Patents by Inventor Toshihiro Sugawara
Toshihiro Sugawara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11982659Abstract: A system for calibrating a moisture sensor encompasses a processing unit (341). The processing unit (341) includes a reference data obtaining LCKT (345), a subject data obtaining LCKT (346) and a relationship calculating LCKT (347). The reference data obtaining LCKT (345) obtains reference data, after injecting water-vapor with known concentrations into an analyzer. The subject data obtaining LCKT (346) measures subject data indicating temporal variation of output-responses of a subject sensor element of the analyzer under test. The relationship calculating LCKT (347) compares the subject data with the reference data, and calculates relationships between the output-responses of the subject sensor element and the known concentrations.Type: GrantFiled: August 9, 2021Date of Patent: May 14, 2024Assignee: Ball Wave Inc.Inventors: Takamitsu Iwaya, Shingo Akao, Tatsuhiro Okano, Nobuo Takeda, Toshihiro Tsuji, Toru Oizumi, Hideyuki Fukushi, Maki Sugawara, Yusuke Tsukahara, Kazushi Yamanaka
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Patent number: 11762072Abstract: An optical testing apparatus is used in testing an optical measuring instrument. The optical measuring instrument provides an incident light pulse from a light source to an incident object and receives a reflected light pulse as a result of reflection of the incident light pulse at the incident object. The optical testing apparatus includes two or more testing light sources, two or more optical penetration members, and a wave multiplexing section. The two or more testing light sources each output a testing light pulse. The two or more optical penetration members each have an optical penetration region and receive the testing light pulse from each of the two or more testing light sources for penetration through the optical penetration region. The wave multiplexing section multiplexes the testing light pulses penetrating through the two or more optical penetration members for provision to the optical measuring instrument.Type: GrantFiled: August 7, 2020Date of Patent: September 19, 2023Assignee: ADVANTEST CORPORATIONInventors: Toshihiro Sugawara, Takao Sakurai
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Patent number: 11635374Abstract: An optical testing device for use in testing an optical measuring instrument provides incident light from a light source to an incident object and receives reflected light due to reflection of the incident light at the incident object. The optical testing device includes an incident light receiving section that receives incident light, and a light signal providing section. The light signal providing section provides a light signal to the incident object after a predetermined delay time since the incident light receiving section has received the incident light. A reflected light signal due to reflection of the light signal at the incident object is provided to the optical measuring instrument. The delay time is approximately equal to the time between emission of the incident light from the light source and reception of the reflected light by the optical measuring instrument in the case of actually using the optical measuring instrument.Type: GrantFiled: April 1, 2020Date of Patent: April 25, 2023Assignee: ADVANTEST CORPORATIONInventors: Toshihiro Sugawara, Shin Masuda, Takao Sakurai, Hidenobu Matsumura, Takao Seki
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Publication number: 20230048446Abstract: An optical testing apparatus is used in testing an optical measuring instrument that provides incident light from a light source to an incident object and receives reflected light of the incident light at the incident object. The apparatus includes an incident light receiving section, a light signal providing section, an imaging section, and an optical axis misalignment deriving section. The incident light receiving section receives incident light. The light signal providing section provides a light signal to an incident object after a predetermined delay time since the incident light receiving section has received the incident light. The imaging section images the incident light. The optical axis misalignment deriving section derives misalignment of the optical axis of the incident light with respect to the incident light receiving section based on misalignment between the incident light receiving section and the imaging section as well as an imaging result with the imaging section.Type: ApplicationFiled: October 9, 2020Publication date: February 16, 2023Applicant: ADVANTEST CORPORATIONInventors: Toshihiro SUGAWARA, Takao SAKURAI
