Patents by Inventor Vijay Vankayala

Vijay Vankayala has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • On-die termination apparatuses and methods
    Patent number: 9196321
    Abstract: Apparatuses and methods are disclosed herein, including those, performed by a memory die, that operate to detect that a command on a bus connected to the memory die is addressed to another memory die responsive to a chip select signal, and to change the impedance of an on-die termination circuit of the memory die responsive to the detecting.
    Type: Grant
    Filed: October 3, 2013
    Date of Patent: November 24, 2015
    Assignee: Micron Technology, Inc.
    Inventors: Brian W. Huber, Vijay Vankayala, Brian Gross, Gary Howe, Roy E. Greeff
  • ON-DIE TERMINATION APPARATUSES AND METHODS
    Publication number: 20150098285
    Abstract: Apparatuses and methods are disclosed herein, including those, performed by a memory die, that operate to detect that a command on a bus connected to the memory die is addressed to another memory die responsive to a chip select signal, and to change the impedance of an on-die termination circuit of the memory die responsive to the detecting.
    Type: Application
    Filed: October 3, 2013
    Publication date: April 9, 2015
    Applicant: Micron Technology, Inc.
    Inventors: Brian W. Huber, Vijay Vankayala, Brian Gross, Gary Howe, Roy E. Greeff
  • Systems and methods for detecting terminal state and setting output driver impedance
    Patent number: 7982494
    Abstract: Embodiments of the present invention include systems for calibrating an output circuit. A comparator is coupled to a calibration terminal and configured to determine whether the calibration terminal is in a first state coupled to a calibration resistor or in a second state. A calibration circuit is coupled to the calibration terminal and configured to generate a calibration value based in part on the presence or absence of the calibration resistor. An impedance selector is coupled to the calibration circuit, the comparator, and a default calibration value. The impedance selector is configured to select the default calibration value when the comparator indicates the calibration terminal is in the second state and to select the calibration value coupled from the calibration circuit when the comparator indicates the calibration terminal is in the first state.
    Type: Grant
    Filed: March 3, 2010
    Date of Patent: July 19, 2011
    Assignee: Micron Technology, Inc.
    Inventors: Raghu Sreeramaneni, Vijay Vankayala, Greg Blodgett
  • SYSTEMS AND METHODS FOR DETECTING TERMINAL STATE AND SETTING OUTPUT DRIVER IMPEDANCE
    Publication number: 20100182014
    Abstract: Embodiments of the present invention include systems for calibrating an output circuit. A comparator is coupled to a calibration terminal and configured to determine whether the calibration terminal is in a first state coupled to a calibration resistor or in a second state. A calibration circuit is coupled to the calibration terminal and configured to generate a calibration value based in part on the presence or absence of the calibration resistor. An impedance selector is coupled to the calibration circuit, the comparator, and a default calibration value. The impedance selector is configured to select the default calibration value when the comparator indicates the calibration terminal is in the second state and to select the calibration value coupled from the calibration circuit when the comparator indicates the calibration terminal is in the first state.
    Type: Application
    Filed: March 3, 2010
    Publication date: July 22, 2010
    Applicant: Micron Technology, Inc.
    Inventors: Raghu Sreeramaneni, Vijay Vankayala, Greg Blodgett
  • Systems and methods for detecting terminal state and setting output driver impedance
    Patent number: 7696778
    Abstract: Embodiments of the present invention include systems for calibrating an output circuit. A comparator is coupled to a calibration terminal and configured to determine whether the calibration terminal is in a first state coupled to a calibration resistor or in a second state. A calibration circuit is coupled to the calibration terminal and configured to generate a calibration value based in part on the presence or absence of the calibration resistor. An impedance selector is coupled to the calibration circuit, the comparator, and a default calibration value. The impedance selector is configured to select the default calibration value when the comparator indicates the calibration terminal is in the second state and to select the calibration value coupled from the calibration circuit when the comparator indicates the calibration terminal is in the first state.
    Type: Grant
    Filed: January 16, 2009
    Date of Patent: April 13, 2010
    Assignee: Micron Technology, Inc.
    Inventors: Raghu Sreeramaneni, Vijay Vankayala, Greg Blodgett