Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: A solid-state imaging apparatus includes a photoelectric conversion element, a transfer transistor, a reset transistor, an amplifier transistor, a converter circuit that converts an analog voltage appearing at a vertical signal line into a digital voltage value, a first signal line that is connected to the gate of the reset transistor, a second signal line that is connected to the gate of the transfer transistor, and a drive circuit that outputs to the first signal line a reset pulse for causing the reset transistor to discharge charge in a charge accumulation portion, and outputs to the second signal line a transfer pulse for causing the transfer transistor to transfer charge generated in the photoelectric conversion element to the charge accumulation portion. The drive circuit outputs the reset pulse to the first signal line, and then outputs the transfer pulse to the second signal line successively in two or more times.

Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: A radiation counting device is provided that includes a scintillator, a pixel circuit, and an analog-to-digital conversion circuit. In the radiation counting device, the scintillator generates a photon when radiation is incident. In the radiation counting device, the pixel circuit converts the photon into charge, stores the charge over a predetermined period, and generates an analog voltage in accordance with the amount of stored charge. In the radiation counting device, the analog-to-digital conversion circuit converts the analog voltage into a digital signal in a predetermined quantization unit less than the analog voltage generated from the one photon.

Abstract: Detection omission is reduced. An optical measuring device according to an embodiment includes: a plurality of excitation light sources (32A to 32D) that irradiates a plurality of positions on a flow path through which a specimen flows with excitation rays having different wavelengths; and a solid-state imaging device (34) that receives a plurality of fluorescent rays emitted from the specimen passing through each of the plurality of positions, in which the solid-state imaging device includes: a pixel array unit (91) in which a plurality of pixels is arrayed in a matrix; and a plurality of first detection circuits (93) connected to a plurality of pixels not adjacent to each other in the same column of the pixel array unit, respectively.

Abstract: The present technology relates to a radiation detection apparatus that makes it possible to obtain a projection image of a radiation in a short period of time. The radiation detection apparatus includes a scintillator that emits scintillation light in response to incidence of a radiation, a pixel substrate on which a plurality of pixels each of which photoelectrically converts the scintillation light and outputs a pixel signal according to a light amount of the scintillation light is disposed in an array, a detection circuit substrate that includes an A/D (Analog to Digital) conversion unit for A/D converting the pixel signal and is stacked on the pixel substrate, and a compression unit that compresses digital data outputted from the A/D conversion unit. The present technology can be applied, for example, to an X-ray imaging apparatus that detects an X-ray to perform imaging and so forth.

Abstract: A microparticle analysis device (1) is provided with a light source (16), a two-dimensional photoelectric conversion sensor (28), and a calculation unit (10C). The light source (16) irradiates a microparticle (M) flowing in a flow path (14C) with excitation light (L1). The two-dimensional photoelectric conversion sensor (28) receives fluorescence emitted from the microparticle (M) by a light receiving surface (30) including a plurality of light reception units (32) arranged two-dimensionally, and acquires data of a fluorescence signal including stored charge values of the plurality of light reception units (32), respectively. The calculation unit (10C) calculates an evaluation value including an area that is a total value of a plurality of stored charge values included in the data of the fluorescence signal.

Abstract: The present technology relates to an imaging element and a driving method, and an electronic device that enable stable driving with low voltage and low power consumption and furthermore make it possible to ensure a time resolution of detection. A light detector includes a pixel array section including a plurality of first pixels and a second pixel. The first pixel includes a photoelectric conversion section that photoelectrically converts incident light, a floating diffusion section that generates a voltage in accordance with the amount of charge carriers obtained by photoelectric conversion, and a transfer section that transfers charge carriers from the photoelectric conversion section to the floating diffusion section; the readout of a signal is performed intermittently from the first pixel. Further, the output of the second pixel is monitored continuously to detect the incidence of light. The present technology can be applied to a radiation counter.

