Abstract: Some embodiments relate to an integrated circuit (IC). The IC determines a time-variant resistance of an sensing resistor, wherein a resistance of the sensing resistor reflects an ambient environmental condition. The IC includes first and second conditioning circuits, an analog to digital conversion (ADC) element, and a logic circuit. The first conditioning circuit provides a first voltage based on the resistance of the sensing resistor, while the second conditioning circuit provides a second voltage based on a resistance of an on-chip reference resistor. The ADC element provides a multi-bit digital value based on a ratio of the first and second voltages. The multi-bit digital value is indicative of the ambient environmental condition measured by the off-chip sensor. A logic circuit selectively adjusts the first and second voltages based on the multi-bit digital value to limit or avoid saturation of the ADC element. Other embodiments are also disclosed.

Abstract: Some embodiments relate to an integrated circuit (IC). The IC determines a time-variant resistance of an sensing resistor, wherein a resistance of the sensing resistor reflects an ambient environmental condition. The IC includes first and second conditioning circuits, an analog to digital conversion (ADC) element, and a logic circuit. The first conditioning circuit provides a first voltage based on the resistance of the sensing resistor, while the second conditioning circuit provides a second voltage based on a resistance of an on-chip reference resistor. The ADC element provides a multi-bit digital value based on a ratio of the first and second voltages. The multi-bit digital value is indicative of the ambient environmental condition measured by the off-chip sensor. A logic circuit selectively adjusts the first and second voltages based on the multi-bit digital value to limit or avoid saturation of the ADC element. Other embodiments are also disclosed.