Abstract: Techniques and systems for providing user sentiment metrics are described that can help assess user sentiment with experiences by creating user sentiment metrics that combine telemetry data with user research data in a manner that takes a memory aspect into consideration. A user sentiment metric service can manage a user history data resource. The user history data resource can include user history information associated with a user having a user identifier. The user history information can include a plurality of events, each event having an event identifier and a timestamp. The user sentiment metric service can generate, for a unit of time, a user sentiment metric for a user using events occurring prior to and during the unit of time. The events can include events obtained from the user history information. The user sentiment metric can apply the user sentiment metric to an application.

Abstract: The disclosed subject matter includes techniques for performing a channel availability check. A method includes initiating, via a processor of a master device, a first connection on a first wireless channel with a subordinate device and transmitting, via the processor, a beacon to the subordinate device. The method includes monitoring, via the processor, the first wireless channel for a first predetermined amount of time for a connection request from the subordinate device in response to the beacon. The method includes performing the channel availability check to detect energy profiles on a second wireless channel for a second predetermined amount of time after the first predetermined amount of time. The processor may cycle between transmitting the beacon and monitoring the first wireless channel and performing the channel availability check on the second wireless channel until a threshold time is exceeded, the connection request is detected, or an energy profile is detected.

Abstract: The disclosed subject matter includes techniques for performing a channel availability check. A method includes initiating, via a processor of a master device, a first connection on a first wireless channel with a subordinate device and transmitting, via the processor, a beacon to the subordinate device. The method includes monitoring, via the processor, the first wireless channel for a first predetermined amount of time for a connection request from the subordinate device in response to the beacon. The method includes performing the channel availability check to detect energy profiles on a second wireless channel for a second predetermined amount of time after the first predetermined amount of time. The processor may cycle between transmitting the beacon and monitoring the first wireless channel and performing the channel availability check on the second wireless channel until a threshold time is exceeded, the connection request is detected, or an energy profile is detected.

Abstract: Embodiments of the present invention provide methods and apparatuses for determining factors for design consideration in yield analysis of semiconductor fabrication. In one embodiment, a computer-implemented method for determining factors for design consideration in yield analysis of semiconductor fabrication includes obtaining a geometric characteristic of a defect on a chip and obtaining design data of the chip, where the design data is associated with the defect. The method further includes determining a criticality factor of the defect based on the geometric characteristic and the design data, and outputting the criticality factor.

Abstract: A method and system are provided for counterfeit prevention for optical media. In one example, a system is provided for verifying authenticity information on an optical medium. The system receives the optical medium including a fingerprint having at least one probabilistic feature. A probabilistic feature is a physical feature having both a substantial chance to be read as a first value and a substantial chance to be read as a second value. The system receives an o-DNA signature-at-issuance. The system calculates an o-DNA signature-at-verification by reading each probabilistic feature plural times. The system calculates a vector-of-differences between the o-DNA signature-at-issuance and the o-DNA signature-at-verification. The vector-of-differences includes a maximum distance metric between the o-DNA signature-at-issuance and the o-DNA signature-at-verification. The vector-of-differences indicates the optical medium is authentic if the maximum distance metric is less than a threshold.

Abstract: In one embodiment, an inline defect analysis method includes receiving geometric characteristics of individual defects and design data corresponding to the individual defects, determining which of the individual defects are likely to be nuisance defects using the geometric characteristics and the corresponding design data, and refraining from sampling the defects that are likely to be nuisance defects.

Abstract: A method and system are provided for counterfeit prevention for optical media. In one example, a system is provided for verifying authenticity information on an optical medium. The system receives the optical medium including a fingerprint having at least one probabilistic feature. A probabilistic feature is a physical feature having both a substantial chance to be read as a first value and a substantial chance to be read as a second value. The system receives an o-DNA signature-at-issuance. The system calculates an o-DNA signature-at-verification by reading each probabilistic feature plural times. The system calculates a vector-of-differences between the o-DNA signature-at-issuance and the o-DNA signature-at-verification. The vector-of-differences includes a maximum distance metric between the o-DNA signature-at-issuance and the o-DNA signature-at-verification. The vector-of-differences indicates the optical medium is authentic if the maximum distance metric is less than a threshold.

Abstract: Embodiments of the present invention generally relate to a module that can test and analyze various regions of a solar cell device in an automated or manual fashion after one or more steps have been completed in the solar cell formation process. The module used to perform the automated testing and analysis processes can also be adapted to test a partially formed solar cell at various stages of the solar cell formation process within an automated solar cell production line. The automated solar cell production line is generally an arrangement of automated processing modules and automation equipment that is used to form solar cell devices.

Abstract: In one embodiment, a method for predicting yield during the design stage includes receiving defectivity data identifying defects associated with previous wafer designs, and dividing the defects into systematic defects and random defects. For each design layout of a new wafer design, yield is predicted separately for the systematic defects and the random defects. A combined yield is then calculated based on the yield predicted for the systematic defects and the yield predicted for the random defects.

