Patents by Inventor Tsukasa Kojima

Tsukasa Kojima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11915759
    Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes: first memory cells, first word lines, a first row decoder, and a driver circuit. The first row decoder includes first transistors capable of coupling the first word lines to first signal lines, and a first block decoder supplying a first block selection signal to the first transistors. When the controller issues a data read command, the first block decoder asserts the first block selection signal to allow the first transistors to transfer a first voltage to a selected first word line, and a second voltage to unselected other first word lines. After data is read, the first block decoder continues asserting the first block selection signal, and the driver circuit transfers a third voltage.
    Type: Grant
    Filed: December 20, 2021
    Date of Patent: February 27, 2024
    Assignee: KIOXIA CORPORATION
    Inventors: Masanobu Shirakawa, Marie Takada, Tsukasa Tokutomi, Yoshihisa Kojima, Kiichi Tachi
  • Patent number: 10612917
    Abstract: A part program generating device includes a CAD data memory storing CAD data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into a part program language. The measurement condition definer provides the user with, as a graphical user interface, an editing window capable of editing the measurement procedure in an editing language and a command icon providing a command to be used for defining the measurement procedure as an icon. The command icon includes a circumvention move command icon instructing to overcome a barrier when displacing a sensor from a start point to a target point.
    Type: Grant
    Filed: March 13, 2017
    Date of Patent: April 7, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Tetsuya Koga, Tsukasa Kojima
  • Patent number: 10521923
    Abstract: A part program generating device includes a CAD data memory storing CAD data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into a part program language. The measurement condition definer provides the user with, as a graphical user interface, an editing window capable of editing the measurement procedure in an editing language and a command icon providing a command to be used for defining the measurement procedure as an icon. The command icon includes a circumvention move command icon instructing to overcome a barrier when displacing a sensor from a start point to a target point.
    Type: Grant
    Filed: March 13, 2017
    Date of Patent: December 31, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Tetsuya Koga, Tsukasa Kojima
  • Publication number: 20170270685
    Abstract: A part program generating device includes a CAD data memory storing CAD data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into a part program language. The measurement condition definer provides the user with, as a graphical user interface, an editing window capable of editing the measurement procedure in an editing language and a command icon providing a command to be used for defining the measurement procedure as an icon. The command icon includes a circumvention move command icon instructing to overcome a barrier when displacing a sensor from a start point to a target point.
    Type: Application
    Filed: March 13, 2017
    Publication date: September 21, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Tetsuya KOGA, Tsukasa KOJIMA
  • Publication number: 20170270684
    Abstract: A part program generating device includes a CAD data memory storing CAD data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into a part program language. The measurement condition definer provides the user with, as a graphical user interface, an editing window capable of editing the measurement procedure in an editing language and a command icon providing a command to be used for defining the measurement procedure as an icon. The command icon includes a circumvention move command icon instructing to overcome a barrier when displacing a sensor from a start point to a target point.
    Type: Application
    Filed: March 13, 2017
    Publication date: September 21, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Tetsuya KOGA, Tsukasa KOJIMA
  • Patent number: 9151588
    Abstract: A circular shape characteristic measuring device includes a shape measuring device that obtains measured data by measuring a profile shape of a circular cross-section of an object to be measured having the circular cross-section, and a computation device that calculates a circular shape characteristic of the circular cross-section. The computation device includes: an input device configured to input one of three parameters including a cutoff value of the filtering process, a minimum number of samples, and a ratio of a radius of the circular cross-section to a radius of a gauge head; a parameter table that stores a relationship between the three parameters, and based on the input parameter, determines the other two parameters; and a sampler configured to perform sampling of the measured data based on the minimum number of samples.
    Type: Grant
    Filed: June 20, 2012
    Date of Patent: October 6, 2015
    Assignee: MITUTOYO CORPORATION
    Inventors: Junji Sakurada, Tsukasa Kojima
  • Patent number: 8538165
    Abstract: A data memory storing Gerber data containing closed area information of a work; a display displaying a pattern image based on the closed area information of the Gerber data; a detection specification information display program displaying on the display a detection tool specifying a location of edge to be detected, a detection direction and detection length, by superimposing on the pattern image; an image capturing program and an image capturer capturing an image of an area corresponding to the detection tool of the work; an edge detection program performing an edge detection of the location of the edge to be detected with respect to data of a captured image; and a condition determination program determining a light-dark change condition indicating whether an image is changing from a light section to a dark section or from a dark section to a light section along a detection direction.
