Patents by Inventor Walter Haeberle

Walter Haeberle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Positioning apparatus
    Patent number: 6076397
    Abstract: The invention relates to a positioning apparatus, providing for an excursion of a tool (12) with respect to a sample or medium to be interacted with. The positioning apparatus comprises apparatus for applying a driving force (F.sub.D) which causes the excursion of the tool (12). Counteracting apparatus is provided which exerts a counteracting force (F.sub.C) to the driving force (F.sub.D). The counteracting apparatus comprises a deformable substance (25) which is mechanically coupled to the tool (12) and effects the counteracting force (F.sub.C) and further comprises adjustment means (28) allowing to adjust the deformability of the deformable substance (25).
    Type: Grant
    Filed: December 1, 1997
    Date of Patent: June 20, 2000
    Assignee: International Business Machines Corporation
    Inventors: Karl Gerd Binnig, Walter Haeberle, Heinrich Rohrer
  • Investigation and/or manipulation device for a sample in fluid
    Patent number: 5831153
    Abstract: An investigation and/or manipulation device for a sample which is located in a container fluid includes an investigation and/or manipulation tool which is mounted at a first of a cantilever and which during investigation and/or manipulation of the sample immerses into the container fluid. The opposite side of the cantilever is at least partly not immersed into the container fluid during investigation.
    Type: Grant
    Filed: February 14, 1997
    Date of Patent: November 3, 1998
    Assignee: International Business Machines Corporation
    Inventors: Gerd Karl Binnig, Walter Haeberle
  • Fine positioning apparatus with atomic resolution
    Patent number: 5808302
    Abstract: A fine-positioning apparatus for a scanning probe microscope includes magnetic solenoid actuators for each of the x, y and z scanning axes of the microscope. The sample is mounted on the coil of one of the actuators for movement of the sample in the z direction while the tunnelling probe is attached to two other solenoid actuators for movement of the probe in the x and y directions.
    Type: Grant
    Filed: February 26, 1997
    Date of Patent: September 15, 1998
    Assignee: International Business Machines Corporation
    Inventors: Gerd K. Binnig, Walter Haeberle, Heinrich Rohrer, Douglas P. E. Smith