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Publication number: 20220276514Abstract: According to the present invention, an optical testing apparatus is used in testing an optical measuring instrument. The optical measuring instrument provides an incident light pulse from a light source to an incident object and receives a reflected light pulse as a result of reflection of the incident light pulse at the incident object. The optical testing apparatus includes a testing light source and a rise time control section. The testing light source is arranged to generate a testing light pulse to be provided to the optical measuring instrument. The rise time control section is arranged to control the rise time of the testing light pulse.Type: ApplicationFiled: July 10, 2020Publication date: September 1, 2022Applicant: ADVANTEST CorporationInventors: Toshihiro SUGAWARA, Takao SAKURAI
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Publication number: 20210109202Abstract: An optical testing apparatus is used in testing an optical measuring instrument. The optical measuring instrument provides an incident light pulse from a light source to an incident object and receives a reflected light pulse as a result of reflection of the incident light pulse at the incident object. The optical testing apparatus includes two or more testing light sources, two or more optical penetration members, and a wave multiplexing section. The two or more testing light sources each output a testing light pulse. The two or more optical penetration members each have an optical penetration region and receive the testing light pulse from each of the two or more testing light sources for penetration through the optical penetration region. The wave multiplexing section multiplexes the testing light pulses penetrating through the two or more optical penetration members for provision to the optical measuring instrument.Type: ApplicationFiled: August 7, 2020Publication date: April 15, 2021Applicant: ADVANTEST CorporationInventors: Toshihiro SUGAWARA, Takao SAKURAI
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Publication number: 20200355608Abstract: An optical testing device for use in testing an optical measuring instrument provides incident light from a light source to an incident object and receives reflected light due to reflection of the incident light at the incident object. The optical testing device includes an incident light receiving section that receives incident light, and a light signal providing section. The light signal providing section provides a light signal to the incident object after a predetermined delay time since the incident light receiving section has received the incident light. A reflected light signal due to reflection of the light signal at the incident object is provided to the optical measuring instrument. The delay time is approximately equal to the time between emission of the incident light from the light source and reception of the reflected light by the optical measuring instrument in the case of actually using the optical measuring instrument.Type: ApplicationFiled: April 1, 2020Publication date: November 12, 2020Applicant: ADVANTEST CORPORATIONInventors: Toshihiro SUGAWARA, Shin MASUDA, Takao SAKURAI, Hidenobu MATSUMURA, Takao SEKI
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Patent number: 5390729Abstract: Cooling liquid flowing through cooling-liquid passages cools in heat-transmission manner an inner layer on an inner surface of an impermeable intermediate layer and is directed through a piping to an interface between the intermediate and outer layers, whereby the porous outer layer is cooled by latent heat generated by evaporation of the cooling liquid infiltrated into the porous outer layer.Type: GrantFiled: August 26, 1993Date of Patent: February 21, 1995Assignee: Ishikawajima-Harima Jukogyo Kabushiki KaishaInventors: Akira Sakurai, Masahiro Shiotsu, Toshikazu Yano, Masao Ochi, Toshihiro Sugawara
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Patent number: 5379610Abstract: Cooling liquid flowing through cooling-liquid passages cools in heat-transmission manner an inner layer on an inner surface of an impermeable intermediate layer and is directed through a piping to an interface between the intermediate and outer layers, whereby the porous outer layer is cooled by latent heat generated by evaporation of the cooling liquid infiltrated into the porous outer layer.Type: GrantFiled: August 26, 1993Date of Patent: January 10, 1995Assignee: Ishikawajima-Harima Jukogyo Kabushiki KaishaInventors: Akira Sakurai, Masahiro Shiotsu, Toshikazu Yano, Masao Ochi, Toshihiro Sugawara
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Patent number: 5329785Abstract: Cooling liquid flowing through cooling-liquid passages cools in heat-transmission manner an inner layer on an inner surface of an impermeable intermediate layer and is directed through a piping to an interface between the intermediate and outer layers, whereby the porous outer layer is cooled by latent heat generated by evaporation of the cooling liquid infiltrated into the porous outer layer.Type: GrantFiled: June 8, 1993Date of Patent: July 19, 1994Assignee: Ishikawajima-Harima Jukogyo Kabushiki KaishaInventors: Akira Sakurai, Masahiro Shiotsu, Toshikazu Yano, Masao Ochi, Toshihiro Sugawara