Abstract: The present invention provides a method and system for blowing dust and other foreign particles off semiconductor substrate surfaces. The system may blow ionized air, which neutralizes electrostatic charges on the substrate surface thereby facilitating the release of particles from the substrate and reducing the risk of damage to semiconductor substrates from electrostatic discharge. The system also provides a vacuum for capturing dust particles blown off the surface, thus preventing the particles from contaminating clean room environments and redepositing on the cleaned substrate or other substrates.

Abstract: The quality of bonding between a conductive ball and a conductive pad of a lead frame strip of an IC package are determined by etching the conductive ball from the conductive pad, and analyzing the bottom view of the conductive ball. The conductive ball is comprised of a first conductive material and a conductive pad is comprised of a second conductive material. The conductive ball is bonded to the conductive pad by formation of an intermediary material formed from the first conductive material of the conductive ball and the second conductive material of the conductive pad. The lead frame strip is immersed within an etching solution such that the intermediary material is etched between the conductive ball and the conductive pad until the conductive ball may be decoupled from the conductive pad.

Abstract: The quality of bonding between a conductive ball and a conductive pad of a lead frame strip of an IC package are determined by etching the conductive ball from the conductive pad, and analyzing the bottom view of the conductive ball. The conductive ball is comprised of a first conductive material and a conductive pad is comprised of a second conductive material. The conductive ball is bonded to the conductive pad by formation of an intermediary material formed from the first conductive material of the conductive ball and the second conductive material of the conductive pad. The lead frame strip is immersed within an etching solution such that the intermediary material is etched between the conductive ball and the conductive pad until the conductive ball may be decoupled from the conductive pad.

Abstract: A wire bond clamp for holding lead frame fingers of a plurality of lead frames against a heater block so that electrical connections may be made between the lead frames and IC components. The wire bond clamp includes a baseplate having a plurality of openings. Each of the openings are provided for receiving a clamping insert, which insert has a central aperture therethrough and jaws surrounding the central aperture on a bottom surface of the insert. The central apertures on each clamping insert are sized and positioned so that during a wire bond process, the wire bond clamp may be lowered over a plurality of lead frames and IC components, and tips of the lead frame fingers and the IC components will be located within the central apertures. The jaws of each clamping insert are provided to engage each of the lead frame fingers, and to hold each of the fingers against the heater block.

Abstract: A lead frame, comprises a pair of spaced apart rail portions and a plurality of leads therebetween for attachment to a semiconductor die and defining an area for accommodating a semiconductor device. A single, narrow, strip shaped tie bar of substantially constant width extends between and substantially perpendicular to the rail portions and traverses a narrow portion of the die receiving area. A die pad portion is provided for bonding to the die intermediate the ends of the strip.