Abstract: A module attachment for testing a linear high density array of test sites on a printed circuit board having such circuit test sites where an integrated circuit chip (IC) is to be mounted. Present IC's may have wire lead spacings as close as 0.010 inch with integrated chip development utilizing even more compact and close center pad spacing, such as 0.004 inch. This spacing is too close to use even the thinnest of spring contact probes. The module carries an array of densely packed thin wires embedded in a small matrix block mounted on spaced supports, which may be conventional, large diameter spring contact probes. Electrical connection to the array of wires in the module is done by each wire being connected to a separate wire lead with the wires bundled and routed to a test computer. In its closest wire spacings, the module permits testing of the densest IC's and in wider spacings, provides a low cost alternative to spring contact probes.

Abstract: A shielded electrical contact spring probe assembly for testing electrical printed circuit boards includes an outer barrel having an open end and a remote end, an inner core of dielectric material coaxially mounted within the barrel, and an electrical contact spring probe reciprocally seated within an axial bore in the core. A shield surrounds the core between the barrel inner wall and the core and extends the full length of the barrel. A shielding plunger is located in a cylindrical space between the barrel and the shield. The probe assembly remote end is for connection of an electrical transmission line, or in an alternative embodiment, inserting a second electrical contact spring probe within the core. The configuration and material of the core and the shield enable the entire probe assembly to maintain a selected impedance.

Abstract: A spring contact twisting electrical contact spring probe for testing electrical printed circuit boards includes a barrel having a spring seating end and an open end, a compression spring seated in the closed end of the barrel, and a plunger inserted into the barrel. The plunger includes a tail section, connected to a twister section comprising a square rod twisted along its longitudinal axis, and a shaft or probe section that protrudes from the barrel and includes the probe tip. Four crimps in the barrel retain the plunger inside the barrel and interact with the helical crests on the twister section to cause the plunger to rotate along its longitudinal axis as it reciprocates within the barrel. The twister section is retained entirely within the barrel at all times. The rotating plunger tip has edges that scrape off contaminants or coatings on the test sites of the circuit boards to obtain a sufficient electrical connection.