Patents by Inventor Wataru Otsuka

Wataru Otsuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11295812
    Abstract: Memory devices and memory operational methods are described. One example memory system includes a common conductor and a plurality of memory cells coupled with the common conductor. The memory system additionally includes access circuitry configured to provide different ones of the memory cells into one of a plurality of different memory states at a plurality of different moments in time between first and second moments in time. The access circuitry is further configured to maintain the common conductor at a voltage potential, which corresponds to the one memory state, between the first and second moments in time to provide the memory cells into the one memory state.
    Type: Grant
    Filed: June 26, 2019
    Date of Patent: April 5, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino
  • Patent number: 10783961
    Abstract: Memory cells, memory systems and methods are described. In one embodiment, a memory cell includes electrodes and a memory element, and a first electrically conductive structure is formed within dielectric material providing the memory element in a low resistance state as a result of a first voltage of a first polarity being applied across the electrodes. Additionally, the first electrically conductive structure is removed from the dielectric material providing the memory element in a high resistance state as a result of a second voltage of a second polarity, which is opposite to the first polarity, being applied across the electrodes. A permanent and irreversible electrically conductive structure is formed within the dielectric material providing the memory element in the low resistance state as a result of a third voltage of the second polarity and having an increased potential compared with the second voltage being applied across the electrodes.
    Type: Grant
    Filed: June 11, 2019
    Date of Patent: September 22, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino, D. V. Nirmal Ramaswamy
  • Patent number: 10622067
    Abstract: Memory devices and memory operational methods are described. One example memory system includes a common conductor and a plurality of memory cells coupled with the common conductor. The memory system additionally includes access circuitry configured to provide different ones of the memory cells into one of a plurality of different memory states at a plurality of different moments in time between first and second moments in time. The access circuitry is further configured to maintain the common conductor at a voltage potential, which corresponds to the one memory state, between the first and second moments in time to provide the memory cells into the one memory state.
    Type: Grant
    Filed: November 13, 2018
    Date of Patent: April 14, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino
  • Patent number: 10492794
    Abstract: According to the present invention, there is provided a clip cartridge in which a clip having a structure enabling a user to easily perform a series of procedures can be easily and reliably mounted on a treatment instrument body. A clip cartridge (200) according to the present invention includes an inner case (30) that has a first accommodation region (32) for accommodating a clip (110), and an outer case (40) that has an elongated insertion hole (43) into which a treatment instrument body (90) is inserted, and a second accommodation region (42) which accommodates the inner case (30) so as to be movable. The treatment instrument body (90) is inserted into the insertion hole (43), and an operation wire is pressed forward so that a distal connection portion and a diameter enlargement portion of the sleeve protrude from the sheath to a distal side and enter the second accommodation region (42), and so that a diameter enlargement portion is elastically enlarged in diameter.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: December 3, 2019
    Assignee: SUMITOMO BAKELITE CO., LTD.
    Inventors: Masao Ikeda, Takuya Hayashi, Etsuro Yamabe, Hideaki Matsunami, Wataru Otsuka, Tetsuro Abe
  • Publication number: 20190318782
    Abstract: Memory devices and memory operational methods are described. One example memory system includes a common conductor and a plurality of memory cells coupled with the common conductor. The memory system additionally includes access circuitry configured to provide different ones of the memory cells into one of a plurality of different memory states at a plurality of different moments in time between first and second moments in time. The access circuitry is further configured to maintain the common conductor at a voltage potential, which corresponds to the one memory state, between the first and second moments in time to provide the memory cells into the one memory state.
    Type: Application
    Filed: June 26, 2019
    Publication date: October 17, 2019
    Applicant: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino
  • Publication number: 20190311767
    Abstract: Memory cells, memory systems and methods are described. In one embodiment, a memory cell includes electrodes and a memory element, and a first electrically conductive structure is formed within dielectric material providing the memory element in a low resistance state as a result of a first voltage of a first polarity being applied across the electrodes. Additionally, the first electrically conductive structure is removed from the dielectric material providing the memory element in a high resistance state as a result of a second voltage of a second polarity, which is opposite to the first polarity, being applied across the electrodes. A permanent and irreversible electrically conductive structure is formed within the dielectric material providing the memory element in the low resistance state as a result of a third voltage of the second polarity and having an increased potential compared with the second voltage being applied across the electrodes.
    Type: Application
    Filed: June 11, 2019
    Publication date: October 10, 2019
    Applicant: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino, D. V. Nirmal Ramaswamy
  • Patent number: 10438661
    Abstract: Memory devices and memory operational methods are described. One example memory system includes a common conductor and a plurality of memory cells coupled with the common conductor. The memory system additionally includes access circuitry configured to provide different ones of the memory cells into one of a plurality of different memory states at a plurality of different moments in time between first and second moments in time. The access circuitry is further configured to maintain the common conductor at a voltage potential, which corresponds to the one memory state, between the first and second moments in time to provide the memory cells into the one memory state.
