Patents by Inventor Vasyl V. Molebny

Vasyl V. Molebny has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7311400
    Abstract: Eye refraction is measured to achieve desired quality via a selected vision characteristics. A characteristic of vision is selected to correlate to the desired quality of vision from a group of vision characteristics comprising acuity, Strehl ratio, contrast sensitivity, night vision, day vision, and depth of focus, dynamic refraction over a period of time during focus accommodation, and dynamic refraction over a period of time during pupil constriction and dilation. Wavefront aberration measurements are used to objectively measure the state of the eye refraction that defines the desired vision characteristic. The measured state of refraction is expressed with a mathematical function enabling correction of the pre-selected vision characteristic to achieve the desired quality of vision. The mathematical expression function may be a Zernike polynomial having both second order and higher order terms or a function determined by spline mathematical calculations.
    Type: Grant
    Filed: April 16, 2002
    Date of Patent: December 25, 2007
    Assignee: Tracey Technologies, LLC
    Inventors: Youssef Wakil, Vasyl V. Molebny, Sergiy Molebny, Ioannis Pallikaris
  • Patent number: 6932475
    Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source (1) produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye (15) parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector (19) measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.
    Type: Grant
    Filed: May 1, 2002
    Date of Patent: August 23, 2005
    Assignee: Tracey Technologies, L.L.C.
    Inventors: Vasyl V. Molebny, Ioannis Pallikaris, Igor Chyzh, Vyacheslav Sokurenko, Leonidas Naoumidis, Youssef Wakil
  • Publication number: 20030011745
    Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source (1) produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye (15) parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector (19) measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.
    Type: Application
    Filed: May 1, 2002
    Publication date: January 16, 2003
    Applicant: Tracey Technologies, LLC
    Inventors: Vasyl V. Molebny, Ioannis Pallikaris, Igor Chyzh, Vyacheslav Sokurenko, Leonidas Naoumidis, Youssef Wakil
  • Patent number: 6409345
    Abstract: An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A first photodetector measures the position of a first portion of the probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations. A second photodetector synchronously measures the position of a second portion of the probing beam light reflected back from the cornea of the eye.
    Type: Grant
    Filed: August 8, 2000
    Date of Patent: June 25, 2002
    Assignee: Tracey Technologies, LLC
    Inventors: Vasyl V. Molebny, Ioannis Pallikaris, Youssef Wakil, Sergiy Molebny