Patents by Inventor Toshinao Shinbo

Toshinao Shinbo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11273642
    Abstract: A liquid ejecting head including a diaphragm constituting a portion of a wall surface of a pressure chamber that accommodates a liquid, and a piezoelectric element that vibrates the diaphragm. In the liquid ejecting head, the diaphragm includes a plurality of layers, and the plurality of layers include a compressive film that has compressive stress and a tensile film that has tensile stress. The compressive film and the tensile film are two layers adjacent to each other that have a largest tension difference among the plurality of layers, and an absolute value of the tension difference between the compressive film and the tensile film is 400 [N/m] or smaller.
    Type: Grant
    Filed: April 15, 2020
    Date of Patent: March 15, 2022
    Assignee: Seiko Epson Corporation
    Inventors: Masanori Mikoshiba, Shiro Yazaki, Toshinao Shinbo, Hitoshi Takaai
  • Patent number: 10926538
    Abstract: A liquid ejecting head including a diaphragm constituting a portion of a wall surface of a pressure chamber that accommodates a liquid, and a piezoelectric element that vibrates the diaphragm. In the liquid ejecting head, the diaphragm includes a plurality of layers, and d/D?0.25 is satisfied where D is a thickness of the diaphragm and d is a distance between a neutral axis of the diaphragm and an interface between two adjacent layers in which a tension difference is the largest in the plurality of layers.
    Type: Grant
    Filed: December 17, 2019
    Date of Patent: February 23, 2021
    Assignee: Seiko Epson Corporation
    Inventors: Masanori Mikoshiba, Shiro Yazaki, Toshinao Shinbo, Hitoshi Takaai
  • Publication number: 20200331267
    Abstract: A liquid ejecting head including a diaphragm constituting a portion of a wall surface of a pressure chamber that accommodates a liquid, and a piezoelectric element that vibrates the diaphragm. In the liquid ejecting head, the diaphragm includes a plurality of layers, and the plurality of layers include a compressive film that has compressive stress and a tensile film that has tensile stress. The compressive film and the tensile film are two layers adjacent to each other that have a largest tension difference among the plurality of layers, and an absolute value of the tension difference between the compressive film and the tensile film is 400 [N/m] or smaller.
    Type: Application
    Filed: April 15, 2020
    Publication date: October 22, 2020
    Inventors: Masanori MIKOSHIBA, Shiro YAZAKI, Toshinao SHINBO, Hitoshi TAKAAI
  • Publication number: 20200198351
    Abstract: A liquid ejecting head including a diaphragm constituting a portion of a wall surface of a pressure chamber that accommodates a liquid, and a piezoelectric element that vibrates the diaphragm. In the liquid ejecting head, the diaphragm includes a plurality of layers, and d/D?0.25 is satisfied where D is a thickness of the diaphragm and d is a distance between a neutral axis of the diaphragm and an interface between two adjacent layers in which a tension difference is the largest in the plurality of layers.
    Type: Application
    Filed: December 17, 2019
    Publication date: June 25, 2020
    Inventors: Masanori MIKOSHIBA, Shiro YAZAKI, Toshinao SHINBO, Hitoshi TAKAAI
  • Patent number: 8003161
    Abstract: A method of manufacturing a dielectric film includes a coating step of coating sol made of an organic metal compound and forming a dielectric precursor film, a drying step of drying the dielectric precursor film, a degreasing step of degreasing the dielectric precursor film, and a baking step of baking the dielectric precursor film to form a dielectric film. The drying step includes a first drying step of drying the dielectric precursor film by heating the dielectric precursor film to a temperature lower than a boiling point of a solvent which is a main solvent of the sol and then holding the dielectric precursor film at the temperature for a predetermined period of time, and a second drying step of drying the dielectric precursor film further by reheating the dielectric precursor film and then holding the dielectric precursor film at the temperature for a predetermined period of time.
    Type: Grant
    Filed: April 10, 2008
    Date of Patent: August 23, 2011
    Assignee: Seiko Epson Corporation
    Inventors: Akira Kuriki, Hironobu Kazama, Toshinao Shinbo, Koji Sumi
  • Patent number: 7992972
    Abstract: A method of manufacturing a piezoelectric element includes a piezoelectric layer forming step of sequentially and repeatedly performing a heat treatment step of applying a piezoelectric material containing lead to a lower electrode film at a relative humidity in the range of 30% to 50% Rh and then performing a heat treatment to form a piezoelectric precursor film and a crystallization step of firing the piezoelectric precursor film to form a piezoelectric film on the lower electrode film, thereby forming a piezoelectric layer.
