Patents by Inventor Toshio Mii

Toshio Mii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5389559
    Abstract: A trench capacitor DRAM cell with Shallow Trench Isolation (STI), a self-aligned buried strap and the method of making the cell. A trench capacitor is defined in a substrate. The trench capacitor's polysilicon (poly) plate is recessed below the surface of the substrate and the trench sidewalls are exposed above the poly. A doped poly layer is deposited over the surface contacting both the sidewall and the trench capacitor's poly plate. Horizontal portions of the poly layer are removed either through chemmech polishing or Reactive Ion Etching (RIE). A shallow trench is formed, removing one formerly exposed trench sidewall and a portion of the trench capacitor's poly plate in order to isolate the DRAM cell from adjacent cells. The remaining poly strap, along the trench sidewall contacting the poly plate, is self aligned to contact the source of the DRAM Pass gate Field Effect Transistor (FET). After the shallow trench is filled with oxide, FET's are formed on the substrate, completing the cell.
    Type: Grant
    Filed: December 2, 1993
    Date of Patent: February 14, 1995
    Assignee: International Business Machines Corporation
    Inventors: Chang-Ming Hsieh, Louis L. Hsu, Toshio Mii, Seiki Ogura, Joseph F. Shepard
  • Patent number: 5384277
    Abstract: A method of forming a MOS DRAM cell having a trench capacitor in which the strap connection to the trench capacitor, the source, drain, and isolation are all raised above the surface of the single crystal silicon includes the steps of forming the trench capacitors, depositing a blanket gate stack including the gate oxide and a set of gate layers, and then depositing isolation members in apertures etched in the gate stack using the gate oxide as an etch stop. The same sidewalls that are used to form an LDD source and drain combine with nitride sidewalls on a gate contact aperture to separate a gate contact from source and drain contacts.
    Type: Grant
    Filed: December 17, 1993
    Date of Patent: January 24, 1995
    Assignee: International Business Machines Corporation
    Inventors: Louis L. Hsu, Toshio Mii, Joseph F. Shepard, Seiki Ogura
  • Patent number: 5384152
    Abstract: A capacitor is provided having a substrate and a first capacitor plate including a lattice mismatched crystalline material is formed over and supported by a surface of the substrate. A layer of insulating material is formed over and supported by the first capacitor plate. A second capacitor plate including a layer of conductive material is formed over and supported by the layer of insulating material.
    Type: Grant
    Filed: June 1, 1993
    Date of Patent: January 24, 1995
    Assignee: International Business Machines Corporation
    Inventors: Jack C. Chu, Louis Lu-Chen Hsu, Toshio Mii, Joseph F. Shepard, Scott R. Stiffler, Manu J. Tejwani, Edward J. Vishnesky
  • Patent number: 5245206
    Abstract: A capacitor is provided having a substrate and a first capacitor plate including a lattice mismatched crystalline material is formed over and supported by a surface of the substrate. A layer of insulating material is formed over and supported by the first capacitor plate. A second capacitor plate including a layer of conductive material is formed over and supported by the layer of insulating material.
    Type: Grant
    Filed: May 12, 1992
    Date of Patent: September 14, 1993
    Assignee: International Business Machines Corporation
    Inventors: Jack O. Chu, Louis L. Hsu, Toshio Mii, Joseph F. Shepard, Scott R. Stiffler, Manu J. Tejwani, Edward J. Vishnesky