Patents by Inventor Wei-Yao Chiu
Wei-Yao Chiu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240128324Abstract: A field effect transistor includes a substrate having a transistor forming region thereon; an insulating layer on the substrate; a first graphene layer on the insulating layer within the transistor forming region; an etch stop layer on the first graphene layer within the transistor forming region; a first inter-layer dielectric layer on the etch stop layer; a gate trench recessed into the first inter-layer dielectric layer and the etch stop layer within the transistor forming region; a second graphene layer on interior surface of the gate trench; a gate dielectric layer on the second graphene layer and on the first inter-layer dielectric layer; and a gate electrode on the gate dielectric layer within the gate trench.Type: ApplicationFiled: November 21, 2022Publication date: April 18, 2024Applicant: UNITED MICROELECTRONICS CORP.Inventors: Kuo-Chih Lai, Shih-Min Chou, Nien-Ting Ho, Wei-Ming Hsiao, Li-Han Chen, Szu-Yao Yu, Chung-Yi Chiu
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Patent number: 10636133Abstract: An automated optical inspection (AOI) image classification method includes sending a plurality of NG information of a plurality of samples from an AOI device into an Artificial Intelligence (AI) module; performing discrete output calculation on the NG information of the samples by the AI module to obtain a plurality of classification information of the samples; performing kernel function calculation on the classification information of the samples by the AI module to calculate respective similarity distances of the samples and performing weighting analysis; based on weighting analysis results of the samples, judging classification results of the samples; and based on the classification results of the samples, performing classification of the samples.Type: GrantFiled: December 19, 2017Date of Patent: April 28, 2020Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Keng-Hao Chang, Wei-Yao Chiu, Ya-Hui Tsai, Jwu-Sheng Hu
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Patent number: 10516822Abstract: The present disclosure provides an image merging method. The image merging method includes the following step. First, the calibration unit is provided, wherein a calibration device of the calibration unit includes a plurality of known characteristic information. The calibration device is captured. A conversion relationship is created. A relationship of positions of the images is analysis according to the conversion relationship. The images are formed. In additional, an image merging device is provided.Type: GrantFiled: December 29, 2015Date of Patent: December 24, 2019Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Chin-Kuei Chang, Shang-Chieh Lu, Wei-Yao Chiu, Bor-Tung Jiang
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Publication number: 20190178809Abstract: A detecting method for a workpiece surface includes the following steps. Firstly, a workpiece is provided with a first environment, wherein the first environment has a first environmental temperature higher than a first saturation temperature corresponding to an environmental-relative humidity. Then, the workpiece is provided with a second environment, wherein the second environment has a second environmental temperature lower than the first environmental temperature, such that a itself-temperature of the workpiece reduces to a mist temperature, wherein the mist temperature is substantially equal to or higher than the second environmental temperature. Then, the workpiece is provided with a mist environment, wherein the mist environment has a mist-saturation temperature corresponding to a mist-environmental relative humidity is equal to or higher than the mist temperature for misting a surface of the workpiece. Then, the surface of the misted workpiece is detected.Type: ApplicationFiled: February 14, 2019Publication date: June 13, 2019Inventors: Wei-Yao CHIU, Kuo-Feng HUNG, Yu-Ting LIN, Keng-Hao CHANG
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Publication number: 20190130555Abstract: An automated optical inspection (AOI) image classification method includes sending a plurality of NG information of a plurality of samples from an AOI device into an Artificial Intelligence (AI) module; performing discrete output calculation on the NG information of the samples by the AI module to obtain a plurality of classification information of the samples; performing kernel function calculation on the classification information of the samples by the AI module to calculate respective similarity distances of the samples and performing weighting analysis; based on weighting analysis results of the samples, judging classification results of the samples; and based on the classification results of the samples, performing classification of the samples.Type: ApplicationFiled: December 19, 2017Publication date: May 2, 2019Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Keng-Hao CHANG, Wei-Yao CHIU, Ya-Hui TSAI, Jwu-Sheng HU
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Patent number: 10261025Abstract: A detecting method for a workpiece surface includes the following steps. Firstly, a workpiece is provided with a first environment, wherein the first environment has a first environmental temperature higher than a first saturation temperature corresponding to an environmental-relative humidity. Then, the workpiece is provided with a second environment, wherein the second environment has a second environmental temperature lower than the first environmental temperature, such that a itself-temperature of the workpiece reduces to a mist temperature, wherein the mist temperature is substantially equal to or higher than the second environmental temperature. Then, the workpiece is provided with a mist environment, wherein the mist environment has a mist-saturation temperature corresponding to a mist-environmental relative humidity is equal to or higher than the mist temperature for misting a surface of the workpiece. Then, the surface of the misted workpiece is detected.Type: GrantFiled: December 28, 2016Date of Patent: April 16, 2019Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Wei-Yao Chiu, Kuo-Feng Hung, Yu-Ting Lin, Keng-Hao Chang
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Publication number: 20180128750Abstract: A detecting method for a workpiece surface includes the following steps. Firstly, a workpiece is provided with a first environment, wherein the first environment has a first environmental temperature higher than a first saturation temperature corresponding to an environmental-relative humidity. Then, the workpiece is provided with a second environment, wherein the second environment has a second environmental temperature lower than the first environmental temperature, such that a itself-temperature of the workpiece reduces to a mist temperature, wherein the mist temperature is substantially equal to or higher than the second environmental temperature. Then, the workpiece is provided with a mist environment, wherein the mist environment has a mist-saturation temperature corresponding to a mist-environmental relative humidity is equal to or higher than the mist temperature for misting a surface of the workpiece. Then, the surface of the misted workpiece is detected.Type: ApplicationFiled: December 28, 2016Publication date: May 10, 2018Inventors: Wei-Yao Chiu, Kuo-Feng Hung, Yu-Ting Lin, Keng-Hao Chang
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Publication number: 20170111580Abstract: The present disclosure provides an image merging method. The image merging method includes the following step. First, the calibration unit is provided, wherein a calibration device of the calibration unit includes a plurality of known characteristic information. The calibration device is captured. A conversion relationship is created. A relationship of positions of the images is analysis according to the conversion relationship. The images are formed. In additional, an image merging device is provided.Type: ApplicationFiled: December 29, 2015Publication date: April 20, 2017Inventors: CHIN-KUEI CHANG, SHANG-CHIEH LU, WEI-YAO CHIU, BOR-TUNG JIANG
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Patent number: 9613465Abstract: The present disclosure discloses a method for suturing 3D coordinate information. The method includes disposing a correction block on a test platform; capturing first 3D coordinate information represented by a first viewing angle and second 3D coordinate information represented by a second viewing angle from the correction block; determining a first center coordinate of the first 3D coordinate information and a second center coordinate of the second 3D coordinate information; superimposing the first 3D coordinate information to the second 3D coordinate information to form first overlap 3D coordinate information; suturing the first 3D coordinate information into the second 3D coordinate information to form a first 3D coordinate suturing result according to an iterative closet point algorithm; and determining a first transformation relation of the first viewing angle versus the second viewing angle according to the first 3D coordinate information and the first 3D coordinate suturing result.Type: GrantFiled: December 21, 2015Date of Patent: April 4, 2017Assignee: Industrial Technology Research InstituteInventors: Ya-Hui Tsai, Wei-Yao Chiu, Chin-Kuei Chang, Yu-Ting Lin, Keng-Hao Chang