Abstract: A safety adapter assembly includes a first electrical connector, a second electrical connector, a connector body, and a safety sleeve. The connector body is structured to couple the first electrical connector to the second electrical connector. The safety sleeve is substantially surrounding the connector body and configured to move relative to the connector body to selectively allow user access to the first electrical connector while substantially blocking user access to the second electrical connector, or to allow user access to the second electrical connector while substantially blocking user access to the first electrical connector.

Abstract: A safety adapter assembly includes a first electrical connector, a second electrical connector, a connector body, and a safety sleeve. The connector body is structured to couple the first electrical connector to the second electrical connector. The safety sleeve is substantially surrounding the connector body and configured to move relative to the connector body to selectively allow user access to the first electrical connector while substantially blocking user access to the second electrical connector, or to allow user access to the second electrical connector while substantially blocking user access to the first electrical connector.

Abstract: A system for testing an integrated-circuit wafer, the system including a probe card having a probe needle and a probe body enclosing a pressure chamber. The probe body includes a unitary sidewall, a first end cap substantially closing a first end of the probe body, except for an outlet passage in the first end cap, and an inlet passage configured to introduce compressed gas into the pressure chamber. The probe needle is within the pressure chamber and is supported by the probe body. A free end of the probe needle extends through the outlet passage. The ends of the probe needle are separated by a first bend in the probe needle, which has a center of curvature that is located between the probe needle and a longitudinal centerline of the unitary sidewall. Methods of using a probe card are also disclosed.

Abstract: A system for testing an integrated-circuit wafer includes a probe card and a dispenser assembly. The probe card includes a circuit board and a probe needle coupled to the circuit board. The dispenser assembly is coupled to the probe card and is configured to deliver a metered amount of dielectric fluid to the tip of the probe needle. Methods are also disclosed.

Abstract: A system for testing an integrated-circuit wafer, the system including a probe card having a probe needle and a probe body enclosing a pressure chamber. The probe body includes a unitary sidewall, a first end cap substantially closing a first end of the probe body, except for an outlet passage in the first end cap, and an inlet passage configured to introduce compressed gas into the pressure chamber. The probe needle is within the pressure chamber and is supported by the probe body. A free end of the probe needle extends through the outlet passage. The ends of the probe needle are separated by a first bend in the probe needle, which has a center of curvature that is located between the probe needle and a longitudinal centerline of the unitary sidewall. Methods of using a probe card are also disclosed.

Abstract: A cable strain arrestor assembly that protects equipment from damage due to pulling forces on attached cables is disclosed. The assembly comprises a mounting bracket that attaches to an equipment enclosure and converts pulling forces on the cables into compressional forces on the cables in order to break the cables before any damage can be transferred further through the cables. The assembly is able to convert these pulling forces by utilizing a tapering slot and a complementary shaped clamping collar with a channel that contracts as the clamping collar is moved in the direction of the taper of the slot.