    Type: Grant
    Filed: March 17, 2009
    Date of Patent: August 9, 2011
    Assignee: Seiko Epson Corporation
    Inventors: Toshinao Shinbo, Kazushige Hakeda, Koji Sumi, Tsutomu Nishiwaki
  • Publication number: 20090262169
    Abstract: A method of manufacturing a piezoelectric element includes a piezoelectric layer forming step of sequentially and repeatedly performing a heat treatment step of applying a piezoelectric material containing lead to a lower electrode film at a relative humidity in the range of 30% to 50% Rh and then performing a heat treatment to form a piezoelectric precursor film and a crystallization step of firing the piezoelectric precursor film to form a piezoelectric film on the lower electrode film, thereby forming a piezoelectric layer.
    Type: Application
    Filed: March 17, 2009
    Publication date: October 22, 2009
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Toshinao Shinbo, Kazushige Hakeda, Koji Sumi, Tsutomu Nishiwaki
  • Patent number: 7579041
    Abstract: A method of manufacturing a dielectric film includes a coating step of coating sol made of an organic metal compound and forming a dielectric precursor film, a drying step of drying the dielectric precursor film, a degreasing step of degreasing the dielectric precursor film, and a baking step of baking the dielectric precursor film to form a dielectric film. The drying step includes a first drying step of drying the dielectric precursor film by heating the dielectric precursor film to a temperature lower than a boiling point of a solvent which is a main solvent of the sol and then holding the dielectric precursor film at the temperature for a predetermined period of time, and a second drying step of drying the dielectric precursor film further by reheating the dielectric precursor film and then holding the dielectric precursor film at the temperature for a predetermined period of time.
    Type: Grant
    Filed: November 29, 2004
    Date of Patent: August 25, 2009
    Assignee: Seiko Epson Corporation
    Inventors: Akira Kuriki, Hironobu Kazama, Toshinao Shinbo, Koji Sumi
  • Patent number: 7562451
    Abstract: A method of manufacturing an actuator device configured to prevent separation of a vibration plate and to enhance durability and reliability, and a liquid-jet apparatus are provided. The method includes the steps of forming a vibration plate on one surface of a substrate, and forming a piezoelectric element having a lower electrode, a piezoelectric layer, and an upper electrode on the vibration plate. The step of forming a vibration plate at least includes an insulation film forming step of forming an insulation film made of zirconium oxide by forming a zirconium layer on the one surface side of the substrate in accordance with a sputtering method and subjecting the zirconium layer to thermal oxidation by inserting the substrate formed with the zirconium layer to a thermal oxidation furnace heated to a temperature greater than or equal to 700° C. at a speed greater than or equal to 200 mm/min.
    Type: Grant
    Filed: December 9, 2004
    Date of Patent: July 21, 2009
    Assignee: Seiko Epson Corporation
    Inventors: Maki Ito, Masami Murai, Xin-Shan Li, Toshinao Shinbo
  • Publication number: 20080199599
    Abstract: A method of manufacturing a dielectric film includes a coating step of coating sol made of an organic metal compound and forming a dielectric precursor film, a drying step of drying the dielectric precursor film, a degreasing step of degreasing the dielectric precursor film, and a baking step of baking the dielectric precursor film to form a dielectric film. The drying step includes a first drying step of drying the dielectric precursor film by heating the dielectric precursor film to a temperature lower than a boiling point of a solvent which is a main solvent of the sol and then holding the dielectric precursor film at the temperature for a predetermined period of time, and a second drying step of drying the dielectric precursor film further by reheating the dielectric precursor film and then holding the dielectric precursor film at the temperature for a predetermined period of time.
    Type: Application
    Filed: April 10, 2008
    Publication date: August 21, 2008
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira Kuriki, Hironobu Kazama, Toshinao Shinbo, Koji Sumi
  • Patent number: 7320163
    Abstract: A step of forming a vibration plate includes a step of forming an insulation film in order to cause the surface roughness Ra of the insulation film to be in the range of 1 nm to 3 nm: the insulation film being made of zirconia which has been obtained by depositing a zirconium layer, and accordingly by the thermally oxidizing the zirconium layer at a predetermined temperature, and the insulation film constituting the uppermost surface of the vibration plate. In addition, a step of forming a piezoelectric elements includes: a step of applying titanium (Ti) onto a lower electrode by use of a sputtering method, and of forming a seed titanium layer thereon; and a step of forming a piezoelectric precursor film by applying a piezoelectric material onto the seed titanium layer, and of forming a piezoelectric layer by baking, and crystallizing, the piezoelectric precursor layer.
    Type: Grant
    Filed: March 10, 2005
    Date of Patent: January 22, 2008
    Assignee: Seiko Epson Corporation
    Inventors: Li Xin-Shan, Masami Murai, Toshinao Shinbo, Maki Ito
  • Publication number: 20070084033
    Abstract: A method of manufacturing an actuator device configured to prevent separation of a vibration plate and to enhance durability and reliability, and a liquid-jet apparatus are provided. The method includes the steps of forming a vibration plate on one surface of a substrate, and forming a piezoelectric element having a lower electrode, a piezoelectric layer, and an upper electrode on the vibration plate. The step of forming a vibration plate at least includes an insulation film forming step of forming an insulation film made of zirconium oxide by forming a zirconium layer on the one surface side of the substrate in accordance with a sputtering method and subjecting the zirconium layer to thermal oxidation by inserting the substrate formed with the zirconium layer to a thermal oxidation furnace heated to a temperature greater than or equal to 700° C. at a speed greater than or equal to 200 mm/min.
