Patents by Inventor Ulrich Benner

Ulrich Benner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060227341
    Abstract: A scanning unit for a position measuring system for the optical scanning of a scale, the scanning unit including a light source for transmitting light in a direction toward a section of a scale and a detector for receiving light modified by the scale. A lens arrangement placed in front of the detector, the lens arrangement having a plurality of optical lenses and is used for generating a definite image of a scanned scanning area in an image field on the detector, wherein the lens arrangement optically images the scanning area reduced in surface in the image field on the detector.
    Type: Application
    Filed: March 29, 2006
    Publication date: October 12, 2006
    Inventor: Ulrich Benner
  • Patent number: 6963409
    Abstract: An optical position measuring system including a periodic grating structure and a scanning unit. The scanning unit includes a light source that directs light towards the periodic grating structure and an optical lens device that receives light from the periodic grating structure and creates an image of the periodic grating structure in an image plane, the optical lens device having a periodic lens array with a grating period, AG(r) or the mutual distance between adjoining lenses of said lens array defined by the equation: A G ? ( r ) = ? ? ? ( r ) ? * [ t ? ( r ) * [ k + i + n ] + ? ] ( ? ? ? ( r ) ? + 1 ) wherein AG(r) is the grating per t(r) the period of the periodic grating structure, |?(r)| the absolute amount of the image magnification factor ? of the lens array ? a presettable defined phase shift r the radius of the grating arrangement, wherein in the case of a linear grating r=? and AG,t and |?| are constants, i, k, n ? N, i.e.
    Type: Grant
    Filed: April 2, 2003
    Date of Patent: November 8, 2005
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Ulrich Benner, Elmar Mayer
  • Publication number: 20050168757
    Abstract: An optical position measuring system including a periodic grating structure and a scanning unit. The scanning unit includes a light source that directs light towards the periodic grating structure and an optical lens device that receives light from the periodic grating structure and creates an image of the periodic grating structure in an image plane, the optical lens device having a periodic lens array with a grating period, AG (r) or the mutual distance between adjoining lenses of said lens array defined by the equation: wherein AG(r) is the A G ? ( r ) = ? ? ? ( r ) ? * [ t ? ( r ) ? ? * [ k + i + n ] + ? ] ( ? ? ? ( r ) ? + 1 ) array, t(r) the period of the periodic grating structure, |?(r)| the absolute amount of the image scale ? of the lens array ? a presettable defined phase shift r the radius of the grating arrangement, wherein in the case of a linear grating r=?, and AG, t and |?| are constants, i, k, n ? N, i.e.
    Type: Application
    Filed: April 2, 2003
    Publication date: August 4, 2005
    Inventors: Ulrich Benner, Elmar Mayer
  • Patent number: 6914235
    Abstract: A position measuring system that includes a scale having a first track with successive partial areas of differing reflectivity and a second track with successive partial areas of differing reflectivity. A scanning unit which moves relative to the scale in a measuring direction so that a first position dependent scanning signal and a second position dependent scanning signal are generated by scanning the first track and the second track by the scanning unit. The first position dependent scanning signal and the second position dependent scanning signals have a different pitch behavior in case of a pitch tilt of either the scanning unit or the scale to the effect, that in that case the first position dependent scanning signal indicates an erroneous position, while the second position dependent scanning signal continues to show a correct position.
    Type: Grant
    Filed: June 26, 2002
    Date of Patent: July 5, 2005
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Ulrich Benner, Wolfgang Holzapfel
  • Publication number: 20040246500
    Abstract: A scanning unit for a position measuring instrument for optical scanning of a measuring graduation. The scanning unit includes a light source that emits light in a direction towards a measuring graduation that generates modified light from the emitted light. A detector that receives the modified light. A lens array, disposed upstream of the detector and including a plurality of optical lenses, that generates a defined image of a region of the measuring graduation, scanned by the emitted light, on the detector, wherein an image magnification of the lens array is greater than 0 and less than or equal to 2.
    Type: Application
    Filed: April 9, 2004
    Publication date: December 9, 2004
    Applicant: Dr. Johannes Heidenhain GmbH.
    Inventors: Wolfgang Holzapfel, Elmar Mayer, Ulrich Benner
  • Publication number: 20040227958
    Abstract: A position measuring system that includes a material measure having a measuring graduation extending along a first line and a scanning device. The scanning device includes a light source that transmits light beams that scan the measuring graduation, wherein the measuring graduation generates modified light from the transmitted light beams and a detector unit that receives the modified light from the measuring graduation. A lens arrangement, arranged between the material measure and the detector unit, the lens arrangement generating a defined image of the measuring graduation on the detector unit, wherein the defined image extends along a second line, whose curvature is different from a curvature of the first line.
    Type: Application
    Filed: May 7, 2004
    Publication date: November 18, 2004
    Applicant: Dr. Johannes Heidenhain GmbH
    Inventors: Ulrich Benner, Elmar Mayer, Wolfgang Holzapfel
  • Patent number: 6742275
    Abstract: A scale which is suitable for an absolute position determination, the scale includes a track which extends in at least one measuring direction and in which graduation areas of identical width and different optical properties are alternatingly arranged. At least first, second and third graduation areas with different optical properties that are arranged in the track, wherein a first logical signal is unequivocally assigned to a first combination of two successive different graduation areas, and a second logical signal is unequivocally assigned to a second combination of two successive different graduation areas, and wherein the first and second combinations differ from each other.
    Type: Grant
    Filed: January 16, 2003
    Date of Patent: June 1, 2004
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Elmar Mayer, Ulrich Benner
  • Publication number: 20040090637
    Abstract: An interferential position measuring arrangement including a light source connected to a first object, which emits a beam of rays in a direction of an optical axis and an optical element arranged downstream of the light source, which converts the beam of rays emitted by the light source into an incoming beam of rays. A scale grating connected to a second object that moves relative to the first object, which splits the incoming beam of rays into a first partial beam of rays, which is propagated into a first spatial direction and a second partial beam of rays, which is propagated into a second spatial direction.
    Type: Application
    Filed: August 6, 2003
    Publication date: May 13, 2004
    Inventors: Wolfgang Holzapfel, Michael Hermann, Walter Huber, Volker Hofer, Ulrich Benner, Karsten Sandig
  • Publication number: 20030145479
    Abstract: A scale which is suitable for an absolute position determination, the scale includes a track which extends in at least one measuring direction and in which graduation areas of identical width and different optical properties are alternatingly arranged. At least first, second and third graduation areas with different optical properties that are arranged in the track, wherein a first logical signal is unequivocally assigned to a first combination of two successive different graduation areas, and a second logical signal is unequivocally assigned to a second combination of two successive different graduation areas, and wherein the first and second combinations differ from each other.
    Type: Application
    Filed: January 16, 2003
    Publication date: August 7, 2003
    Inventors: Elmar Mayer, Ulrich Benner