Patents by Inventor Wai Bun Ow

Wai Bun Ow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for evaluating bit error rate for a magnetic head by using a quasi-static test system, and system thereof
    Patent number: 9208805
    Abstract: A method for evaluating bit error rate for a magnetic head by using a quasi-static test system, includes step (a), measuring a noise characteristic curve for a magnetic head, and the noise characteristic comprising noise amplitude and maximum noise amplitude; step (b), constructing a noise waveform by appropriately scaling a signal noise ratio of the magnetic head based on the noise characteristic curve measured in step (a); and step (c), injecting the noise waveform constructed in step (b) into a model comprising a transmitter module and a receiver module to evaluate a bit error rate. The method saves testing time, reduces manpower, and obtains accuracy testing result.
    Type: Grant
    Filed: December 29, 2014
    Date of Patent: December 8, 2015
    Assignee: SAE Magnetics (H.K) Ltd.
    Inventors: Wai Bun Ow, Ho Kei Lam, Cheuk Man Lui, Kai Chiu Cheung, Yuk Sing Lo, Wah Chun Chan, Juren Ding