Patents by Inventor Victor V. Laiko
Victor V. Laiko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11360059Abstract: A system and method for sample analysis using a portable gas chromatography (GC)-mass spectrometry (MS) is provided. The GC-MS system includes an injector configured to accept a sample containing a mixture of chemicals and release at least part of the sample for a separation by GC, a MEMS GC column with an integrated heater configured to accept and at least partly separate the mixture of chemicals, and a mass analyzer in a vacuum chamber configured to accept and mass-analyze the released separated chemicals. The MEMS GC column with the integrated heater is located mostly inside the MS vacuum chamber.Type: GrantFiled: May 31, 2019Date of Patent: June 14, 2022Assignee: Mass Tech, Inc.Inventors: Vladimir M. Doroshenko, Victor V. Laiko
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Patent number: 11107669Abstract: A system and method for sample analysis using sub-atmospheric pressure (sub-AP) laser ionization. The sub-AP ion source includes a holder with a sample containing analyte molecules, a pulsed laser beam configured to generate ionized species from the sample, an ion extractor adjacent to the holder configured to extract analyte ions from the ionized species by an extraction electric field Es near the sample, an ion funnel structure composed of orifice electrodes located along an ion funnel pathway direction z. The ion funnel structure has an entrance and an exit, the exit being the electrode with the smallest aperture in the structure. This structure is configured for accepting the analyte ions from the ion extractor at the entrance and dragging them toward the exit using an axial electric field Ez along the direction z. The extraction electric field Es is at least partly electrically shielded from the axial electric field Ez.Type: GrantFiled: September 5, 2018Date of Patent: August 31, 2021Assignee: SCIENCE AND ENGINEERING SERVICES, LLCInventors: Vladimir M. Doroshenko, Victor V. Laiko, Eugene Moskovets
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Publication number: 20200378930Abstract: A system and method for sample analysis using a portable gas chromatography (GC)-mass spectrometry (MS) is provided. The GC-MS system includes an injector configured to accept a sample containing a mixture of chemicals and release at least part of the sample for a separation by GC, a MEMS GC column with an integrated heater configured to accept and at least partly separate the mixture of chemicals, and a mass analyzer in a vacuum chamber configured to accept and mass-analyze the released separated chemicals. The MEMS GC column with the integrated heater is located mostly inside the MS vacuum chamber.Type: ApplicationFiled: May 31, 2019Publication date: December 3, 2020Applicant: Mass Tech, Inc.Inventors: Vladimir M. DOROSHENKO, Victor V. LAIKO
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Publication number: 20190074170Abstract: A system and method for sample analysis using sub-atmospheric pressure (sub-AP) laser ionization. The sub-AP ion source includes a holder with a sample containing analyte molecules, a pulsed laser beam configured to generate ionized species from the sample, an ion extractor adjacent to the holder configured to extract analyte ions from the ionized species by an extraction electric field Es near the sample, an ion funnel structure composed of orifice electrodes located along an ion funnel pathway direction z. The ion funnel structure has an entrance and an exit, the exit being the electrode with the smallest aperture in the structure. This structure is configured for accepting the analyte ions from the ion extractor at the entrance and dragging them toward the exit using an axial electric field Ez along the direction z. The extraction electric field Es is at least partly electrically shielded from the axial electric field Ez.Type: ApplicationFiled: September 5, 2018Publication date: March 7, 2019Applicant: SCIENCE AND ENGINEERING SERVICES, LLCInventors: Vladimir M. Doroshenko, Victor V. Laiko, Eugene Moskovets
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Publication number: 20180076014Abstract: A system and method for sample analysis using sub-atmospheric pressure (sub-AP) laser ionization. The sub-AP ion source includes a holder with a sample containing analyte molecules, a pulsed laser beam configured to generate ionized species from the sample, an ion extractor adjacent to the holder configured to extract analyte ions from the ionized species by an extraction electric field Es near the sample, an ion funnel structure composed of orifice electrodes located along an ion funnel pathway direction z. The ion funnel structure has an entrance and an exit, the exit being the electrode with the smallest aperture in the structure. This structure is configured for accepting the analyte ions from the ion extractor at the entrance and dragging them toward the exit using an axial electric field Ez along the direction z. The extraction electric field Es is at least partly electrically shielded from the axial electric field Ez.Type: ApplicationFiled: September 9, 2016Publication date: March 15, 2018Applicant: SCIENCE AND ENGINEERING SERVICES, LLCInventors: Vladimir M. Doroshenko, Victor V. Laiko, Eugene Moskovets
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Patent number: 9171708Abstract: An interchangeable ion source for a spectrometer. The ion source includes an interface which mounts the ion source relative to a gas inlet of the spectrometer, a sample holder, a laser which produces a laser beam capable of ionizing the sample at ambient pressure, and an optical system. The ion source includes an equipment chassis which supports the interface, the sample holder, the laser and the optical system as a rigid unit such that the interface, the sample holder, the laser and the optical system remain in alignment upon attachment and detachment of the ion source from the spectrometer and an enclosure which embraces an atmosphere around components of the ion source. In addition, the ion source includes a circulator which circulates at least part of the atmosphere within the enclosure.Type: GrantFiled: January 27, 2015Date of Patent: October 27, 2015Assignee: Science and Engineering Services, LLCInventors: Vladimir M. Doroshenko, Victor V. Laiko, Eugene Moskovets
