Patents by Inventor Toshiyasu Suyama

Toshiyasu Suyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240054617
    Abstract: A control device 20 includes an image acquisition unit 203 configured to acquire a radiographic image obtained by irradiating a subject F with radiation and capturing an image of the radiation passing through the subject F, a noise map generation unit 204 configured to derive an evaluation value obtained by evaluating spread of a noise value from a pixel value of each pixel in the radiographic image on the basis of relationship data indicating a relationship between the pixel value and the evaluation value and generate a noise map that is data in which the derived evaluation value is associated with each pixel in the radiographic image, and a processing unit 205 configured to input the radiographic image and the noise map to a trained model 207 constructed in advance through machine learning and execute image processing of removing noise from the radiographic image.
    Type: Application
    Filed: October 7, 2021
    Publication date: February 15, 2024
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Satoshi TSUCHIYA, Tatsuya ONISHI, Toshiyasu SUYAMA
  • Publication number: 20230344958
    Abstract: An imaging unit includes a housing having a wall portion in which a slit for passing radiation is formed, a scintillator having an input surface to which radiation passing through the slit is input, a first mirror that reflects scintillation light output from the input surface, and a line scan camera that detects scintillation light reflected by the first mirror. The scintillator is placed to make the input surface parallel to both the conveying direction and a line direction. The first mirror is positioned outside an irradiation region connecting the peripheral edge of the slit to the input surface of the scintillator.
    Type: Application
    Filed: June 27, 2023
    Publication date: October 26, 2023
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu SUGIYAMA, Toshiyasu SUYAMA, Haruki SUZUKI
  • Publication number: 20230288349
    Abstract: A foreign matter inspection device includes: an X-ray application unit configured to apply an X-ray to an inspection object carried by a carriage unit; an X-ray detection unit configured to detect an X-ray transmitted by the inspection object and to output X-ray image data based on the detection result; an infrared ray application unit configured to apply an infrared ray to the inspection object carried by the carriage unit; and an infrared ray detection unit configured to detect the infrared ray from the inspection object and to output infrared image data based on the detection result. The infrared ray application unit and the infrared ray detection unit are covered by a protection unit formed of a member blocking the X-ray and transmitting the infrared ray.
    Type: Application
    Filed: April 30, 2021
    Publication date: September 14, 2023
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Kunihiko TSUCHIYA, Toshiyasu SUYAMA
  • Publication number: 20230258580
    Abstract: An imaging unit includes a housing having an entrance window that allows radiation transmitted through an object to pass through, a scintillator having an input surface to which radiation passing through the entrance window is input, and a line scan sensor having an imaging surface that captures an image of scintillation light output from the input surface. The imaging unit further includes a slit member placed between the entrance window and the scintillator and configured to guide radiation passing through the entrance window toward the input surface and a 1X lens placed between the scintillator and the line scan sensor and configured to form scintillation light output from the input surface into an image on the imaging surface of the line scan sensor.
    Type: Application
    Filed: August 10, 2021
    Publication date: August 17, 2023
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Tetsuya TAKA, Toshiyasu SUYAMA
  • Patent number: 11729344
    Abstract: An imaging unit includes a housing having a wall portion in which a slit for passing radiation is formed, a scintillator having an input surface to which radiation passing through the slit is input, a first mirror that reflects scintillation light output from the input surface, and a line scan camera that detects scintillation light reflected by the first mirror. The scintillator is placed to make the input surface parallel to both the conveying direction and a line direction. The first mirror is positioned outside an irradiation region connecting the peripheral edge of the slit to the input surface of the scintillator.
    Type: Grant
    Filed: December 23, 2019
    Date of Patent: August 15, 2023
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama, Haruki Suzuki
  • Publication number: 20230135988
    Abstract: A image acquiring device includes a camera configured to scan radiation passing through a target object in one direction and acquire an X-ray image, a scintillator configured to convert the X-rays into light, and a control device configured to input the X-ray image to a trained model constructed through machine learning in advance and execute a noise removal process. The camera includes a scan camera in which pixel lines each having M pixels arranged in one direction are configured to be arranged in N columns in a direction orthogonal to one direction and which is configured to output a detection signal for each of the pixels, and a readout circuit configured to output the X-ray image by adding the detection signals output from at least two pixels for each of the pixel lines of N columns in the scan camera and sequentially outputting the added N detection signals.
    Type: Application
    Filed: April 14, 2021
    Publication date: May 4, 2023
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Tatsuya ONISHI, Toshiyasu SUYAMA, Satoshi TSUCHIYA
  • Publication number: 20230136930
    Abstract: A control device includes an acquisition unit configured to acquire X-ray transmission images of a jig and a target object using an image acquisition device that radiates X-rays to the target object and captures an image of the X-rays passing through the target object to acquire an X-ray transmission image, a specification unit configured to specify image characteristics of the X-ray transmission image of the jig, a selection unit configured to select a trained model on the basis of the image characteristics from a plurality of trained models constructed through machine training in advance using image data, and a processing unit configured to execute image processing for removing noise from the X-ray transmission image of the target object using the selected trained model.
    Type: Application
    Filed: April 14, 2021
    Publication date: May 4, 2023
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu SUYAMA, Tatsuya ONISHI
  • Publication number: 20230128795
    Abstract: A radiographic inspection apparatus acquires a first image and a second image; receives an input of selection of a region of interest in the first image or the second image; specifies respective first pixel values of a plurality of first pixels and respective second pixel values of a plurality of second pixels corresponding to the plurality of first pixels, and calculates a thickness correction function by approximating a relationship between the first pixel values and the second pixel values; calculates a plurality of representative data each of which is a combination of a first representative value and a second representative value on the basis of the respective first pixel values of the plurality of first pixels and the respective second pixel values of the plurality of second pixels; and calculates an evaluation coefficient based on a correlation between the thickness correction function and the plurality of calculated representative data.