    Type: Application
    Filed: December 9, 2004
    Publication date: April 19, 2007
    Inventors: Maki Ito, Masami Murai, Xin-Shan Li, Toshinao Shinbo
  • Publication number: 20050210645
    Abstract: An object of the present invention is to provide a method of manufacturing an actuator device, and a liquid jet head, which can improve characteristics of a piezoelectric layer constituting piezoelectric elements and can stabilize the characteristics of the piezoelectric layer. A step of forming a vibration plate includes a step of forming an insulation film in order to cause the surface roughness Ra of the insulation film to be in the range of 1 nm to 3 nm: the insulation film being made of zirconia which has been obtained by depositing a zirconium layer, and accordingly by the thermally oxidizing the zirconium layer at a predetermined temperature, and the insulation film constituting the uppermost surface of the vibration plate.
    Type: Application
    Filed: March 10, 2005
    Publication date: September 29, 2005
    Inventors: Li Xin-Shan, Masami Murai, Toshinao Shinbo, Maki Ito
  • Publication number: 20050208208
    Abstract: A method of manufacturing a dielectric film includes a coating step of coating sol made of an organic metal compound and forming a dielectric precursor film, a drying step of drying the dielectric precursor film, a degreasing step of degreasing the dielectric precursor film, and a baking step of baking the dielectric precursor film to form a dielectric film. The drying step includes a first drying step of drying the dielectric precursor film by heating the dielectric precursor film to a temperature lower than a boiling point of a solvent which is a main solvent of the sol and then holding the dielectric precursor film at the temperature for a predetermined period of time, and a second drying step of drying the dielectric precursor film further by reheating the dielectric precursor film and then holding the dielectric precursor film at the temperature for a predetermined period of time.
    Type: Application
    Filed: November 29, 2004
    Publication date: September 22, 2005
    Inventors: Akira Kuriki, Hironobu Kazama, Toshinao Shinbo, Koji Sumi
  • Patent number: 6878609
    Abstract: In order to provide a silicon wafer break pattern that stabilizes the location and shape of the breaks at weak spots of the break pattern and that reduces waste, the through-holes of the break pattern is disposed along a scribe line, a first group of the through-holes are substantially disposed on only a first side of the scribe line, and a second group of the through-holes are substantially disposed on only a second side of the scribe line.
    Type: Grant
    Filed: December 11, 2003
    Date of Patent: April 12, 2005
    Assignee: Seiko Epson Corporation
    Inventors: Akihisa Wanibe, Noriaki Okazawa, Yoshinao Miyata, Toshinao Shinbo, Tetsuya Akasu, Hisashi Akachi
  • Publication number: 20040121560
    Abstract: In order to provide a silicon wafer break pattern that stabilizes the location and shape of the breaks at weak spots of the break pattern and that reduces waste, the through-holes of the break pattern is disposed along a scribe line, a first group of the through-holes are substantially disposed on only a first side of the scribe line, and a second group of the through-holes are substantially disposed on only a second side of the scribe line.
    Type: Application
    Filed: December 11, 2003
    Publication date: June 24, 2004
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akihisa Wanibe, Noriaki Okazawa, Yoshinao Miyata, Toshinao Shinbo, Tetsuya Akasu, Hisashi Akachi
  • Patent number: 6699552
    Abstract: In order to provide a silicon wafer break pattern that stabilizes the location and shape of the breaks at weak spots of the break pattern and that reduces waste, the through-holes of the break pattern is disposed along a scribe line, a first group of the through-holes are substantially disposed on only a first side of the scribe line, and a second group of the through-holes are substantially disposed on only a second side of the scribe line.
    Type: Grant
    Filed: April 16, 2002
    Date of Patent: March 2, 2004
    Assignee: Seiko Epson Corporation
    Inventors: Akihisa Wanibe, Noriaki Okazawa, Yoshinao Miyata, Toshinao Shinbo, Tetsuya Akasu, Hisashi Akachi
  • Publication number: 20020164874
    Abstract: In order to provide a silicon wafer break pattern that stabilizes the location and shape of the breaks at weak spots of the break pattern and that reduces waste, the through-holes of the break pattern is disposed along a scribe line, a first group of the through-holes are substantially disposed on only a first side of the scribe line, and a second group of the through-holes are substantially disposed on only a second side of the scribe line.
    Type: Application
    Filed: April 16, 2002
    Publication date: November 7, 2002
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akihisa Wanibe, Noriaki Okazawa, Yoshinao Miyata, Toshinao Shinbo, Tetsuya Akasu, Hisashi Akachi