Patents by Inventor Toshihiro Moriya

Toshihiro Moriya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7720274
    Abstract: In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.
    Type: Grant
    Filed: March 16, 2006
    Date of Patent: May 18, 2010
    Assignee: OMRON Corporation
    Inventors: Takatoshi Katahata, Hirotaka Wada, Toshihiro Moriya, Atsushi Shimizu, Akira Nakajima
  • Patent number: 7715616
    Abstract: A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.
    Type: Grant
    Filed: February 21, 2006
    Date of Patent: May 11, 2010
    Assignee: OMRON Corporation
    Inventors: Toshihiro Moriya, Hirotaka Wada, Takako Onishi, Atsushi Shimizu, Akira Nakajima
  • Publication number: 20080126920
    Abstract: An method for creating an FMEA sheet includes the steps of, retrieving a plurality of documents, dividing words in each of the plurality of retrieved documents into a plurality of morpheme words by morphological analysis, calculating a co-occurrence frequency of each of the plurality of morpheme words, generating a co-occurrence frequency network with morpheme words having a greater co-occurrence frequency than a predetermined level in the plurality of morpheme words, grouping the plurality of documents using the co-occurrence frequency network, extracting a word same as an FMEA word registered in an FMEA word concept dictionary created in advance from each of the plurality of documents belonging to a same group as a word to be used in creating the FMEA sheet and substituting the extracted word to the FMEA sheet.
    Type: Application
    Filed: October 16, 2007
    Publication date: May 29, 2008
    Inventors: Keiji Otaka, Toshihiro Moriya, Soichiro Kita, Akira Nakajima, Hidefumi Konishi, Masayoshi Abe, Hideki Yachiku
  • Publication number: 20080082527
    Abstract: A precedent database is generated by registering location indicating information that shows location of each of a plurality of precedent data. A knowledge database is generated by repeating processes of carrying out a search of this precedent database according to a specified condition formula and registering knowledge names representing results of the search in correlation with the condition formula. Component and failure names in the knowledge database are inserted as items of a generated FMEA sheet. Items of the FMEA sheet are specified and displayed such that corresponding text data can be referenced.
    Type: Application
    Filed: September 12, 2007
    Publication date: April 3, 2008
    Inventors: Hideki Yachiku, Hidefumi Konishi, Masayoshi Abe, Toshihiro Moriya
  • Publication number: 20080040058
    Abstract: Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
    Type: Application
    Filed: July 20, 2007
    Publication date: February 14, 2008
    Inventors: Yoshiki Fujii, Yasutomo Doi, Akira Nakajima, Toshihiro Moriya, Yasuaki Nakajima
  • Publication number: 20080034258
    Abstract: A fault management apparatus that enables calculation of evaluation values relating to a fault occurring to a management target as objective values without involvement of human judgment is provided. Fault information containing fault content information showing content of a fault occurring to a process in a production line, and detection status information and action content information associated with the fault is stored in a fault occurrence history storage part as a fault occurrence history. A fault extraction part reads the fault occurrence history from the fault occurrence history storage part to extract fault information containing specific fault content information. An influence degree calculation part calculates a degree of influence showing the degree of influence caused by a specific fault by performing statistical processing based on detection status information and action content information contained in the fault information extracted by the fault extraction part.
    Type: Application
    Filed: April 6, 2007
    Publication date: February 7, 2008
    Inventors: Toshihiro Moriya, Akira Nakajima
  • Publication number: 20060291713
    Abstract: For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second part are set, the color of each pixel in the first region and the color of each pixel in the second region are mapped as a target point and an exclusion point respectively, to a color space for each of the patterns of the color pickup regions, a degree in separation between a target point distribution and an exclusion point distribution in the color space is calculated for each of the patterns of the color pickup regions, a pattern of a color pickup region having a maximum degree in separation is selected, a color range which divides the color space and has the largest difference between the number of target points and the number of exclusion points in the selected pattern therein is found, and the found color range is set as a color condition used in a board inspecting process.
    Type: Application
    Filed: June 21, 2006
    Publication date: December 28, 2006
    Applicant: OMRON Corporation
    Inventors: Toshihiro Moriya, Hirotaka Wada, Takako Onishi, Atsushi Shimizu, Akira Nakajima
  • Publication number: 20060257015
    Abstract: image In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.
    Type: Application
    Filed: March 16, 2006
    Publication date: November 16, 2006
    Applicant: OMRON Corporation
    Inventors: Takatoshi Katahata, Hirotaka Wada, Toshihiro Moriya, Atsushi Shimizu, Akira Nakajima
  • Publication number: 20060204074
    Abstract: A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.
    Type: Application
    Filed: February 21, 2006
    Publication date: September 14, 2006
    Applicant: OMRON Corporation
    Inventors: Toshihiro Moriya, Hirotaka Wada, Takako Onishi, Atsushi Shimizu, Akira Nakajima
  • Publication number: 20060153439
    Abstract: A technology is provided for automatically producing an inspection logic to be used in the action of inspecting a PC board. An inspection logic setting apparatus is arranged for acquiring a plurality of first images of components to be detected by the inspection and a plurality of second images of components to be rejected by the inspection, dividing each first and second images into the plurality of blocks, calculating a color distance between the plurality of first images and the plurality of second images in each block, selecting one or more blocks from the plurality of blocks which are relatively greater in the color distance, and assigning the selected block(s) to an area condition.
    Type: Application
    Filed: January 11, 2006
    Publication date: July 13, 2006
    Applicant: OMRON Corporation
    Inventors: Toshihiro Moriya, Hirotaka Wada, Takako Onishi, Atsushi Shimizu, Akira Nakajima
  • Patent number: 6886616
    Abstract: A wheel structure for vehicles, capable of reducing a columnar resonance sound occurring in a wheel during a travel of a vehicle. A cross-sectional shape of a closed space defined by a wheel and a tire is varied in the circumferential direction so that a columnar resonance frequency in the closed space varies with a rotation of a wheel unit.
    Type: Grant
    Filed: May 21, 2003
    Date of Patent: May 3, 2005
    Assignee: Mitsubishi Jidosha Kogyo Kabushiki Kaisha
    Inventors: Yasuji Akiyoshi, Toshihiro Moriya, Hiroshi Yamauchi
  • Patent number: 6648421
    Abstract: A wheel structure for vehicles, capable of reducing a columnar resonance sound occurring in a wheel during a travel of a vehicle. A cross-sectional shape of a closed space defined by a wheel and a tire is varied in the circumferential direction so that a columnar resonance frequency in the closed space varies with a rotation of a wheel unit.
    Type: Grant
    Filed: October 16, 2000
    Date of Patent: November 18, 2003
    Assignee: Mitsubishi Jidosha Kogyo Kabushiki Kaisha
    Inventors: Yasuji Akiyoshi, Toshihiro Moriya, Hiroshi Yamauchi
  • Publication number: 20030197422
    Abstract: A wheel structure for vehicles, capable of reducing a columnar resonance sound occurring in a wheel during a travel of a vehicle. A cross-sectional shape of a closed space defined by a wheel and a tire is varied in the circumferential direction so that a columnar resonance frequency in the closed space varies with a rotation of a wheel unit.
    Type: Application
    Filed: May 21, 2003
    Publication date: October 23, 2003
    Applicant: MITSUBISHI JIDOSHA KOGYO KABUSHIKI KAISHA
    Inventors: Yasuji Akiyoshi, Toshihiro Moriya, Hiroshi Yamauchi