Patents by Inventor Toshio Binnaka

Toshio Binnaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for testing semiconductor devices at a high temperature
    Patent number: 4604572
    Abstract: Apparatus for testing semiconductor devices at a high temperature comprising: a heating portion where the semiconductor device to be tested is heated to a predetermined temperature; a testing portion; a assembly for holding the chucking semiconductor device, the chucking assembly having a heating element for heating the semiconductor device and a thermosensor; a conveyor assembly for conveying the semiconductor device chucked by the chucking assembly to the testing portion; and, a central processing unit and memory circuit for controlling the temperature of the heating element in response to the output of the thermosensor.
    Type: Grant
    Filed: November 19, 1984
    Date of Patent: August 5, 1986
    Assignee: Fujitsu Limited
    Inventors: Akinori Horiuchi, Toshio Binnaka, Shigeyuki Maruyama