Patents by Inventor Uppu Sharath Chandra
Uppu Sharath Chandra has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20230342272Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.Type: ApplicationFiled: June 28, 2023Publication date: October 26, 2023Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ming-Hung CHANG, Atul KATOCH, Chia-En HUANG, Ching-Wei WU, Donald G. MIKAN, JR., Hao-I YANG, Kao-Cheng LIN, Ming-Chien TSAI, Saman M.I. ADHAM, Tsung-Yung CHANG, Uppu Sharath CHANDRA
-
Patent number: 11734142Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.Type: GrantFiled: February 18, 2022Date of Patent: August 22, 2023Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald G. Mikan, Jr., Hao-I Yang, Kao-Cheng Lin, Ming-Chien Tsai, Saman M. I. Adham, Tsung-Yung Chang, Uppu Sharath Chandra
-
Publication number: 20220171688Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.Type: ApplicationFiled: February 18, 2022Publication date: June 2, 2022Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ming-Hung CHANG, Atul KATOCH, Chia-En HUANG, Ching-Wei WU, Donald G. MIKAN, JR., Hao-I YANG, Kao-Cheng LIN, Ming-Chien TSAI, Saman M.I. ADHAM, Tsung-Yung CHANG, Uppu Sharath CHANDRA
-
Patent number: 11256588Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.Type: GrantFiled: May 29, 2020Date of Patent: February 22, 2022Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald G. Mikan, Jr., Hao-I Yang, Kao-Cheng Lin, Ming-Chien Tsai, Saman M. I. Adham, Tsung-Yung Chang, Uppu Sharath Chandra
-
Publication number: 20200293417Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.Type: ApplicationFiled: May 29, 2020Publication date: September 17, 2020Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ming-Hung CHANG, Atul KATOCH, Chia-En HUANG, Ching-Wei WU, Donald G. MIKAN, JR., Hao-I YANG, Kao-Cheng LIN, Ming-Chien TSAI, Saman M.I. ADHAM, Tsung-Yung CHANG, Uppu Sharath CHANDRA
-
Patent number: 10705934Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.Type: GrantFiled: September 11, 2017Date of Patent: July 7, 2020Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald G. Mikan, Jr., Hao-I Yang, Kao-Cheng Lin, Ming-Chien Tsai, Saman M. I. Adham, Tsung-Yung Chang, Uppu Sharath Chandra
-
Publication number: 20190004915Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.Type: ApplicationFiled: September 11, 2017Publication date: January 3, 2019Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ming-Hung CHANG, Atul KATOCH, Chia-En HUANG, Ching-Wei WU, Donald G. MIKAN, JR., Hao-I YANG, Kao-Cheng LIN, Ming-Chien TSAI, Saman M.I ADHAM, Tsung-Yung CHANG, Uppu Sharath CHANDRA
-
Patent number: 8427888Abstract: A representative circuit device includes a local control circuit having a level shifter, wherein in response to receipt of a first address signal the level shifter shifts the first address signal from a first voltage level to a second voltage level, providing a level shifted first address signal; and a word-line driver having at least one input for receiving a plurality of address signals, wherein the at least one input includes a first input that is coupled to the local control circuit to receive the level shifted first address signal, and an output that is electrically coupled to a word line of a memory cell array.Type: GrantFiled: February 9, 2010Date of Patent: April 23, 2013Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Chung-Ji Lu, Lee-Cheng Hung, Hung-Jen Liao, Hsu-Shun Chen, Hong-Chen Cheng, Chung-Yi Wu, Uppu Sharath Chandra
-
Publication number: 20110194362Abstract: A representative circuit device includes a local control circuit having a level shifter, wherein in response to receipt of a first address signal the level shifter shifts the first address signal from a first voltage level to a second voltage level, providing a level shifted first address signal; and a word-line driver having at least one input for receiving a plurality of address signals, wherein the at least one input includes a first input that is coupled to the local control circuit to receive the level shifted first address signal, and an output that is electrically coupled to a word line of a memory cell array.Type: ApplicationFiled: February 9, 2010Publication date: August 11, 2011Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Chung-Ji LU, Lee-Cheng HUNG, Hung-Jen LIAO, Hsu-Shun CHEN, Hong-Chen CHENG, Chung-Yi Wu, Uppu Sharath CHANDRA