Abstract: A method for determining a height position of an object at of using a microscope which images using a point-spread function along a z-direction (height direction), comprising the steps of imaging the object in the far field and determining a far-field intensity, calculating a maximum intensity expected by multiplying the far-field intensity by a scaling factor, partially confocally imaging the object with the focus in the z-direction within the depth-of-field range, and determining a partially-confocal intensity of the imaging, calculating the intensity of the point-spread function (at the first location) by forming a difference between the partially-confocal intensity and a product of the far-field intensity and a predefined combination factor, calculating the z-coordinate of the focus at a point-spread function maximum, using a previously-known form of the point spread function, its calculated intensity, and the calculated expected maximum intensity, and using the z-coordinate as the height position of the

Abstract: A microscopic imaging method, includes illuminating a specimen with illumination radiation and capturing detection radiation along a detection axis. The detection radiation is caused by the illumination radiation, at a first time as a wide-field signal and at a second time as a composite signal. The composite signal is formed by a superposition of a confocal image and a wide-field image; extracting the confocal image by subtracting the wide-field signal from the composite signal, wherein a correction factor is used. A current correction factor is ascertained for each executed imaging and/or for each imaged specimen (1) and the confocal image is extracted using the respective current correction factor.

Abstract: The invention concerns a digital microscope for capturing images of a sample with an extended depth of field. The microscope comprises a stand (01) with an opening (16) for receiving an optical unit (07). The microscope further comprises an optical unit (07) with an objective (08), an image sensor, and a microelectromechanical optical system on an optical path from the objective (08) to the image sensor. The microelectromechanical optical system is configured for extending a depth of field at the optical path. According to the invention, the imaging unit (07) comprises a mounting unit (13) comprising a first portion (14) for removable mounting the mounting unit (13) into the opening (16) of the stand (01), a second portion (18) for removable mounting an illumination unit (17) onto the mounting unit (13), and a third portion (21) for removable mounting an additional lens (19) onto the mounting unit (13) into an optical axis (22) of the objective (08). Furthermore, the invention concerns a microscopic set.

Abstract: A method for determining a height position of an object at of using a microscope which images using a point-spread function along a z-direction (height direction), comprising the steps of imaging the object in the far field and determining a far-field intensity, calculating a maximum intensity expected by multiplying the far-field intensity by a scaling factor, partially confocally imaging the object with the focus in the z-direction within the depth-of-field range, and determining a partially-confocal intensity of the imaging, calculating the intensity of the point-spread function (at the first location) by forming a difference between the partially-confocal intensity and a product of the far-field intensity and a predefined combination factor, calculating the z-coordinate of the focus at a point-spread function maximum, using a previously-known form of the point spread function, its calculated intensity, and the calculated expected maximum intensity, and using the z-coordinate as the height position of the

Abstract: A confocal microscope and an associated method for determining a topography of a sample by implementing a correlative spinning disk microscopy is provided. The method includes placing a sample on an object stage of the microscope. Either the object stage is moved vertically to determine the topography of the sample, while first and second images of the sample are captured in an alternating manner. A vertical focus position is stored as metadata for each image. Two first or second images are interpolated to give an intermediate image. A confocal image for a defined vertical position is generated by calculating the intermediate image with the second or first image at the position.

Abstract: A method for determining a height position of an object at of using a microscope which images using a point-spread function along a z-direction (height direction), comprising the steps of imaging the object in the far field and determining a far-field intensity, calculating a maximum intensity expected by multiplying the far-field intensity by a scaling factor, partially confocally imaging the object with the focus in the z-direction within the depth-of-field range, and determining a partially-confocal intensity of the imaging, calculating the intensity of the point-spread function (at the first location) by forming a difference between the partially-confocal intensity and a product of the far-field intensity and a predefined combination factor, calculating the z-coordinate of the focus at a point-spread function maximum, using a previously-known form of the point spread function, its calculated intensity, and the calculated expected maximum intensity, and using the z-coordinate as the height position of the

Abstract: A microscopic imaging method, includes illuminating a specimen with illumination radiation and capturing detection radiation along a detection axis. The detection radiation is caused by the illumination radiation, at a first time as a wide-field signal and at a second time as a composite signal. The composite signal is formed by a superposition of a confocal image and a wide-field image; extracting the confocal image by subtracting the wide-field signal from the composite signal, wherein a correction factor is used. A current correction factor is ascertained for each executed imaging and/or for each imaged specimen (1) and the confocal image is extracted using the respective current correction factor.

Abstract: The invention relates to a confocal microscope and a method for determining a topography of a sample by means of correlative spinning disk microscopy. An object stage and/or a focus drive is moved vertically in order to determine the topography, while first and second images of a sample placed on the object stage are captured in an alternating manner. A vertical focus position is stored as metadata for each image. Two first or second images are interpolated to give an intermediate image. A confocal image for a defined vertical position is generated by calculating the intermediate image with the second or first image at the position.

Abstract: The invention relates to a device for microscopy, with at least one light source for providing illumination light, with a detection unit for detecting light radiated back from a sample, with a microscopy optical unit for guiding illumination light onto the sample and for guiding light radiated back from the sample in the direction of the detection unit and with, arranged in an illumination beam path, an excitation mask (40) for providing structured illumination. The device is characterized in that the excitation mask is a spatially structured filter, which is transparent to light with a first physical property and which impresses spatial structure onto light with a second physical property that is different from the first physical property. The invention moreover relates to a method for microscopy.

Abstract: The invention relates to a device for microscopy, with at least one light source for providing illumination light, with a detection unit for detecting light radiated back from a sample, with a microscopy optical unit for guiding illumination light onto the sample and for guiding light radiated back from the sample in the direction of the detection unit and with, arranged in an illumination beam path, an excitation mask (40) for providing structured illumination. The device is characterized in that the excitation mask is a spatially structured filter, which is transparent to light with a first physical property and which impresses spatial structure onto light with a second physical property that is different from the first physical property. The invention moreover relates to a method for microscopy.