Patents by Inventor Uwe Paschen

Uwe Paschen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9024401
    Abstract: The finding that with a reasonable effort a layer thickness and/or refractive index variation may be acquired which realizes different internal optical path lengths for impinging radiation whereby fluctuation of spectral sensitivity of the photodetector is reduced is used to provide image sensors with a less fluctuating spectral sensitivity with respect to different wavelengths, or photodetectors with a small fluctuation of the spectral sensitivity from photodetector to photodetector with respect to defined wavelengths, with a reasonable effort.
    Type: Grant
    Filed: April 27, 2012
    Date of Patent: May 5, 2015
    Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
    Inventors: Frank Hochschulz, Stefan Dreiner, Uwe Paschen, Holger Vogt
  • Publication number: 20120273910
    Abstract: The finding that with a reasonable effort a layer thickness and/or refractive index variation may be acquired which realizes different internal optical path lengths for impinging radiation whereby fluctuation of spectral sensitivity of the photodetector is reduced is used to provide image sensors with a less fluctuating spectral sensitivity with respect to different wavelengths, or photodetectors with a small fluctuation of the spectral sensitivity from photodetector to photodetector with respect to defined wavelengths, with a reasonable effort.
    Type: Application
    Filed: April 27, 2012
    Publication date: November 1, 2012
    Inventors: Frank Hochschulz, Stefan Dreiner, Uwe Paschen, Holger Vogt
  • Patent number: 8026788
    Abstract: A thin-film resistor with a layer structure with a Ti layer and a TiN layer is described, wherein a layer thickness of the Ti layer and a layer thickness of the TiN layer are selected such that a resulting temperature coefficient of resistance (TCR) is smaller than 1000 ppm/° C.
    Type: Grant
    Filed: December 9, 2005
    Date of Patent: September 27, 2011
    Assignees: Fraunhofer—Gesellschaft zur Foerderung der angewandten Forschung e.V., Universitaet Duisburg—Essen Forsthausweg
    Inventors: Heinz Deiters, Susanne Linnenberg, Dirk Nachrodt, Uwe Paschen, Holger Vogt
  • Patent number: 7600531
    Abstract: The invention relates to a valve with a central guide and a check valve. The check valve and valve form an integrated component, the check valve being formed by a band which is shaped into a ring and is arranged in an internal groove.
    Type: Grant
    Filed: March 16, 2006
    Date of Patent: October 13, 2009
    Assignee: Hydraulik-Ring GmbH
    Inventors: Helmut Patze, Marius Cornea, Uwe Paschen
  • Publication number: 20090206982
    Abstract: A thin-film resistor with a layer structure with a Ti layer and a TiN layer is described, wherein a layer thickness of the Ti layer and a layer thickness of the TiN layer are selected such that a resulting temperature coefficient of resistance (TCR) is smaller than 1000 ppm/° C.
    Type: Application
    Filed: December 9, 2005
    Publication date: August 20, 2009
    Applicant: UNIVERSITAET DUISBURG-ESSEN
    Inventors: Heinz Deiters, Susanne Linnenberg, Dirk Nachrodt, Uwe Paschen, Holger Vogt
  • Publication number: 20060225791
    Abstract: The invention relates to a valve with a central guide and a check valve. The check valve and valve form an integrated component, the check valve being formed by a band which is shaped into a ring and is arranged in an internal groove.
    Type: Application
    Filed: March 16, 2006
    Publication date: October 12, 2006
    Applicant: Hydraulik-Ring GmbH
    Inventors: Helmut Patze, Marius Cornea, Uwe Paschen