    Type: Grant
    Filed: May 23, 2016
    Date of Patent: October 8, 2019
    Assignee: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino
  • Patent number: 10395731
    Abstract: Memory cells, memory systems and methods are described. In one embodiment, a memory cell includes electrodes and a memory element, and a first electrically conductive structure is formed within dielectric material providing the memory element in a low resistance state as a result of a first voltage of a first polarity being applied across the electrodes. Additionally, the first electrically conductive structure is removed from the dielectric material providing the memory element in a high resistance state as a result of a second voltage of a second polarity, which is opposite to the first polarity, being applied across the electrodes. A permanent and irreversible electrically conductive structure is formed within the dielectric material providing the memory element in the low resistance state as a result of a third voltage of the second polarity and having an increased potential compared with the second voltage being applied across the electrodes.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: August 27, 2019
    Assignee: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino, D. V. Nirmal Ramaswamy
  • Patent number: 10249366
    Abstract: An integrated circuit system, and a method of manufacture thereof, including: an integrated circuit die; a non-volatile memory cell in the integrated circuit die and having a bit line for reading a data condition state of the non-volatile memory cell; and a voltage clamp in the integrated circuit die, the voltage clamp having a semiconductor switch connected to the bit line for reducing voltage excursions on the bit line.
    Type: Grant
    Filed: November 18, 2016
    Date of Patent: April 2, 2019
    Assignee: Sony Semiconductor Solutions Corporation
    Inventors: Makoto Kitagawa, Tomohito Tsushima, Wataru Otsuka, Takafumi Kunihiro
  • Publication number: 20190080759
    Abstract: Memory devices and memory operational methods are described. One example memory system includes a common conductor and a plurality of memory cells coupled with the common conductor. The memory system additionally includes access circuitry configured to provide different ones of the memory cells into one of a plurality of different memory states at a plurality of different moments in time between first and second moments in time. The access circuitry is further configured to maintain the common conductor at a voltage potential, which corresponds to the one memory state, between the first and second moments in time to provide the memory cells into the one memory state.
    Type: Application
    Filed: November 13, 2018
    Publication date: March 14, 2019
    Applicant: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino
  • Patent number: 10213251
    Abstract: The high-frequency treatment tool includes a flexible tube inserted into a body cavity; an operating wire inserted through the flexible tube to be movable back and forth; a treatment part arranged on a distal end of the operating wire and treats biological tissue by applying a high-frequency current; a main body that fixes a base end of the flexible tube; a slider-fixing part that fixes a base end of the operating wire guided from the base end of the flexible tube and slides the operating wire in an axis direction with respect to the main body; and a slider-zipping part provided to encircle at least a portion of an outer peripheral surface of the slider-fixing part and slides the slider-fixing part by the operation of a user. The slider-fixing part is unrotatably coupled to the main body and the slider-gripping part is rotatably coupled to the slider-fixing part.
    Type: Grant
    Filed: May 30, 2014
    Date of Patent: February 26, 2019
    Assignee: SUMITOMO BAKELITE COMPANY LIMITED
    Inventors: Wataru Otsuka, Shinetsu Harata
  • Publication number: 20190046205
    Abstract: According to the present invention, there is provided a clip cartridge in which a clip having a structure enabling a user to easily perform a series of procedures can be easily and reliably mounted on a treatment instrument body. A clip cartridge (200) according to the present invention includes an inner case (30) that has a first accommodation region (32) for accommodating a clip (110), and an outer case (40) that has an elongated insertion hole (43) into which a treatment instrument body (90) is inserted, and a second accommodation region (42) which accommodates the inner case (30) so as to be movable. The treatment instrument body (90) is inserted into the insertion hole (43), and an operation wire is pressed forward so that a distal connection portion and a diameter enlargement portion of the sleeve protrude from the sheath to a distal side and enter the second accommodation region (42), and so that a diameter enlargement portion is elastically enlarged in diameter.
    Type: Application
    Filed: February 23, 2017
    Publication date: February 14, 2019
    Applicant: SUMITOMO BAKELITE CO., LTD.
    Inventors: Masao IKEDA, Takuya HAYASHI, Etsuro YAMABE, Hideaki MATSUNAMI, Wataru OTSUKA, Tetsuro ABE
  • Publication number: 20180366188
    Abstract: An integrated circuit system, and a method of manufacture thereof, including: an integrated circuit die; a non-volatile memory cell in the integrated circuit die and having a bit line for reading a data condition state of the non-volatile memory cell; and a voltage clamp in the integrated circuit die, the voltage clamp having a semiconductor switch connected to the bit line for reducing voltage excursions on the bit line.
