Patents by Inventor Vineet Joshi

Vineet Joshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240055066
    Abstract: Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro. The output data is generated by the memory macro in response to processing the at least one input vector. The BIST also includes comparing the output data in each of the plurality of cycles with a signature value and determining whether the memory macro is normal or faulty based upon the comparison.
    Type: Application
    Filed: October 13, 2023
    Publication date: February 15, 2024
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Ted Wong, Saman Adham, Marat Gershoig, Vineet Joshi
  • Patent number: 11823758
    Abstract: Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro. The output data is generated by the memory macro in response to processing the at least one input vector. The BIST also includes comparing the output data in each of the plurality of cycles with a signature value and determining whether the memory macro is normal or faulty based upon the comparison.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: November 21, 2023
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Saman Adham, Ted Wong, Marat Gershoig, Vineet Joshi
  • Publication number: 20230122954
    Abstract: Disclosed herein is a method. The method is implemented by an authentication engine stored on a memory as processor executable instructions. The processor executable instructions are executed by at least one processor. The method (i.e., as implemented by the authentication engine) includes determining an authentication mechanism for an external system to a software platform, generating an interface, executing the authentication mechanism within the interface, authenticating an entity within the interface, and provisioning element instance details with respect to the authentication of the entity.
    Type: Application
    Filed: October 18, 2021
    Publication date: April 20, 2023
    Applicant: UiPath, Inc.
    Inventors: Vineet Joshi, Maxwell Warner, Guy Van Wert
  • Publication number: 20220254428
    Abstract: Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro. The output data is generated by the memory macro in response to processing the at least one input vector. The BIST also includes comparing the output data in each of the plurality of cycles with a signature value and determining whether the memory macro is normal or faulty based upon the comparison.
    Type: Application
    Filed: September 9, 2021
    Publication date: August 11, 2022
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Saman Adham, Ted Wong, Marat Gershoig, Vineet Joshi
  • Patent number: 8296258
    Abstract: Select portions of product channel data collected by a product channel participant and stored in a data warehouse are periodically extracted based on a previously determined template. The extracted subset of product channel data is thereafter transformed so that the format of the data complies with that of the requesting enterprise. Once transformed, one or more rule sets is applied to the subset of transformed data to guarantee that the information complies with requirements set forth by the enterprise yet does not violate any disclosure rules of the product channel participant. Thereafter and on a scheduled basis, the transformed and validated data is delivered to a delivery server from which the enterprise can retrieve the data at its convenience.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: October 23, 2012
    Assignee: InfoNow Corporation
    Inventors: Nahum Rand, Vineet Joshi, Irwin Rosenblum
  • Patent number: 8201033
    Abstract: An error correction code system for a memory is provided. The memory is provided with a parity array that is directly accessible. An embodiment of the error correction code system includes writing and reading test data directly to the parity array. The data read from the parity array is compared with the test data written to the parity array to detect errors.
    Type: Grant
    Filed: June 30, 2011
    Date of Patent: June 12, 2012
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Adrian Earle, Raviprakrash S. Rao, Vineet Joshi
  • Publication number: 20110258515
    Abstract: An error correction code system for a memory is provided. The memory is provided with a parity array that is directly accessible. An embodiment of the error correction code system includes writing and reading test data directly to the parity array. The data read from the parity array is compared with the test data written to the parity array to detect errors.
    Type: Application
    Filed: June 30, 2011
    Publication date: October 20, 2011
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Adrian Earle, Raviprakrash S. Rao, Vineet Joshi
  • Patent number: 7996734
    Abstract: An error correction code system for a memory is provided. The memory is provided with a parity array that is directly accessible. An embodiment of the error correction code system includes writing and reading test data directly to the parity array. The data read from the parity array is compared with the test data written to the parity array to detect errors.
    Type: Grant
    Filed: July 9, 2010
    Date of Patent: August 9, 2011
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Adrian Earle, Raviprakrash S. Rao, Vineet Joshi
  • Publication number: 20100281302
    Abstract: An error correction code system for a memory is provided. The memory is provided with a parity array that is directly accessible. An embodiment of the error correction code system includes writing and reading test data directly to the parity array. The data read from the parity array is compared with the test data written to the parity array to detect errors.
    Type: Application
    Filed: July 9, 2010
    Publication date: November 4, 2010
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Adrian Earle, Raviprakrash S. Rao, Vineet Joshi
  • Patent number: 7779334
    Abstract: An error correction code system for a memory having parity columns of a memory array located within the memory array is provided. The parity columns are grouped together or distributed throughout the memory array. An embodiment includes a multiplexor circuit for selectively coupling only parity bits stored in the parity memory array to I/O circuitry, bypassing ECC logic circuitry and allowing the parity columns to be directly accessible, in a direct access mode or for selectively coupling the parity bits to ECC logic circuitry in an ECC mode.
    Type: Grant
    Filed: June 25, 2007
    Date of Patent: August 17, 2010
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Adrian Earle, Raviprakrash S. Rao, Vineet Joshi
  • Publication number: 20090327452
    Abstract: Select portions of product channel data collected by a product channel participant and stored in a data warehouse are periodically extracted based on a previously determined template. The extracted subset of product channel data is thereafter transformed so that the format of the data complies with that of the requesting enterprise. Once transformed, one or more rule sets is applied to the subset of transformed data to guarantee that the information complies with requirements set forth by the enterprise yet does not violate any disclosure rules of the product channel participant. Thereafter and on a scheduled basis, the transformed and validated data is delivered to a delivery server from which the enterprise can retrieve the data at its convenience.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 31, 2009
    Applicant: InfoNow Corporation
    Inventors: Nahum Rand, Vineet Joshi, Irwin Rosenblum
  • Publication number: 20080300987
    Abstract: A merchant portal accessible by a user via the Internet searches for a product using typical search techniques. The merchant portal returns to the user a list of merchants in an identified geographic location. For each listed merchant, a token is created that associates the inquiry and the merchant. Once a token has been generated, financial transactions at the merchant are monitored for the time corresponding to the life of the token. When a transaction occurs at a merchant involving the user, a report is generated associating that sale with the inquiry. Based on the sale, a fee for directing the user to the merchant is generated.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 4, 2008
    Applicant: InfoNow Corporation
    Inventors: Nahum Rand, Vineet Joshi
  • Publication number: 20080016392
    Abstract: An error correction code system for a memory for improving performance and testability. The parity columns of the memory array can be positioned centrally within the array to minimize routing distance to ECC logic circuitry. The parity columns can be grouped together or distributed throughout the array to optimize performance. A multiplexor circuit can be included for selectively coupling only the parity bits stored in the parity memory array to I/O circuitry. Therefore, the parity columns can be directly tested, and testing of the ECC logic circuitry is facilitated.
    Type: Application
    Filed: June 25, 2007
    Publication date: January 17, 2008
    Applicant: EMERGING MEMORY TECHNOLOGIES INC.
    Inventors: Adrian Earl, Raviprakrash Rao, Vineet Joshi