Abstract: A method for ascertaining the position of an edge in or on an object surface region of interest by optical scanning. The reflectivity of the object surface region is evaluated. Light is emitted onto the object surface region under different illumination conditions, in particular different light incidence directions, and in each illumination condition a sequence S1 to Sn of camera images B is recorded. Each camera image B of a sequence S1 to Sn is recorded at another illumination intensity I. Subsequently in each case one reflectivity image R1 to Rn is produced from a plurality of or from all camera images B of a sequence S1 to Sn. Thereafter, a resulting reflectivity image E is produced from a plurality of or from all reflectivity images R1 to Rn by weighted addition, in which resulting reflectivity image E the position of an edge is determined.

Abstract: A method for ascertaining the position of an edge in or on an object surface region of interest by optical scanning. The reflectivity of the object surface region is evaluated. Light is emitted onto the object surface region under different illumination conditions, in particular different light incidence directions, and in each illumination condition a sequence S1 to Sn of camera images B is recorded. Each camera image B of a sequence S1 to Sn is recorded at another illumination intensity I. Subsequently in each case one reflectivity image R1 to Rn is produced from a plurality of or from all camera images B of a sequence S1 to Sn. Thereafter, a resulting reflectivity image E is produced from a plurality of or from all reflectivity images R1 to Rn by weighted addition, in which resulting reflectivity image E the position of an edge is determined.

Abstract: A method for optimizing target quantities for optical precision measuring includes obtaining ancillary parameters from image data of a workpiece which is to be measured. Control data for influence quantities of the target quantities are derived from the ancillary parameters. The control data is derived as follows: by determining the courses of the ancillary parameters depending on at least one influence quantity and the courses of the ancillary parameters are determined in such a way that the courses have a like extremum of the functional dependence from the influence quantities. An overall course of the ancillary parameters is determined and an extremum of the overall course of the ancillary parameters is determined. Corresponding values of the influence quantities are determined at the site of the determined extremum as control data for the influence quantity.

Abstract: A method for optimizing target quantities for optical precision measuring includes obtaining ancillary parameters from image data of a workpiece which is to be measured. Control data for influence quantities of the target quantities are derived from the ancillary parameters. The control data is derived as follows: by determining the courses of the ancillary parameters depending on at least one influence quantity and the courses of the ancillary parameters are determined in such a way that the courses have a like extremum of the functional dependence from the influence quantities. An overall course of the ancillary parameters is determined and an extremum of the overall course of the ancillary parameters is determined. Corresponding values of the influence quantities are determined at the site of the determined extremum as control data for the influence quantity.