    Type: Grant
    Filed: April 21, 2011
    Date of Patent: September 17, 2013
    Assignee: Mitutoyo Corporation
    Inventors: Tsukasa Kojima, Kozo Ariga, Jyota Miyakura
  • Patent number: 8364441
    Abstract: Surface texture measuring device includes: first pseudo measurement point sequence obtaining means which drives contact piece to trace a surface of reference workpiece having reference shape and obtains locus of certain position of the contact piece as first pseudo measurement point sequence; contact piece model calculating means which calculates, based on first pseudo measurement point sequence and design surface specifying the reference workpiece surface, a contact piece model representing surface shape of the contact piece and placed in pseudo space; second pseudo measurement point sequence obtaining means which places contact piece model such that its surface contacts a reference surface specifying a workpiece surface and it takes the same posture as contact piece in measurement, and calculates reference position of the contact piece model as second pseudo measurement point sequence; and replacement determination means which determines whether to replace contact piece based on second pseudo measurement po
    Type: Grant
    Filed: April 26, 2010
    Date of Patent: January 29, 2013
    Assignee: Mitutoyo Corporation
    Inventor: Tsukasa Kojima
  • Publication number: 20130006579
    Abstract: A circular shape characteristic measuring device includes a shape measuring device that obtains measured data by measuring a profile shape of a circular cross-section of an object to be measured having the circular cross-section, and a computation device that calculates a circular shape characteristic of the circular cross-section. The computation device includes: an input device configured to input one of three parameters including a cutoff value of the filtering process, a minimum number of samples, and a ratio of a radius of the circular cross-section to a radius of a gauge head; a parameter table that stores a relationship between the three parameters, and based on the input parameter, determines the other two parameters; and a sampler configured to perform sampling of the measured data based on the minimum number of samples.
    Type: Application
    Filed: June 20, 2012
    Publication date: January 3, 2013
    Applicant: MITUTOYO CORPORATION
    Inventors: Junji SAKURADA, Tsukasa KOJIMA
  • Patent number: 8196457
    Abstract: A surface texture measuring device comprises a display control unit operative to display a drawing symbol entry screen having entry areas of drawing symbols. An entry acceptance unit is provided to accept the input of the drawing symbol into the entry area provided in the drawing symbol entry screen. An arithmetic unit is provided to calculate surface texture information that indicates a surface texture of an object to be measured, from the measurement result of surface displacements of the object, based on the drawing symbol accepted at the entry acceptance unit.
    Type: Grant
    Filed: July 11, 2008
    Date of Patent: June 12, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Hiroyuki Hidaka, Tsukasa Kojima
  • Publication number: 20110280496
    Abstract: A data memory storing Gerber data containing closed area information of a work; a display displaying a pattern image based on the closed area information of the Gerber data; a detection specification information display program displaying on the display a detection tool specifying a location of edge to be detected, a detection direction and detection length, by superimposing on the pattern image; an image capturing program and an image capturer capturing an image of an area corresponding to the detection tool of the work; an edge detection program performing an edge detection of the location of the edge to be detected with respect to data of a captured image; and a condition determination program determining a light-dark change condition indicating whether an image is changing from a light section to a dark section or from a dark section to a light section along a detection direction.
    Type: Application
    Filed: April 21, 2011
    Publication date: November 17, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Tsukasa KOJIMA, Kozo ARIGA, Jyota MIYAKURA
  • Publication number: 20100286961
    Abstract: Surface texture measuring device includes: first pseudo measurement point sequence obtaining means which drives contact piece to trace a surface of reference workpiece having reference shape and obtains locus of certain position of the contact piece as first pseudo measurement point sequence; contact piece model calculating means which calculates, based on first pseudo measurement point sequence and design surface specifying the reference workpiece surface, a contact piece model representing surface shape of the contact piece and placed in pseudo space; second pseudo measurement point sequence obtaining means which places contact piece model such that its surface contacts a reference surface specifying a workpiece surface and it takes the same posture as contact piece in measurement, and calculates reference position of the contact piece model as second pseudo measurement point sequence; and replacement determination means which determines whether to replace contact piece based on second pseudo measurement po
    Type: Application
    Filed: April 26, 2010
    Publication date: November 11, 2010
    Applicant: MITUTOYO CORPORATION
    Inventor: Tsukasa Kojima
  • Patent number: 7636646
    Abstract: A roundness measuring device includes: an eccentric position calculation unit calculating, based on a measured distance and a measured angle, a distance between a axis of the measured object and a rotation axis as an eccentric distance, and calculating an angle formed between the detection line and a line segment connecting the rotation axis and the axis of the measured object as an eccentric angle; and a measurement correction unit correcting the measured distance based on the eccentric distance, the eccentric angle, the measured angle, a radius of the measured object, and a length from the center to the surface of the detector unit, and correcting the measured angle by adding a correction angle to the measured angle, the correction angle being formed between the detection line and a line segment connecting the rotation axis and a contact point where the measured object and the detector unit come in contact with one another.