    Type: Application
    Filed: April 5, 2021
    Publication date: April 27, 2023
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Tatsuya ONISHI, Toshiyasu SUYAMA
  • Publication number: 20230125182
    Abstract: A control device includes an input unit configured to accept an input of condition information indicating either operating conditions of a source of X-rays when the X-rays are radiated to capture an image of a target object or imaging conditions during capturing an image of the target object, a calculation unit configured to calculate average energy of the X-rays passing through the target object on the basis of the condition information, and a narrowing unit configured to narrow down candidates for a trained model from a plurality of trained models constructed through machine training in advance using image data on the basis of the average energy.
    Type: Application
    Filed: April 14, 2021
    Publication date: April 27, 2023
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Tatsuya ONISHI, Toshiyasu SUYAMA
  • Publication number: 20220141397
    Abstract: An imaging unit includes a housing having a wall portion in which a slit for passing radiation is formed, a scintillator having an input surface to which radiation passing through the slit is input, a first mirror that reflects scintillation light output from the input surface, and a line scan camera that detects scintillation light reflected by the first mirror. The scintillator is placed to make the input surface parallel to both the conveying direction and a line direction. The first mirror is positioned outside an irradiation region connecting the peripheral edge of the slit to the input surface of the scintillator.
    Type: Application
    Filed: December 23, 2019
    Publication date: May 5, 2022
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu SUGIYAMA, Toshiyasu SUYAMA, Haruki SUZUKI
  • Patent number: 11237278
    Abstract: A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.
    Type: Grant
    Filed: June 2, 2020
    Date of Patent: February 1, 2022
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Tatsuya Onishi, Toshiyasu Suyama
  • Patent number: 11079344
    Abstract: An X-ray detection device 30 comprises a low energy scintillator 31 configured to convert an X-ray of a low energy range into scintillation light, a low energy line sensor 32 configured to detect the scintillation light to output image data, a high energy scintillator 33 configured to convert an X-ray of a high energy range into scintillation light, and a high energy line sensor 34 configured to detect the scintillation light to output image data. Pixels L of the low energy line sensor 32 and pixels H of the high energy line sensor 34 are identical in number and are aligned at an identical pixel pitch, and a minimum filtering process is executed on the image data from the low energy line sensor 32, while an averaging process is executed on the image data from the high energy line sensor 34.
    Type: Grant
    Filed: November 16, 2017
    Date of Patent: August 3, 2021
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu Suyama, Tatsuya Onishi
  • Patent number: 10859715
    Abstract: A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.
    Type: Grant
    Filed: July 29, 2016
    Date of Patent: December 8, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Tatsuya Onishi, Toshiyasu Suyama
  • Publication number: 20200292718
    Abstract: A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.
    Type: Application
    Filed: June 2, 2020
    Publication date: September 17, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu SUGIYAMA, Tatsuya ONISHI, Toshiyasu SUYAMA
  • Patent number: 10746884
    Abstract: An apparatus for capturing a radiation image includes a radiation source configured to emit radiation, a wavelength converter configured to receive the radiation emitted from the radiation source through an entrance plane after the emitted radiation has been transmitted by an object, to convert the received radiation to scintillation light, and to output the scintillation light from the entrance plane, a first optical system configured to focus on the entrance plane and to image the output scintillation light thereby generating a first radiation image of the object, and a first image sensor configured to capture the first radiation image to generate first image data.
    Type: Grant
    Filed: August 13, 2018
    Date of Patent: August 18, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 10698120
    Abstract: A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.
    Type: Grant
    Filed: July 29, 2016
    Date of Patent: June 30, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Tatsuya Onishi, Toshiyasu Suyama
  • Publication number: 20200057008
    Abstract: An X-ray detection device 30 comprises a low energy scintillator 31 configured to convert an X-ray of a low energy range into scintillation light, a low energy line sensor 32 configured to detect the scintillation light to output image data, a high energy scintillator 33 configured to convert an X-ray of a high energy range into scintillation light, and a high energy line sensor 34 configured to detect the scintillation light to output image data. Pixels L of the low energy line sensor 32 and pixels H of the high energy line sensor 34 are identical in number and are aligned at an identical pixel pitch, and a minimum filtering process is executed on the image data from the low energy line sensor 32, while an averaging process is executed on the image data from the high energy line sensor 34.
    Type: Application
    Filed: November 16, 2017
    Publication date: February 20, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu SUYAMA, Tatsuya ONISHI
  • Patent number: 10393676
    Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.
    Type: Grant
    Filed: January 17, 2017
    Date of Patent: August 27, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
  • Patent number: 10267751
    Abstract: An image acquisition device is an image acquisition device that acquires an X-ray transmission image of an object conveyed in a conveyance direction, and the image acquisition device includes an X-ray irradiator that outputs an X-ray, a belt conveyor that conveys the object in the conveyance direction, an X-ray detection camera having a scintillator that converts an X-ray penetrating the object into scintillation light, a line scan camera that detects the scintillation light and outputs a detection signal, and an amplifier that amplifies the detection signal at a predetermined set amplification factor and outputs a amplified signal, a controller that generates an X-ray transmission image based on the amplified signal, and an amplifier controller that sets one of a first amplification factor or a second amplification factor corresponding to an amplification factor lower than the first amplification factor as the set amplification factor based on a predetermined imaging condition.
    Type: Grant
    Filed: February 2, 2015
    Date of Patent: April 23, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu Suyama, Tatsuya Onishi
  • Publication number: 20190086558
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direct
    Type: Application
    Filed: August 13, 2018
    Publication date: March 21, 2019
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu SUGIYAMA, Toshiyasu SUYAMA