    Type: Application
    Filed: November 18, 2016
    Publication date: December 20, 2018
    Inventors: Makoto Kitagawa, Tomohito Tsushima, Wataru Otsuka, Takafumi Kunihiro
  • Publication number: 20180144792
    Abstract: Memory cells, memory systems and methods are described. In one embodiment, a memory cell includes electrodes and a memory element, and a first electrically conductive structure is formed within dielectric material providing the memory element in a low resistance state as a result of a first voltage of a first polarity being applied across the electrodes. Additionally, the first electrically conductive structure is removed from the dielectric material providing the memory element in a high resistance state as a result of a second voltage of a second polarity, which is opposite to the first polarity, being applied across the electrodes. A permanent and irreversible electrically conductive structure is formed within the dielectric material providing the memory element in the low resistance state as a result of a third voltage of the second polarity and having an increased potential compared with the second voltage being applied across the electrodes.
    Type: Application
    Filed: December 29, 2017
    Publication date: May 24, 2018
    Applicant: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino, D. V. Nirmal Ramaswamy
  • Publication number: 20180144797
    Abstract: An integrated circuit system, and a method of manufacture thereof, including: an integrated circuit die; a non-volatile memory cell in the integrated circuit die and having a bit line for reading a data condition state of the non-volatile memory cell; and a voltage clamp in the integrated circuit die, the voltage clamp having a semiconductor switch connected to the bit line for reducing voltage excursions on the bit line.
    Type: Application
    Filed: November 18, 2016
    Publication date: May 24, 2018
    Inventors: Makoto Kitagawa, Tomohito Tsushima, Wataru Otsuka, Takafumi Kunihiro
  • Patent number: 9911489
    Abstract: Memory cells, memory systems and methods are described. In one embodiment, a memory cell includes electrodes and a memory element, and a first electrically conductive structure is formed within dielectric material providing the memory element in a low resistance state as a result of a first voltage of a first polarity being applied across the electrodes. Additionally, the first electrically conductive structure is removed from the dielectric material providing the memory element in a high resistance state as a result of a second voltage of a second polarity, which is opposite to the first polarity, being applied across the electrodes. A permanent and irreversible electrically conductive structure is formed within the dielectric material providing the memory element in the low resistance state as a result of a third voltage of the second polarity and having an increased potential compared with the second voltage being applied across the electrodes.
    Type: Grant
    Filed: March 21, 2016
    Date of Patent: March 6, 2018
    Assignee: Micron Technology, Inc.
    Inventors: Wataru Otsuka, Takafumi Kunihiro, Tomohito Tsushima, Makoto Kitagawa, Jun Sumino, D. V. Nirmal Ramaswamy
  • Patent number: 9905300
    Abstract: A memory device comprising a memory array comprising a plurality of memory cells, two or more fuses coupled to the memory array, wherein each of the two or more fuses contains trim data for the memory array and a mode register for selecting one of the two or more fuses to be enabled.
    Type: Grant
    Filed: January 27, 2017
    Date of Patent: February 27, 2018
    Assignee: Sony Semiconductor Solutions Corporation
    Inventors: Makoto Kitagawa, Takafumi Kunihiro, Wataru Otsuka, Tomohito Tsushima
  • Publication number: 20170140827
    Abstract: A memory device comprising a memory array comprising a plurality of memory cells, two or more fuses coupled to the memory array, wherein each of the two or more fuses contains trim data for the memory array and a mode register for selecting one of the two or more fuses to be enabled.
    Type: Application
    Filed: January 27, 2017
    Publication date: May 18, 2017
    Inventors: Makoto Kitagawa, Takafumi Kunihiro, Wataru Otsuka, Tomohito Tsushima
  • Patent number: 9646690
    Abstract: A method of operation of a non-volatile memory system includes: providing a resistive storage element having a high resistance state and a low resistance state; coupling an analog multiplexer to the resistive storage element for applying a bias voltage; and switching between a verification bias and a read bias through the analog multiplexer for increasing a read margin between the high resistance state and the low resistance state.
    Type: Grant
    Filed: June 25, 2015
    Date of Patent: May 9, 2017
    Assignee: Sony Semiconductor Solutions Corporation
    Inventors: Wataru Otsuka, Jun Sumino, Tomohito Tsushima, Makoto Kitagawa, Takafumi Kunihiro
  • Patent number: 9594516
    Abstract: A memory device comprising a memory array comprising a plurality of memory cells, two or more fuses coupled to the memory array, wherein each of the two or more fuses contains trim data for the memory array and a mode register for selecting one of the two or more fuses to be enabled.
    Type: Grant
    Filed: February 14, 2014
    Date of Patent: March 14, 2017
    Assignee: Sony Semiconductor Solutions Corporation
    Inventors: Makoto Kitagawa, Takafumi Kunihiro, Wataru Otsuka, Tomohito Tsushima