Patents by Inventor Wei-Feng Huang

Wei-Feng Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050185836
    Abstract: Image data in a first color space is converted to image data corresponding to a second color space. Image processing of the image data occurs in the second color space. After image processing is complete, the image data is then converted to image data in any one of the following color spaces: 1) the first color space, 2) a third color space, or 3) the second color space but using a conversion method that is different than the conversion method used to convert the image data from the first color space to the second color space.
    Type: Application
    Filed: February 24, 2004
    Publication date: August 25, 2005
    Inventor: Wei-Feng Huang
  • Publication number: 20050084150
    Abstract: A method includes receiving color image data arranged in a non-square color image pattern, such as RGB raw data in a Bayer pattern. G-plane color image data of the non-square color image pattern is mapped to a substantially square color image pattern. Compression and decompression of the G-plane color image data of the substantially square color image pattern is performed. After decompression, the decompressed G-plane color image data is remapped into another G-plane color image pattern that is substantially the same as the original non-square G-plane color image pattern. Interpolation from an RGB space to another color space, such as a YCbCr space, can be subsequently performed, along with or in addition to image enhancement processing.
    Type: Application
    Filed: November 10, 2004
    Publication date: April 21, 2005
    Applicant: OmniVision Technologies, Inc.
    Inventors: Jizhang Shan, Wei-Feng Huang
  • Patent number: 5530245
    Abstract: Positron annihilation radiation lineshapes from two-dimensional angular correlation and Doppler broadened spectrum measurements are used to monitor specific surface acidity (proton concentration per unit surface area) of catalytic materials with large internal surface areas. Annihilation gamma lineshape parameter increases with internal surface area and decreases with specific surface acidity as a result of oxidation of positronium atoms at the surface by protons. These results point to a new and effective method for specific surface acidity valuations.
    Type: Grant
    Filed: May 9, 1994
    Date of Patent: June 25, 1996
    Inventor: Wei-Feng Huang