Patents by Inventor Wei-Syuan WONG

Wei-Syuan WONG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10353022
    Abstract: A measuring apparatus for electromagnetic property of material includes a chamber and a specified shielding piece. The chamber has a cavity inside and the chamber has an electromagnetic wave access terminal to connect to the cavity, used to receive an input electromagnetic wave and output a reflective electromagnetic wave. The specified shielding piece is disposed inside the cavity with respect to the electromagnetic wave access terminal, used to produce a region in side the cavity. The region is dominated by magnetic field and is used to adapt an object to be measured.
    Type: Grant
    Filed: March 31, 2017
    Date of Patent: July 16, 2019
    Assignee: National Tsing Hua University
    Inventors: Tsun-Hsu Chang, Wei-Syuan Wong, Yan-Ren Chen, Hsien-Wen Chao
  • Publication number: 20180120388
    Abstract: A measuring apparatus for electromagnetic property of material includes a chamber and a specified shielding piece. The chamber has a cavity inside and the chamber has an electromagnetic wave access terminal to connect to the cavity, used to receive an input electromagnetic wave and output a reflective electromagnetic wave. The specified shielding piece is disposed inside the cavity with respect to the electromagnetic wave access terminal, used to produce a region in side the cavity. The region is dominated by magnetic field and is used to adapt an object to be measured.
    Type: Application
    Filed: March 31, 2017
    Publication date: May 3, 2018
    Applicant: National Tsing Hua University
    Inventors: Tsun-Hsu Chang, Wei-Syuan Wong, Yan-Ren Chen, Hsien-Wen Chao
  • Patent number: 9810645
    Abstract: A system for measuring a permittivity includes a resonant chamber, a conductive probe, a platform, a pillar, a detector, and a computing module. The resonant chamber has a cavity. The conductive probe is configured for introducing a microwave into the cavity of the resonant chamber. The platform is configured for carrying a sample. The pillar is positioned between the platform and a chamber wall, so that the platform protrudes from the chamber wall. The detector is used to detect a resonant frequency of the microwave when resonance occurs within the cavity. The computing module is configured for calculating a permittivity corresponding to the measured resonant frequency according to a corresponding relationship between resonant frequency and permittivity. The above-mentioned system for measuring a permittivity is capable of measuring a broader range of permittivity with simplified measurement steps and higher accuracy. A method for measuring a permittivity is also disclosed.
    Type: Grant
    Filed: March 20, 2015
    Date of Patent: November 7, 2017
    Assignee: NATIONAL TSING HUA UNIVERSITY
    Inventors: Tsun-Hsu Chang, Hsein-Wen Chao, Wei-Syuan Wong
  • Publication number: 20160146742
    Abstract: A system for measuring a permittivity includes a resonant chamber, a conductive probe, a platform, a pillar, a detector, and a computing module. The resonant chamber has a cavity. The conductive probe is configured for introducing a microwave into the cavity of the resonant chamber. The platform is configured for carrying a sample. The pillar is positioned between the platform and a chamber wall, so that the platform protrudes from the chamber wall. The detector is used to detect a resonant frequency of the microwave when resonance occurs within the cavity. The computing module is configured for calculating a permittivity corresponding to the measured resonant frequency according to a corresponding relationship between resonant frequency and permittivity. The above-mentioned system for measuring a permittivity is capable of measuring a broader range of permittivity with simplified measurement steps and higher accuracy. A method for measuring a permittivity is also disclosed.
    Type: Application
    Filed: March 20, 2015
    Publication date: May 26, 2016
    Inventors: Tsun-Hsu CHANG, Hsein-Wen CHAO, Wei-Syuan WONG