Abstract: Aiming at enabling a frame rate to be increased, a solid-state imaging apparatus according to an embodiment includes: a photoelectric conversion element (PD); a transfer transistor (TRG); a reset transistor (RST); an amplifier transistor (AMP); a converter circuit (151) that converts an analog voltage appearing at a vertical signal line (VSL) into a digital voltage value; a first signal line (RCL) that is connected to the gate of the reset transistor; a second signal line (RCL) that is connected to the gate of the transfer transistor; and a drive circuit (12) that outputs to the first signal line a reset pulse for causing the reset transistor to discharge charge in a charge accumulation portion, and outputs to the second signal line a transfer pulse for causing the transfer transistor to transfer charge generated in the photoelectric conversion element to the charge accumulation portion.

Abstract: Provided are an optical measuring instrument, a flow cytometer, and a radiation counter which reduces a size and a weight of a photodetector, and enables detection of weak pulsed light with a high degree of accuracy and at a high speed. A laser beam source irradiates a specimen to be measured with a laser beam and generates a light pulse of intensity corresponding to the irradiation. An imaging element provided with a pixel including a photoelectric conversion element and an amplification element which sequentially accumulates charges subjected to photoelectric conversion by the photoelectric conversion element for a predetermined period and outputs a voltage as a pixel signal according to an accumulated charge amount after the accumulation is completed through the amplification element, and detects a light amount of the light pulse on the basis of a pixel signals of a pixel group.

Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: The present technology relates to an optical pulse detection device, an optical pulse detection method, a radiation counter device, and a biological testing device which are capable of performing radiation counting in a more accurate manner. The optical pulse detection device includes a pixel array unit in which a plurality of pixels are arranged in a two-dimensional lattice shape, an AD converter that converts output signals of each of the pixels in the pixel array unit into digital values with gradation greater than 1 bit, and an output control circuit that performs error determination processing of comparing the digital value with a predetermined threshold value, and discarding a digital value, which is greater than the threshold value, among the digital values as an error. For example, the present technology is applicable to a radiation counter device, and the like.

Abstract: An imaging device includes: a pixel array section having an array of pixels, each of which has a photoelectric converting device and outputs an electric signal according to an input photon; a sense circuit section having a plurality of sensor circuits each of which makes binary decision on whether there is a photon input to a pixel in a predetermined period upon reception of the electric signal therefrom; and a decision result IC section which integrates decision results from the sense circuits, pixel by pixel or for each group of pixels, multiple times to generate imaged data with a gradation, the decision result IC section including a count circuit which performs a count process to integrate the decision results from the sense circuits, and a memory for storing a counting result for each pixel from the count circuit, the sense circuits sharing the count circuit for integrating the decision results.

Abstract: The present disclosure relates to a detection device and electronic equipment, in which a detection accuracy of minute light can be improved. A detection device includes: a pixel array portion in which a plurality of first pixels including a photoelectric conversion unit, and a plurality of second pixels not including a photoelectric conversion unit, are arranged; and a driving unit configured to drive the first pixel and the second pixel. The present technology, for example, can be applied to a light detector, a radiation counter device performing radiation counting by using the light detector, and a biological examination device using the light detector, such as a flow cytometer.

Abstract: The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.

Abstract: The present technology relates to a radiation detection apparatus that makes it possible to obtain a projection image of a radiation in a short period of time. The radiation detection apparatus includes a scintillator that emits scintillation light in response to incidence of a radiation, a pixel substrate on which a plurality of pixels each of which photoelectrically converts the scintillation light and outputs a pixel signal according to a light amount of the scintillation light is disposed in an array, a detection circuit substrate that includes an A/D (Analog to Digital) conversion unit for A/D converting the pixel signal and is stacked on the pixel substrate, and a compression unit that compresses digital data outputted from the A/D conversion unit. The present technology can be applied, for example, to an X-ray imaging apparatus that detects an X-ray to perform imaging and so forth.