Abstract: A control device for a microscope includes an actuator configured to shift a microscopic field of view relative to a sample, and an operating device configured to be operated by a user to control the actuator in accordance with a response characteristic determining a shift sensitivity. The field of view is shifted relative to the sample in response to a user operation of the operating device. The control device further includes a processor configured to determine a total visual magnification, and to control the response characteristic of the operating device based on the total visual magnification. The field of view is visualized by the microscope to the user based on the total visual magnification.

Abstract: A microscope includes a control system connected to an illumination system and an imaging system. The control system is configured to: detect an image affecting change in microscope settings and/or in a location of the sample, the image affecting change resulting in an alteration of the sample image; cause the imaging system to deliver a live image stream of live images of the sample in a first imaging mode, or to deliver a still image stream of still image(s) of the sample in a second imaging mode, and to switch from the first imaging mode into the second imaging mode when no image affecting change is detected, using one of the last live images of the first imaging mode for at least a part of the still image stream in the second imaging mode; and reduce an illumination intensity of the illumination system during the second imaging mode.

Abstract: A control device for a microscope includes an operating device, an actuator and a processor. The operating device is configured to be operated by a user to vary focusing and/or positioning of an optical imaging system of the microscope relative to a sample. The actuator is configured to adjust an aperture of a detection pinhole which is included in the microscope so as to eliminate out-of-focus light from detection light which is directed by the optical imaging system onto a detector of the microscope. The processor is configured to detect a predetermined operating condition in response to a user operation of the operating device and to control the actuator to vary the aperture of the detection pinhole upon detection of the predetermined operating condition.

Abstract: The invention relates to a method for automatically determining a plurality of positions (P1-P8) in a sample arrangement (40) in the object space of a microscope (1) comprising a microscope objective (10) which defines an optical axis (8), wherein: a measurement beam (30) is generated by a measurement beam device (19) and directed at the sample arrangement (40), and a measurement beam (32, 32?) reflected by the sample arrangement (40) is detected by a detector (28) which produces an output signal; the sample arrangement (40) is displaced in at least one direction perpendicular to the optical axis (8); and the plurality of positions (P1-P8) in the sample arrangement is determined on the basis of the displacement by means of output signals of the detector (28) generated during the displacement in the at least one direction. The invention also relates to a corresponding microscope (1).

Abstract: A microscope includes a control system connected to an illumination system and an imaging system. The control system is configured to: detect an image affecting change in microscope settings and/or in a location of the sample, the image affecting change resulting in an alteration of the sample image; cause the imaging system to deliver a live image stream of live images of the sample in a first imaging mode, or to deliver a still image stream of still image(s) of the sample in a second imaging mode, and to switch from the first imaging mode into the second imaging mode when no image affecting change is detected, using one of the last live images of the first imaging mode for at least a part of the still image stream in the second imaging mode; and reduce an illumination intensity of the illumination system during the second imaging mode.