Patents by Inventor Tsugito Maruyama

Tsugito Maruyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5586199
    Abstract: The present invention relates to a method for determining an orientation of a line segment in a contour in a local area of a binary contour image. The number of pixels having a predetermined value and located in each orientation in the local area, is obtained, and it is determined that a line segment exists in an orientation in which the number of pixels is large. Further, when it is determined that the number of pixels located in each of a plurality of orientations and having a predetermined value is greater than a sum of the numbers of pixels in orientations adjacent to said each orientation on both sides thereof, it is determined that a line segment exists in said each orientation. Two orientations in which large numbers of pixels are located are detected, and it is determined whether the point is a constituent of a line segment, a line segment of the sub-straight-line form, or a near-corner point, depending on angles made by the two orientations is equal to 180.degree.
    Type: Grant
    Filed: June 2, 1993
    Date of Patent: December 17, 1996
    Assignee: Fujitsu Limited
    Inventors: Shinji Kanda, Jun Wakitani, Tsugito Maruyama, Toshihiko Morita
  • Patent number: 5526254
    Abstract: The present invention relates to a simulation or control method and apparatus for a manipulator apparatus and makes it possible to calculate three-dimensional dynamics of the entire manipulator apparatus on the real time basis using the laws of conservation of momentum/angular momentum of the entire system, reverse dynamics or normal dynamics of a wheel system to display motion of the manipulator apparatus by simulation display on a display (2) and control the manipulator apparatus.
    Type: Grant
    Filed: February 4, 1994
    Date of Patent: June 11, 1996
    Assignee: Fujitsu Limited
    Inventors: Yuichi Sato, Mitsunori Hirata, Tsugito Maruyama, Takashi Uchiyama, Fumio Nagashima
  • Patent number: 5509090
    Abstract: A three-dimensional measuring apparatus including a multi-slit projector has an actuator for displacing at least one of first and second diffraction gratings by only a minute distance in a direction perpendicular to the slit lights. An image recognizing apparatus includes an image arithmetic unit for changing, each time a coded multi-slit light pattern is changed, weights assigned to the binarized image signals, and for summing up the last weighted binarized image signals or the image signals of the last added results read out from an image memory, with newly weighted binarized image signals. This improves the image resolution reduces the memory capacity and increases the processing speed.
    Type: Grant
    Filed: August 4, 1994
    Date of Patent: April 16, 1996
    Assignee: Fujitsu Limited
    Inventors: Tsugito Maruyama, Shinji Kanda, Jun Wakitani
  • Patent number: 5307153
    Abstract: A three-dimensional measuring apparatus including a multi-slit projector has an actuator for displacing at least one of first and second diffraction gratings by only a minute distance in a direction perpendicular to the slit lights. An image recognizing apparatus includes an image arithmetic unit for changing, each time a coded multi-slit light pattern is changed, weights assigned to the binarized image signals, and for summing up the last weighted binarized image signals or the image signals of the last added results read out from an image memory with newly weighted binarized image signals. This improves the image resolution reduces the memory capacity and increases the processing speed.
    Type: Grant
    Filed: August 31, 1993
    Date of Patent: April 26, 1994
    Assignee: Fujitsu Limited
    Inventors: Tsugito Maruyama, Shinji Kanda, Jun Wakitani
  • Patent number: 4846576
    Abstract: A method for measuring a three-dimensional position of an object with a single camera and a multislit light, i.e., a source of multiplanar light beams. A surface of the object is irradiated with multislit lights, i.e., multiplanar light beams, having a plurality of slit light faces and also irradiated with a single standard slit light having a slit light face identical to one of the plurality of slit light faces of the multislit lights. A plurality of slit light photo images corresponding to a plurality of slit light projected images and a standard slit light photo image corresponding to a slit light projected image formed on the object are obtained. One of the slit light photo images which corresponds to the standard slit light photo image is specified and made to correspond, to compute a three-dimensional position of the object in a predetermined coordinate.
    Type: Grant
    Filed: May 20, 1986
    Date of Patent: July 11, 1989
    Assignee: Fujitsu Limited
    Inventors: Tsugito Maruyama, Shinji Kanda, Keishi Hanahara