Abstract: Integrated circuits with phase-locked loops are provided. Phase-locked loops may include an oscillator, a phase-frequency detector, a charge pump, a loop filter, a voltage-controlled oscillator, and a programmable divider. The voltage-controlled oscillator may include multiple inductors, an oscillator circuit, and a buffer circuit. A selected one of the multiple inductors may be actively connected to the oscillator circuit. The voltage-controlled oscillators may have multiple oscillator circuits. Each oscillator circuit may be connected to a respective inductor, may include a varactor, and may be powered by a respective voltage regulator. Each oscillator circuit may be coupled to a respective input transistor pair in the buffer circuit through associated coupling capacitors. A selected one of the oscillator circuits may be turned on during normal operation by supplying a high voltage to the selected one of the oscillator circuit and by supply a ground voltage to the remaining oscillator circuits.

Abstract: Integrated circuits with phase-locked loops are provided. Phase-locked loops may include an oscillator, a phase-frequency detector, a charge pump, a loop filter, a voltage-controlled oscillator, and a programmable divider. The voltage-controlled oscillator may include multiple inductors, an oscillator circuit, and a buffer circuit. A selected one of the multiple inductors may be actively connected to the oscillator circuit. The voltage-controlled oscillators may have multiple oscillator circuits. Each oscillator circuit may be connected to a respective inductor, may include a varactor, and may be powered by a respective voltage regulator. Each oscillator circuit may be coupled to a respective input transistor pair in the buffer circuit through associated coupling capacitors. A selected one of the oscillator circuits may be turned on during normal operation by supplying a high voltage to the selected one of the oscillator circuit and by supply a ground voltage to the remaining oscillator circuits.

Abstract: A high-speed differential comparator circuit is provided with an accurately adjustable threshold voltage. Differential reference voltage signals are provided to control the threshold voltage of the comparator. The common mode voltage of the reference signals preferably tracks the common mode voltage of the differential high-speed serial data signal being processed by the comparator circuit.

Abstract: Signal detection circuitry for a serial interface oversamples the input—i.e., samples the input multiple times per clock cycle—so that the likelihood of missing a signal is reduced. Sampling may be done with a regenerative latch which has a large bandwidth and can latch a signal at high speed. The amplitude threshold for detection may be programmable, particularly in a programmable device. Thus, between the use of a regenerative latch which is likely to catch any signal that might be present, and the use of oversampling to avoid the problem of sampling at the wrong time, the likelihood of failing to detect a signal is greatly diminished. Logic, such as a state machine, may be used to determine whether the samples captured s do or do not represent a signal. That logic may be programmable, allowing a user to set various parameters for signal detection.

Abstract: A transmitter circuit is operable to provide an output signal in response to a first periodic signal. A multiplexer circuit is operable to provide a second periodic signal as a selected signal during a first phase of operation. The multiplexer circuit is operable to provide the output signal of the transmitter circuit as the selected signal during a second phase of operation. A sampler circuit is operable to generate first samples of the selected signal during the first phase of operation. The sampler circuit is operable to generate second samples of the selected signal during the second phase of operation. A duty cycle control circuit is operable to adjust a duty cycle of the first periodic signal based on the first and the second samples.

Abstract: A high-speed differential comparator circuit is provided with an accurately adjustable threshold voltage. Differential reference voltage signals are provided to control the threshold voltage of the comparator. The common mode voltage of the reference signals preferably tracks the common mode voltage of the differential high-speed serial data signal being processed by the comparator circuit.

Abstract: One embodiment relates to an integrated circuit including a first strip of phase-locked loop (PLL) circuits on a first side of the integrated circuit, and a second strip of PLL circuits on a second side of the integrated circuit which is opposite from the first side. The PLL circuits in the first and second strips may be configured by programming the integrated circuit. Another embodiment relates to an integrated circuit including a plurality of phase-locked loop (PLL) circuits and a plurality of physical media attachment (PMA) triplet modules adjacent to the plurality of PLL circuits. Each PMA triplet module includes first, second and third channels. The first and third channels are arranged for use as receiving channels, and the second channel is arranged to be configurable as either a receiving channel or a clock multiplication unit. Other embodiments and features are also disclosed.

Abstract: One embodiment relates to a method for activating an interface on an integrated circuit while a core of the integrated circuit is becoming operational. An offset calibration for a transceiver channel is performed by physical media attachment circuitry. A transmitting frequency is locked onto by a transmitter phase-locked loop for the transceiver channel, and a receiving frequency is locked onto by a receiver phase-locked loop for the transceiver channel. Subsequently, the interface is activated while a core component of the integrated circuit is becoming operational. Another embodiment pertains to an integrated circuit which includes transceiver channel circuits, an interface processor, and a reset control state machine. Another embodiment relates to control circuitry including a reset control state machine, transceiver channel circuits, a channel input steering multiplexer, and a channel output steering multiplexer. Other embodiments, aspects and features are also disclosed.

Abstract: An integrated circuit (e.g., a programmable integrated circuit such as a programmable microcontroller, a programmable logic device, etc.) includes programmable circuitry and 10 Gigabit Ethernet (10 GbE) transceiver circuitry. The programmable circuitry and the transceiver circuitry may be configured to implement the physical (PHY) layer of the 10 GbE networking specification. This integrated circuit may then be coupled to an optical transceiver module in order to transmit and receive 10 GbE optical signals. The transceiver circuitry and interface circuitry that connects the transceiver circuitry with the programmable circuitry may be hard-wired or partially hard-wired.

