Patents by Inventor Vaishakh Purohit Jagadeesh

Vaishakh Purohit Jagadeesh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11567926
    Abstract: A spurious outlier detection-system is provided. The system includes a memory having computer-readable instructions stored therein and a processor configured to execute the computer-readable instructions to receive time-series data from one or more sensors and/or applications, process the time-series data to detect one or more change points based on a pre-defined cost function. The processor is configured to identify data chunks between the change points using pre-determined window sizes and to estimate smooth reconstructed values (SRVs) for each of the change point data chunks between two consecutive change points to identify one or more global outliers from the SRVs. The processor is configured to determine distribution of the global outliers using kernel density for each change point data chunk and identify one or more true outliers from the distribution of the global outliers based upon a skewness of the distribution.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: January 31, 2023
    Assignee: Noodle Analytics, Inc.
    Inventors: Ravishankar Balasubramanian, Soham Chakraborty, Vaishakh Purohit Jagadeesh, Muhammed Jaish Kadooran
  • Publication number: 20210294787
    Abstract: A spurious outlier detection-system is provided. The system includes a memory having computer-readable instructions stored therein and a processor configured to execute the computer-readable instructions to receive time-series data from one or more sensors and/or applications, process the time-series data to detect one or more change points based on a pre-defined cost function. The processor is configured to identify data chunks between the change points using pre-determined window sizes and to estimate smooth reconstructed values (SRVs) for each of the change point data chunks between two consecutive change points to identify one or more global outliers from the SRVs. The processor is configured to determine distribution of the global outliers using kernel density for each change point data chunk and identify one or more true outliers from the distribution of the global outliers based upon a skewness of the distribution.
    Type: Application
    Filed: May 29, 2020
    Publication date: September 23, 2021
    Inventors: Ravishankar Balasubramanian, Soham Chakraborty, Vaishakh Purohit Jagadeesh, Muhammed Jaish Kadooran