Abstract: A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

Abstract: A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

Abstract: A gas analysis system, includes: a light-emitting element that emits a laser light modulated by a predetermined modulation frequency; and a light-receiving element that: receives the laser light that has passed through a measurement target gas; and upon receiving the laser light, outputs a received signal having an N-frequency that is n times the predetermined modulation frequency, wherein n is an integer no less than 2; and a signal processing device that: calculates a third component by removing, from a first component having the N-frequency, a second component, wherein the second component is a component of optical interference noise arising on an optical path of the laser light from the light-emitting element to the light-receiving element and has the same frequency as the first component; and calculates, based on a magnitude of the third component, a concentration of the measurement target gas.

Abstract: A spectroscopic analysis device (1) according to the present disclosure includes a controller (40) that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L1) irradiated by an irradiator (10) with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.

Abstract: A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

Abstract: A gas analysis system, includes: a light-emitting element that emits a laser light modulated by a predetermined modulation frequency; and a light-receiving element that: receives the laser light that has passed through a measurement target gas; and upon receiving the laser light, outputs a received signal having an N-frequency that is n times the predetermined modulation frequency, wherein n is an integer no less than 2; and a signal processing device that: calculates a third component by removing, from a first component having the N-frequency, a second component, wherein the second component is a component of optical interference noise arising on an optical path of the laser light from the light-emitting element to the light-receiving element and has the same frequency as the first component; and calculates, based on a magnitude of the third component, a concentration of the measurement target gas.

Abstract: A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

Abstract: A method for treating a surface of a diamond thin film according to one aspect of the present invention performs one of a first substitution process for substituting part of hydrogen-terminals of a diamond thin film with fluorine-terminals in the absence of a fluorocarbon deposition on the surface of diamond thin film and a second substitution process for substituting part of hydrogen-terminals of a diamond thin film with fluorine-terminals in the presence of the fluorocarbon deposition on the surface of diamond thin film based on required surface properties of the diamond thin film.

Abstract: A method for treating a surface of a diamond thin film according to one aspect of the present invention performs one of a first substitution process for substituting part of hydrogen-terminals of a diamond thin film with fluorine-terminals in the absence of a fluorocarbon deposition on the surface of diamond thin film and a second substitution process for substituting part of hydrogen-terminals of a diamond thin film with fluorine-terminals in the presence of the fluorocarbon deposition on the surface of diamond thin film based on required surface properties of the diamond thin film.

Abstract: An inexpensive and simple pressure sensor having good static pressure characteristics is provided. In a pressure sensor including a base having a hole to which a pressure is applied and performing electrical and mechanical insulation, and a sensor having a diaphragm connected to the hole and a strain gauge for converting a strain occurring in the diaphragm to an electric signal, the sensor being mounted to the base, the base is formed with such a thickness that the strain at the time of applying a static pressure does not change.

Abstract: An inexpensive and simple pressure sensor having good static pressure characteristics is provided. In a pressure sensor including a base having a hole to which a pressure is applied and performing electrical and mechanical insulation, and a sensor having a diaphragm connected to the hole and a strain gauge for converting a strain occurring in the diaphragm to an electric signal, the sensor being mounted to the base, the base is formed with such a thickness that the strain at the time of applying a static pressure does not change.