Abstract: A buffer circuit includes a current source circuit, first and second switch circuits that are coupled to the current source circuit, a first resistor coupled to the first switch circuit, a second resistor coupled to the second switch circuit, and a third switch circuit coupled to the first and the second resistors. The third switch circuit couples the first and the second resistors to a node at a first voltage when the buffer circuit is configured to function in a current mode logic buffer mode. The third switch circuit couples the first and the second resistors to a node at a second voltage when the buffer circuit is configured to function in an H-bridge buffer mode.

Abstract: An IC that includes an eye viewer and a BER checker coupled to the eye viewer, where the BER checker receives a serial data signal from the eye viewer, is provided. In one implementation, the BER checker receives the serial data signal from the eye viewer without the serial data signal passing through a deserializer. In one implementation, the BER checker compares the serial data signal against a reference data signal to determine the BER for the serial data signal. In one implementation, the IC includes an IC core coupled to the eye viewer and the BER checker, where the BER checker is outside the IC core. In one implementation, the BER checker is a dedicated BER checker. In one implementation, the BER checker includes an exclusive OR gate, a programmable delay circuit coupled to the exclusive OR gate, and an error counter coupled to the exclusive OR gate.

Abstract: An integrated circuit (“IC”) may include circuitry for use in testing a serial data signal. The IC may include circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. The IC may also include circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. The IC may provide output signals indicative of results of its operations. The IC can operate in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.

Abstract: High-speed serial data signal transmitter and/or receiver circuitry is able to dynamically switch between handling data at two (or more) different data rates. Such a switch can be made very rapidly and with no requirement for reprogramming or reconfiguring the circuitry. Circuitry for glitchlessly switching between clock signals having different frequencies is also provided and may be used in the above-mentioned transmitter and/or receiver circuitry.

Abstract: In some embodiments, a feedback loop circuit includes a phase detector, first and second charge pumps that are each coupled to receive an output signal of the phase detector, a first low pass filter, a second low pass filter coupled to an output of the second charge pump, a clock signal generation circuit having first and second control inputs, a first switch circuit coupled between the first low pass filter and the second low pass filter, and a second switch circuit coupled to the first low pass filter and the first control input of the clock signal generation circuit.

Abstract: A loss-of-signal detector includes digital and analog monitoring of incoming data. The incoming signal is compared digitally to at least one predetermined pattern that may indicate a loss of signal, and also is monitored by an analog detector that detects transitions in the data. If the digital comparison fails to match any of the at least one predetermined pattern, or if transitions are detected by the analog monitoring, even if the digital comparison produces a pattern match, then loss of signal is not indicated.

Abstract: Methods and apparatus for gathering information about the eye of a high-speed serial data signal include sampling each bit of a repeating, multi-bit data pattern at several eye slice locations. For any given eye slice location, each bit in the data pattern is compared in voltage to a base line reference signal voltage to establish a reference value for that bit. Then the reference signal voltage is gradually increased while the voltage comparisons are repeated until for some bit a result of the comparing is different than the reference value for that bit. This establishes an upper value for the eye at the eye slice location. The reference signal voltage is then gradually decreased to similarly find a lower value for that eye slice.

Abstract: Methods and apparatus for determining at least part of the width of the eye of a high-speed serial data signal use clock and data recovery circuitry operating on that signal to produce a first clock signal having a first phase relationship to the data signal. The first clock signal is used to produce a second clock signal whose phase can be controllably shifted relative to the first phase. The second clock signal is used to sample the data signal with different amounts of phase shift, e.g., until error checking circuitry detects that data errors in the resulting sample exceed an acceptable threshold for such errors. The amount(s) of phase shift that caused exceeding the threshold can be used as a basis for a measurement of eye width.

Abstract: A level shifter circuit includes an input circuit, an inverter, a pull-up circuit, and a pull-down circuit. The input circuit generates a pull-up signal in response to an input signal using charge from a supply voltage. The inverter inverts the input signal to generate a pull-down signal. The inverter comprises complementary transistors that receive charge from the supply voltage. The pull-up circuit pulls a level shifted output signal of the level shifter circuit to the supply voltage in response to the pull-up signal. The pull-down circuit pulls the level shifted output signal to a low voltage in response to the pull-down signal.

Abstract: Integrated circuits with phase-locked loops are provided. Phase-locked loops may include an oscillator, a phase-frequency detector, a charge pump, a loop filter, a voltage-controlled oscillator, and a programmable divider. The voltage-controlled oscillator may include multiple inductors, an oscillator circuit, and a buffer circuit. A selected one of the multiple inductors may be actively connected to the oscillator circuit. The voltage-controlled oscillators may have multiple oscillator circuits. Each oscillator circuit may be connected to a respective inductor, may include a varactor, and may be powered by a respective voltage regulator. Each oscillator circuit may be coupled to a respective input transistor pair in the buffer circuit through associated coupling capacitors. A selected one of the oscillator circuits may be turned on during normal operation by supplying a high voltage to the selected one of the oscillator circuit and by supply a ground voltage to the remaining oscillator circuits.

Abstract: A loss-of-signal detector includes digital and analog monitoring of incoming data. The incoming signal is compared digitally to at least one predetermined pattern that may indicate a loss of signal, and also is monitored by an analog detector that detects transitions in the data. If the digital comparison fails to match any of the at least one predetermined pattern, or if transitions are detected by the analog monitoring, even if the digital comparison produces a pattern match, then loss of signal is not indicated.