Patents by Inventor Ui W. Suh

Ui W. Suh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7657389
    Abstract: A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
    Type: Grant
    Filed: August 23, 2006
    Date of Patent: February 2, 2010
    Assignee: General Electric Company
    Inventors: Ui W. Suh, Richard C. Knepfle
  • Patent number: 6296448
    Abstract: An article and method for laser shock peening the article to form pairs of longitudinally spaced apart first and second laser shock peened spots that are on opposite sides of the article, simultaneously laser shock peened, and transversely offset from each other.
    Type: Grant
    Filed: November 12, 1999
    Date of Patent: October 2, 2001
    Assignee: General Electric Company
    Inventors: Ui W. Suh, James D. Risbeck
  • Patent number: 6237419
    Abstract: An ultrasonic inspection element and method of fabrication are provided for ultrasonic inspection of curved surface parts. Various points on a transducer are located. These points include the location where a ray starts, to the desired focal point in the material being inspected. The path of the ray is through a water medium and a water-metal boundary. These points are fitted onto a cylindrical surface. The ray is back propagated until it is focused at the desired focal point.
    Type: Grant
    Filed: August 16, 1999
    Date of Patent: May 29, 2001
    Assignee: General Electric Company
    Inventors: Ui W. Suh, Douglas E. Ingram, Richard E. Klaassen, Walter J. Bantz
  • Patent number: 6075593
    Abstract: A method for quality assurance of a laser shock peening process of workpieces includes measuring and recording or temporal light intensity data over a short period during the duration of a plasma associated with the vaporized material from laser shots fired during a production laser shock peening process. The recorded temporal data is then analyzed to obtain an instantaneous optical spectrum of the plasma and then used to provide statistical control of the production laser shock peening process. One correlation function of the present invention is based on a time integrated spectral peak intensity wavelength curve for each of the laser firings and for which a peak intensity wavelength is determined for a plurality of times during each plasma of a plurality or all of the firings. Production results from the analysis of the instantaneous optical spectrum is used to determine whether the production laser shock peening process is acceptable.
    Type: Grant
    Filed: August 3, 1999
    Date of Patent: June 13, 2000
    Assignee: General Electric Company
    Inventors: Richard L. Trantow, Ui W. Suh