    Type: Grant
    Filed: May 16, 2008
    Date of Patent: December 22, 2009
    Assignee: Mitutoyo Corporation
    Inventor: Tsukasa Kojima
  • Patent number: 7542872
    Abstract: A form measuring instrument measures a form of a surface of an object to be measured using a contact to follow the surface. A pseudo-measurement point acquirer acquires positional coordinates of the reference point of the contact as pseudo-measurement points when the contact touches the object at a plurality of locations. A normal vector generator estimates a surface or line along the pseudo-measurement points from the pseudo-measurement points to calculate normal vectors extending from the pseudo-measurement points to the surface or line. A contact model locator locates contact models which specify the surface form of the contact so as to coincide the pseudo-measurement points with reference points of the contact models and so as to coincide attitudes of the contact on measurement with attitudes of the contact models. A measurement point calculator calculates cross points as measurement points, at which the normal vectors cross the surfaces of the located contact models.
    Type: Grant
    Filed: February 2, 2007
    Date of Patent: June 2, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Soichi Kadowaki, Tsukasa Kojima, Tomonori Goto
  • Publication number: 20090049893
    Abstract: A surface texture measuring device comprises a display control unit operative to display a drawing symbol entry screen having entry areas of drawing symbols. An entry acceptance unit is provided to accept the input of the drawing symbol into the entry area provided in the drawing symbol entry screen. An arithmetic unit is provided to calculate surface texture information that indicates a surface texture of an object to be measured, from the measurement result of surface displacements of the object, based on the drawing symbol accepted at the entry acceptance unit.
    Type: Application
    Filed: July 11, 2008
    Publication date: February 26, 2009
    Applicant: MITUTOYO CORPORATION
    Inventors: Hiroyuki Hidaka, Tsukasa Kojima
  • Publication number: 20090048799
    Abstract: A roundness measuring device obtains an eccentric position of a measured object with respect to a rotation axis in measuring roundness of the measured object by rotating and driving the measured object. The roundness measuring device includes: a measurement acquisition unit obtaining, as measurements, rotation angles of the measured object and distances from the rotation axis to a surface of the measured object, the distance corresponding to the rotating angle; and an eccentricity calculation unit setting a circular correction circle with its center position provided as variable parameters, calculating the center position of the correction circle that minimizes sum of squares of distances between each of the measurements and the correction circle, in a direction from each of the measurements toward the center position of the correction circle, and determining the center position of the correction circle as the eccentric position.
    Type: Application
    Filed: May 14, 2008
    Publication date: February 19, 2009
    Applicant: MITUTOYO CORPORATION
    Inventors: Soichi Kadowaki, Tsukasa Kojima
  • Publication number: 20080294369
    Abstract: A roundness measuring device includes: an eccentric position calculation unit calculating, based on a measured distance and a measured angle, a distance between a axis of the measured object and a rotation axis as an eccentric distance, and calculating an angle formed between the detection line and a line segment connecting the rotation axis and the axis of the measured object as an eccentric angle; and a measurement correction unit correcting the measured distance based on the eccentric distance, the eccentric angle, the measured angle, a radius of the measured object, and a length from the center to the surface of the detector unit, and correcting the measured angle by adding a correction angle to the measured angle, the correction angle being formed between the detection line and a line segment connecting the rotation axis and a contact point where the measured object and the detector unit come in contact with one another.
    Type: Application
    Filed: May 16, 2008
    Publication date: November 27, 2008
    Applicant: MITUTOYO CORPORATION
    Inventor: Tsukasa Kojima
  • Publication number: 20070198212
    Abstract: A form measuring instrument measures a form of a surface of an object to be measured using a contact to follow the surface. A pseudo-measurement point acquirer acquires positional coordinates of the reference point of the contact as pseudo-measurement points when the contact touches the object at a plurality of locations. A normal vector generator estimates a surface or line along the pseudo-measurement points from the pseudo-measurement points to calculate normal vectors extending from the pseudo-measurement points to the surface or line. A contact model locator locates contact models which specify the surface form of the contact so as to coincide the pseudo-measurement points with reference points of the contact models and so as to coincide attitudes of the contact on measurement with attitudes of the contact models. A measurement point calculator calculates cross points as measurement points, at which the normal vectors cross the surfaces of the located contact models.
    Type: Application
    Filed: February 2, 2007
    Publication date: August 23, 2007
    Applicant: MITUTOYO CORPORATION
    Inventors: Soichi Kadowaki, Tsukasa Kojima, Tomonori Goto
  • Patent number: 7036238
    Abstract: A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: May 2, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Tsukasa Kojima, Junji Sakurada, Toshiyuki Tamai, Sadayuki Matsumiya, Takafumi Kano, Kazushi Noguchi
  • Publication number: 20050132591
    Abstract: A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.
    Type: Application
    Filed: December 21, 2004
    Publication date: June 23, 2005
    Applicant: MITUTOYO CORPORATION
    Inventors: Tsukasa Kojima, Junji Sakurada, Toshiyuki Tamai, Sadayuki Matsumiya, Takafumi Kano, Kazushi Noguchi