Abstract: An IC measuring device constituted by a first timing generator (TG21) for outputting a pair of judgment strobe pulses (S21); a first edge detector (E21) for detecting the states of a data strobe (DCK2) at two time points within one test cycle on the basis of the pair of judgment strobe pulses (S21); a second timing generator (TG22) for outputting a pair of judgment strobe pulses (S22); a second edge detector (E22) for detecting the states of data at two time points within one test cycle on the basis of the pair of judgment strobe pulses (S22); and a judgment section (J22) for determining acceptance/rejection of the timing of the data with reference to the data strobe on the basis of the states of the data and the states of the data strobe.

Abstract: An IC measuring device constituted by a first timing generator (TG21) for outputting a pair of judgment strobe pulses (S21); a first edge detector (E21) for detecting the states of a data strobe (DCK2) at two time points within one test cycle on the basis of the pair of judgment strobe pulses (S21); a second timing generator (TG22) for outputting a pair of judgment strobe pulses (S22); a second edge detector (E22) for detecting the states of data at two time points within one test cycle on the basis of the pair of judgment strobe pulses (S22); and a judgment section (J22) for determining acceptance/rejection of the timing of the data with reference to the data strobe on the basis of the states of the data and the states of the data strobe.

Abstract: A method for retrying a read operation upon detecting a read error of a disk drive is disclosed. The method includes the steps of decreasing the revolution rate of a disk until the read error is corrected; and if the read error is corrected, gradually increasing the revolution rate of the disk while a data read operation is performed.

Abstract: A method is provided for controlling a disk-type storage device that performs reading and writing operations according to a process command from a data processing unit while rotating a disk-type recording medium at a specified rotation speed. The method according to an embodiment of the invention includes the step of setting an intermediate standby mode that rotates the recording medium at a slower rotation speed than the specified rotation speed when a time duration within which no process command has been issued exceeds a first reference time period. The method also includes the step of setting a standby mode for stopping the rotation of the recording medium when a connect time of the intermediate standby mode exceeds a second reference time period.

Abstract: The object of the present invention is to offer a transmission line propagation delay time measuring device capable of reducing the measurement errors due to attenuation in transmission lines and allowing precise measurement of the transmission line propagation delay time.

Abstract: A method for passing data of an external memory device through a buffer to a data processor is provided. The method divides the storage region of the buffer into two subregions, and passes a first data set read from the external memory device through one of the two subregions to the data processor in response to a first instruction of the data processor. When a second data set required by said data processor is the same as the first data set, the data stored in the one subregion is passed directly to the data processor instead of retrieving the same from the external memory device. When the second data is different from the first data, it is read from the external memory device and passed through the other allocated subregion to the data processor.

Abstract: A propagation delay time measuring device has a test signal generating circuit, a time measuring circuit, a data table and a calculation circuit. The test signal generating circuit generates a test signal and supplies the test signal to a measuring point which is connected to one of the terminals of a signal transmission line. The time measuring circuit receives a signal waveform at the measuring point. The signal waveforms indicates an waveform of the test signal supplied to one of the terminals of the signal transmission line and a waveform reflected by another terminal of the signal transmission line and returned to the measuring point. The time measuring circuit measures a time when the test signal is supplied to the measuring point and a time when the reflected waveform is returned to the measuring point based on the signal waveform at the measuring point.