Patents by Inventor Ulrich Boecherer

Ulrich Boecherer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240110981
    Abstract: A test device for testing an electrical circuit includes input terminals connectable by test leads to different test points of the electrical circuit; at least first and second measurement circuits; switches; a processor; and a storage medium storing instructions that, when executed by the processor, cause the test device to perform a first test of the electrical circuit while one or more of the switches electrically couples at least first and second ones of the input terminals to the first measurement circuit, and perform a second test of the electrical circuit while one or more of the switches electrically couples at least third and fourth ones of the input terminals the second measurement circuit, where the first and second tests are performed without changing connections of the input terminals of the test device to the different test points of the electrical circuit.
    Type: Application
    Filed: September 7, 2023
    Publication date: April 4, 2024
    Inventor: Ulrich Boecherer
  • Patent number: 11768242
    Abstract: A test device for testing an electrical circuit includes input terminals connectable by test leads to different test points of the electrical circuit; at least first and second measurement circuits; switches; a processor; and a storage medium storing instructions that, when executed by the processor, cause the test device to perform a first test of the electrical circuit while one or more of the switches electrically couples at least first and second ones of the input terminals to the first measurement circuit, and perform a second test of the electrical circuit while one or more of the switches electrically couples at least third and fourth ones of the input terminals the second measurement circuit, where the first and second tests are performed without changing connections of the input terminals of the test device to the different test points of the electrical circuit.
    Type: Grant
    Filed: November 30, 2022
    Date of Patent: September 26, 2023
    Assignee: Fluke Corporation
    Inventor: Ulrich Boecherer