Patents by Inventor Toshirou Shinohara

Toshirou Shinohara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Chip damage detecting circuit for semiconductor IC
    Patent number: 5723875
    Abstract: A semiconductor integrated circuit has a chip check circuit for detecting cracks and other defects in the chip during operation. The chip check circuit extends in the chip from an input terminal to an output terminal so as to scan a predetermined wide area. The chip check circuit has at least one signal line extending near or within a circuit block in the chip so that the signal line can be broken together with the circuit block. The chip check circuit may further comprise one or more inverters, and/or one or more two-wire logic circuits.
    Type: Grant
    Filed: October 23, 1996
    Date of Patent: March 3, 1998
    Assignee: Nissan Motor Co., Ltd.
    Inventors: Noriyuki Abe, Toshimi Abo, Toshirou Shinohara