Patents by Inventor Wan-Chun FANG

Wan-Chun FANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11598806
    Abstract: A test system is disclosed. The test system includes a tester, a first voltage stabilization circuit, and a device under test (DUT). The tester generates a first operational voltage and a control signal. The first voltage stabilization circuit transmits a second operational voltage, associated with the first operational voltage, to a socket board. The DUT operates with the second operational voltage received through the socket board. The first voltage stabilization circuit is further configured to control, according to the control signal, the second operational voltage to have a first voltage level when the DUT is operating.
    Type: Grant
    Filed: January 21, 2021
    Date of Patent: March 7, 2023
    Assignee: NANYA TECHNOLOGY CORPORATION
    Inventors: Yu-Wei Tseng, Chih-Ming Chang, Wan-Chun Fang, Jui-Chung Hsu, Chun-Hsi Li
  • Publication number: 20220229109
    Abstract: A test system is disclosed. The test system includes a tester, a first voltage stabilization circuit, and a device under test (DUT). The tester generates a first operational voltage and a control signal. The first voltage stabilization circuit transmits a second operational voltage, associated with the first operational voltage, to a socket board. The DUT operates with the second operational voltage received through the socket board. The first voltage stabilization circuit is further configured to control, according to the control signal, the second operational voltage to have a first voltage level when the DUT is operating.
    Type: Application
    Filed: January 21, 2021
    Publication date: July 21, 2022
    Inventors: Yu-Wei TSENG, Chih-Ming CHANG, Wan-Chun FANG, Jui-Chung HSU, Chun-Hsi LI