Abstract: One embodiment of the present invention sets forth a computer-implemented method for tuning laser scribe parameters during the fabrication of a solar module. The method includes analyzing the visual appearance of a laser scribe to extract various morphological parameters related to the quality of a laser scribe process used to produce the scribe. Based on the morphological parameters, the laser scribe parameters may be modified in-situ to achieve settings that are optimal for performing laser scribing in each layer of the solar module. As a result, laser scribe process cycle time may be minimized while providing better indication of the laser scribe process stability and quality relative to the prior art approaches.

Abstract: Embodiments of the present invention generally provide a method for detecting the position of a substrate within a processing chamber. Embodiments of the present invention are particularly useful for the detection of a mis-positioned solar cell substrate during photoabsorber layer deposition processes within a solar cell production line. Reflected power is measured during processing of a substrate and communicated to a system controller. The system controller compares the measured reflected power with an established range of reflected power. If the measured reflected power is substantially out of range, the system controller signals for the chamber to be taken offline for inspection, maintenance, and/or repair. The system controller may further divert the flow of substrates within the production line around the offline chamber without shutting down the entire solar cell production line.

Abstract: In one embodiment, a method for predicting yield includes calculating a criticality factor (CF) for each of a plurality of defects detected in an inspection process step of a wafer, and determining a yield-loss contribution of the inspection process step to the final yield based on CFs of the plurality of defects and the yield model built for a relevant design. The yield-loss contribution of the inspection process step is then used to predict the final yield for the wafer.

Abstract: Grain size variations within a copper film are quantified by analyzing an SEM image of a portion of the copper film, determining an approximate total length of grain boundaries within the SEM image, and calculating a grain boundary density based on the approximate total length of the grain boundaries and the area of the copper film represented in the SEM image. The calculated grain boundary density allows for correlating plating and anneal process parameters, as well as electrical and reliability performance.

Abstract: Embodiments of the present invention generally relate to a system used to form solar cell devices using processing modules adapted to perform one or more processes in the formation of the solar cell devices. In one embodiment, the system is adapted to form thin film solar cell devices by accepting a large unprocessed substrate and performing multiple deposition, material removal, cleaning, sectioning, bonding, and various inspection and testing processes to form multiple complete, functional, and tested solar cell devices that can then be shipped to an end user for installation in a desired location to generate electricity. In one embodiment, the system provides inspection of solar cell devices at various levels of formation, while collecting and using metrology data to diagnose, tune, or improve production line processes during the manufacture of solar cell devices.

Abstract: Methods and apparatus for categorizing defects on workpieces, such as semiconductor wafers and masks used in lithographically writing patterns into such wafers are provided. For some embodiments, by analyzing the layout in the neighborhood of the defect, and matching it to similar defected neighborhoods in different locations across the die, defects may be categorized by common structures in which they occur.

Abstract: Methods and apparatus for categorizing defects on workpieces, such as semiconductor wafers and masks used in lithographically writing patterns into such wafers are provided. For some embodiments, by analyzing the layout in the neighborhood of the defect, and matching it to similar defected neighborhoods in different locations across the die, defects may be categorized by common structures in which they occur.

Abstract: A method and apparatus for exposing a solar device to simulated environmental conditions is described. In one embodiment, a chamber is described. The chamber includes a frame defining a partial enclosure having an interior volume, the frame comprising a door selectively sealing an opening in the frame, a plurality of lighting devices coupled to the enclosure interior of an open wall, each of the plurality of lighting devices being positioned to direct light toward an upper surface of a platen disposed in the interior area, and a plurality of fan units positioned in an opening formed in a sidewall of the frame, each of the plurality of fan units positioned to direct ambient air flow from the outside of the enclosure toward the platen and between the plurality of lighting devices to exit through the open wall.

Abstract: One embodiment of the present invention sets forth a computer-implemented method for tuning laser scribe parameters during the fabrication of a solar module. The method includes analyzing the visual appearance of a laser scribe to extract various morphological parameters related to the quality of a laser scribe process used to produce the scribe. Based on the morphological parameters, the laser scribe parameters may be modified in-situ to achieve settings that are optimal for performing laser scribing in each layer of the solar module. As a result, laser scribe process cycle time may be minimized while providing better indication of the laser scribe process stability and quality relative to the prior art approaches.

Abstract: Embodiments of the present invention generally relate to a module that can test and analyze various regions of a solar cell device in an automated or manual fashion after one or more steps have been completed in the solar cell formation process. The module used to perform the automated testing and analysis processes can also be adapted to test a partially formed solar cell at various stages of the solar cell formation process within an automated solar cell production line. The automated solar cell production line is generally an arrangement of automated processing modules and automation equipment that is used to form solar cell devices.

Abstract: The formation of diagnostic devices on the same substrate used to fabricate a photovoltaic (PV) cell is described. Such devices, also referred to as process diagnostic vehicles (PDVs), are configured for in-line monitoring of electrical characteristics of PV cell features and are formed on the substrate using the same process steps for PV cell fabrication. The data collected via the PDVs can be used to tune or optimize subsequent PV cell fabrication, i.e., used as feedback for the fabrication process. Alternatively, the data collected via PDVs can be fed forward in the fabrication process, so that later process steps performed on a PV cell substrate can be modified to compensate for issues detected on the PV cell substrate via the PDVs.