Patents by Inventor TZONG-DAW WU

TZONG-DAW WU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for measuring thickness of thin film
    Patent number: 10365085
    Abstract: A method for measuring a thickness of a thin film includes: a step of basing on a training database to establish an artificial neural network, the training database including a plurality of modified spectra and a plurality of film thicknesses corresponding individually to the plurality of modified spectra; a step of measuring a sample having a coated film so as to obtain a spectrum; and, a step of running the artificial neural network already trained by the plurality of modified spectra so as to use the spectrum to estimate a thickness of the coated film on the sample. In addition, a system related to the method for measuring a thickness of a thin film is provided to include a measuring unit, a spectrometer and a processing unit.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: July 30, 2019
    Assignee: INSTITUTE OF NUCLEAR ENERGY RESEARCH, ATOMIC ENERGY COUNCIL, EXECUTIVE YUAN, R.O.C.
    Inventors: Tzong-Daw Wu, Jiun-Shen Chen, Ching-Pei Tseng, Cheng-Chang Hsieh
  • SOLAR CONTROL FILM AND MANUFACTURING METHOD THEREOF
    Publication number: 20190131483
    Abstract: A method for manufacturing a solar control film includes: a step of applying an arc-plasma coating process to deposit a first dielectric layer on a soft substrate, the first dielectric layer containing Ti; a step of depositing a first metal layer on the first dielectric layer; a step of applying the arc-plasma coating process to deposit a second dielectric layer on the first metal layer, the second dielectric layer containing the Ti; a step of depositing a second metal layer on the second dielectric layer; and, a step of applying the arc-plasma coating process to deposit a third dielectric layer on the second metal layer, the third dielectric layer containing the Ti. In addition, a solar control film is also provided.
    Type: Application
    Filed: July 18, 2018
    Publication date: May 2, 2019
    Inventors: EN-SHIH CHEN, Tzong-Daw Wu, Cheng-Chang Hsieh, Ching-Pei Tseng, Yung-Ching Liu
  • METHOD AND SYSTEM FOR MEASURING THICKNESS OF THIN FILM
    Publication number: 20190120610
    Abstract: A method for measuring a thickness of a thin film includes: a step of basing on a training database to establish an artificial neural network, the training database including a plurality of modified spectra and a plurality of film thicknesses corresponding individually to the plurality of modified spectra; a step of measuring a sample having a coated film so as to obtain a spectrum; and, a step of running the artificial neural network already trained by the plurality of modified spectra so as to use the spectrum to estimate a thickness of the coated film on the sample. In addition, a system related to the method for measuring a thickness of a thin film is provided to include a measuring unit, a spectrometer and a processing unit.
    Type: Application
    Filed: November 30, 2017
    Publication date: April 25, 2019
    Inventors: TZONG-DAW WU, JIUN-SHEN CHEN, CHING-PEI TSENG, CHENG-CHANG HSIEH