Abstract: CT images near the pelvis are obtained before surgery, and a three-dimensional model of a pelvis part is created on a computer. The virtual three-dimensional bone model is used to plan an installation position of a guide instrument etc., and a virtual three-dimensional surgical site model including the guide instrument is constructed. Subsequently, during surgery, the guide instrument is installed, and three-dimensional images of a surgical site are obtained, and a measured three-dimensional surgical site model including the guide instrument is obtained. The virtual three-dimensional surgical site model and the measured three-dimensional surgical site model are compared, and an error between an ideal installation position of the guide instrument and an actual installation position of the guide instrument is detected to guide the operator to reduce the error.

Abstract: An axially symmetric polarization conversion element that converts incident light into an axially symmetric polarized beam includes a reflection section having a shape obtained by rotating the cross section of a Fresnel rhomb wave plate along the direction of an optical axis around an axis that is parallel to the optical axis. The axially symmetric polarization conversion element converts the incident light into an axially symmetric polarized beam by utilizing two Fresnel reflections by the reflection section.

Abstract: CT images near the pelvis are obtained before surgery, and a three-dimensional model of a pelvis part is created on a computer. The virtual three-dimensional bone model is used to plan an installation position of a guide instrument etc., and a virtual three-dimensional surgical site model including the guide instrument is constructed. Subsequently, during surgery, the guide instrument is installed, and three-dimensional images of a surgical site are obtained, and a measured three-dimensional surgical site model including the guide instrument is obtained. The virtual three-dimensional surgical site model and the measured three-dimensional surgical site model are compared, and an error between an ideal installation position of the guide instrument and an actual installation position of the guide instrument is detected to guide the operator to reduce the error.

Abstract: An axially symmetric polarization conversion element that converts incident light into an axially symmetric polarized beam includes a reflection section having a shape obtained by rotating the cross section of a Fresnel rhomb wave plate along the direction of an optical axis around an axis that is parallel to the optical axis. The axially symmetric polarization conversion element converts the incident light into an axially symmetric polarized beam by utilizing two Fresnel reflections by the reflection section.

Abstract: An optical characteristic measuring apparatus includes an optical system 10 including first and second carrier retarders 24 and 32 having the retardations being known and differing from each other. The optical characteristic measuring apparatus performs: a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by light-receiving/spectroscopic means; and an optical characteristic element calculation process of calculating an optical characteristic element representing optical characteristics of a measurement target based on the spectral peaks and the retardations of the first and second carrier retarders.

Abstract: A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements included in an optical system 10 and a measurement target (or a sample 100), and a calculation section 50 that calculates at least one matrix element of a Mueller matrix that indicates the optical characteristics of the measurement target based on the light intensity information relating to the measurement light and a theoretical expression for the light intensity of the measurement light. The light intensity information acquisition section 40 acquires the light intensity information relating to a plurality of the measurement lights obtained from the optical system 10 by changing setting of a principal axis direction of at least one of the optical elements.

Abstract: An optical characteristic measuring apparatus includes an optical system 10 including first and second carrier retarders 24 and 32 having the retardations being known and differing from each other. The optical characteristic measuring apparatus performs: a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by light-receiving/spectroscopic means; and an optical characteristic element calculation process of calculating an optical characteristic element representing optical characteristics of a measurement target based on the spectral peaks and the retardations of the first and second carrier retarders.

Abstract: A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements included in an optical system 10 and a measurement target (or a sample 100), and a calculation section 50 that calculates at least one matrix element of a Mueller matrix that indicates the optical characteristics of the measurement target based on the light intensity information relating to the measurement light and a theoretical expression for the light intensity of the measurement light. The light intensity information acquisition section 40 acquires the light intensity information relating to a plurality of the measurement lights obtained from the optical system 10 by changing setting of a principal axis direction of at least one of the optical elements.

Abstract: A measuring apparatus that measures the polarization state of analysis target light includes a modulation section 20 that includes a retarder 22 and an analyzer 24, a light intensity information acquisition section 30 that acquires light intensity information about modulated light obtained by modulating the analysis target light at the modulation section, and a calculation section 50 that calculates a polarization characteristic element of the analysis target light based on the light intensity information. The light intensity information acquisition section acquires the light intensity information about first modulated light to Nth modulated light respectively obtained by modulating the analysis target light at the modulation section set under first to Nth principal axis direction conditions which differ in the principal axis direction of at least one of the retarder and the analyzer.

Abstract: An optical characteristic measuring apparatus including a carrier retarder of which the retardation is known and a quarter-wave plate without wavelength dependence, wherein light emitted from a light source (light-emitting device) is incident on a measurement target through a first polarizer (polarizer), the carrier retarder, and the quarter-wave plate, and the light which has passed through the measurement target is incident on a photodetector through a second polarizer (analyzer). A spectral peak is extracted from a frequency spectrum obtained by analyzing a light intensity signal detected by the photodetector. The optical characteristic element of the measurement target is calculated based on the extracted spectral peak and the retardation of the carrier retarder.