angles to a static magnetic field, the regions other than the specific region are, in the mean time, brought down in a direction at right angles to the static magnetic field, and thereafter the static magnetic field is rendered non-uniform to that the spins of the regions other than the specific region become saturated.
    Type: Grant
    Filed: May 26, 1987
    Date of Patent: March 21, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Ryuzaburo Takeda, Hideaki Koizumi, Toshihiro Ishizuka
  • Patent number: 4755749
    Abstract: A strobo electron beam apparatus is provided having an energy analyzer, which: measures the voltage in the integrated circuit; samples a secondary electron signal by setting and connecting a retarding voltage of the energy analyzer to the measured phase; obtains the waveform of the secondary electron signal by a one time or several times phase scanning; and adds the product of a suitable coefficient and a difference between the secondary electron signal waveform, and a slice level to the retarding voltage and corrects the same. Multiple units are provided for: judging the conversion of the retarding voltage, from the value of the dispersion for the slice level of the secondary electron signal waveform; for adding and giving a mean of the retarding voltage, for obtaining a measured value of retarding voltage having a desired S/N ratio; and for random phase scanning so that the measured value having a desired S/N ratio can be easily obtained.
    Type: Grant
    Filed: August 19, 1986
    Date of Patent: July 5, 1988
    Assignee: Fujitsu Limited
    Inventors: Kazuo Ookubo, Akio Ito, Yoshiro Goto, Toshihiro Ishizuka, Kazuyuki Ozaki