Abstract: The invention relates to a structured illumination system (8) for the three-dimensional microscopy of a sample (14), that comprises: beam generation means (9, 10) adapted for generating coherent light beams (IN, I?N, I0); a lens (12) having a rear focal plane (PFA), and arranged so that the sample (14) can be placed in the focalisation plane (PMP) of the lens; focalisation means (19) arranged for focusing the light beams in the rear focal plane (PFA) so that the beams interfere in a collimated manner in the focalisation plane (PMP) of the lens (12); characterised in that the beam generation means (9, 10) includes a light space modulator (10) programmed for diffracting a light signal (22) in order to generate at least two different diffracted beams ((IN, I0), (I?N, I0)) that are not symmetrical relative to the lens optical axis, wherein the light space modulator includes a calculator adapted for applying a constant phase term to each of said at least two coherent beams.

Abstract: The invention relates to a structured illumination system (8) for the three-dimensional microscopy of a sample (14), that comprises: beam generation means (9, 10) adapted for generating coherent light beams (IN, I?N, I0); a lens (12) having a rear focal plane (PFA), and arranged so that the sample (14) can be placed in the focalisation plane (PMP) of the lens; focalisation means (19) arranged for focusing the light beams in the rear focal plane (PFA) so that the beams interfere in a collimated manner in the focalisation plane (PMP) of the lens (12); characterised in that the beam generation means (9, 10) includes a light space modulator (10) programmed for diffracting a light signal (22) in order to generate at least two different diffracted beams ((IN, I0), (I?N, I0)) that are not symmetrical relative to the lens optical axis, wherein the light space modulator includes a calculator adapted for applying a constant phase term to each of said at least two coherent beams.