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Patent number: 8471199Abstract: A portable mass spectrometer having an atmospheric pressure interface for introducing ions generated at ambient pressure gas conditions into a vacuum of the mass spectrometer. The mass spectrometer has a vacuum chamber having at least one vacuum section and at least one gas inlet for directing the ambient pressure gas including the ions into the at least one vacuum section. The at least one gas inlet has a gas passage channel of a length L and a limiting cross section S with a ratio of L/S being less than 20,000 cm?1. The mass spectrometer has a radio frequency (RF) ion guide in the at least one vacuum section positioned for collecting the ions from the at least one gas inlet and transmitting the ions further to a mass analyzer for analyzing the ions transmitted from the ion guide.Type: GrantFiled: April 6, 2012Date of Patent: June 25, 2013Assignee: Science and Engineering Services, Inc.Inventors: Vladimir M. Doroshenko, Victor V. Laiko, Alexander S. Misharin
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Patent number: 7122789Abstract: A method and an apparatus for collecting ions in which ions are produced from a sample in an ion source. An electric field is provided that is more uniform in an area adjacent the sample than in an area adjacent an inlet to the ion transfer device or that is larger in field strength at the sample than at a point removed from the sample towards the inlet of the ion transfer device. Ions are received into the electric field and transferred through the ion transfer device to a sampling orifice of the mass spectrometer. The apparatus includes an ion transfer device coupled to a sampling orifice of a mass spectrometer. The ion transfer device has an inlet with a surface that extends in a direction from an axis of the ion transfer device. The ion transfer device can extend a distance of at least 10 times an inner diameter of a sampling orifice of the mass spectrometer.Type: GrantFiled: May 11, 2004Date of Patent: October 17, 2006Assignee: Science & Engineering Services, Inc.Inventors: Phillip V. Tan, Victor V. Laiko, Vadym Berkout, Vladimir M. Doroshenko
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Patent number: 6791080Abstract: An apparatus and a method which produce a pulse of ions, generate a transient electric field correlated in time with a duration of the pulse of ions, receive the pulse of ions into the transient electric field, and collect the ions from an ion drift region of the transient electric field into a gas dynamic flow region of the mass analyzer. As such, an apparatus for transferring ions into a mass analyzer includes an ion source configured to generate the pulse of ions, a transient electric field device configured to receive the pulse of ions and generate the transient electric field, and an ion collector configured to collect the ions from the ion drift region and transfer the ions into the mass analyzer.Type: GrantFiled: February 19, 2003Date of Patent: September 14, 2004Assignee: Science & Engineering Services, IncorporatedInventors: Vladimir M. Doroshenko, Victor V. Laiko, Phillip V. Tan
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Publication number: 20040159784Abstract: An apparatus and a method which produce a pulse of ions, generate a transient electric field correlated in time with a duration of the pulse of ions, receive the pulse of ions into the transient electric field, and collect the ions from an ion drift region of the transient electric field into a gas dynamic flow region of the mass analyzer. As such, an apparatus for transferring ions into a mass analyzer includes an ion source configured to generate the pulse of ions, a transient electric field device configured to receive the pulse of ions and generate the transient electric field, and an ion collector configured to collect the ions from the ion drift region and transfer the ions into the mass analyzer.Type: ApplicationFiled: February 19, 2003Publication date: August 19, 2004Applicant: Science & Engineering Services, Inc.Inventors: Vladimir M. Doroshenko, Victor V. Laiko, Phillip V. Tan
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Patent number: 6683300Abstract: A method, system, and apparatus for mass spectroscopic analysis of an analyte solution in which a liquid volume of the analyte solution is irradiated with a light source resulting in desorption of solution-specific ions into a surrounding gas to produce gas-phase ions, the gas-phase ions are transferred to an inlet port of a mass analyzer, and the gas-phase ions are mass analyzed. More specifically, the apparatus may include a laser configured to pulse irradiate a surface of the analyte solution, a mass spectrometer configured to mass-analyze the gas-phase ions according to the mass-to-charge ratio, and a transfer mechanism configured to transfer the gas-phase ions to an inlet port of the mass spectrometer.Type: GrantFiled: September 17, 2001Date of Patent: January 27, 2004Assignee: Science & Engineering Services, Inc.Inventors: Vladimir M. Doroshenko, Victor V. Laiko, Mikhail Yakshin, Coorg R. Prasad, Hyo Sang Lee
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Publication number: 20030052268Abstract: A method, system, and apparatus for mass spectroscopic analysis of an analyte solution in which a liquid volume of the analyte solution is irradiated with a light source resulting in desorption of solution-specific ions into a surrounding gas to produce gas-phase ions, the gas-phase ions are transferred to an inlet port of a mass analyzer, and the gas-phase ions are mass analyzed. More specifically, the apparatus may include a laser configured to pulse irradiate a surface of the analyte solution, a mass spectrometer configured to mass-analyze the gas-phase ions according to the mass-to-charge ratio, and a transfer mechanism configured to transfer the gas-phase ions to an inlet port of the mass spectrometer.Type: ApplicationFiled: September 17, 2001Publication date: March 20, 2003Applicant: Science & Engineering Services, Inc.Inventors: Vladimir M. Doroshenko, Victor V. Laiko, Mikhail Yakshin, Coorg R. Prasad, Hyo Sang Lee
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Patent number: 5965884Abstract: An Atmospheric Pressure Matrix-Assisted Laser Desorption Ionization (AP-MALDI) apparatus is for connecting to a mass spectrometer. This apparatus provides an ion source using matrix-assisted laser desorption and ionization at or near atmospheric pressure. The apparatus has non-destructive ion source having the characteristics of versatility, simplicity.Type: GrantFiled: June 4, 1998Date of Patent: October 12, 1999Assignee: The Regents of the University of CaliforniaInventors: Victor V. Laiko, Alma L. Burlingame