Patents by Inventor Wendell McCulley

Wendell McCulley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Single crystal silicon sensor with high aspect ratio and curvilinear structures and associated method
    Publication number: 20030205739
    Abstract: In one aspect, the invention provides semiconductor sensor which includes a first single crystal silicon wafer layer. A single crystal silicon structure is formed in the first wafer layer. The structure includes two oppositely disposed substantially vertical major surfaces and two oppositely disposed generally horizontal minor surfaces. The aspect ratio of major surface to minor surface is at least 5:1. A carrier which includes a recessed region is secured to the first wafer layer such that said structure is suspended opposite the recessed region.
    Type: Application
    Filed: August 11, 2001
    Publication date: November 6, 2003
    Inventors: Kurt E. Petersen, Nadim Maluf, Wendell McCulley, John Logan, Erno Klaasen, Jan Mark Noworolski
  • Single crystal silicon sensor with high aspect ratio and curvilinear structures
    Patent number: 6316796
    Abstract: In one aspect, the invention provides a semiconductor sensor which includes a first single crystal silicon wafer layer. A single crystal silicon structure is formed in the first wafer layer. The structure includes two oppositely disposed substantially vertical major surfaces and two oppositely disposed generally horizontal minor surfaces. The aspect ratio of major surface to minor surface is at least 5:1. A carrier which includes a recessed region is secured to the first wafer layer such that said structure is suspended opposite the recessed region.
    Type: Grant
    Filed: May 23, 1996
    Date of Patent: November 13, 2001
    Assignee: Lucas NovaSensor
    Inventors: Kurt E. Petersen, Nadim Maluf, Wendell McCulley, John Logan, Erno Klaasen, Jan Mark Noworolski
  • Single crystal silicon sensor with high aspect ratio and curvilinear structures and associated method
    Publication number: 20010020726
    Abstract: In one aspect, the invention provides semiconductor sensor which includes a first single crystal silicon wafer layer. A single crystal silicon structure is formed in the first wafer layer. The structure includes two oppositely disposed substantially vertical major surfaces and two oppositely disposed generally horizontal minor surfaces. The aspect ratio of major surface to minor surface is at least 5:1. A carrier which includes a recessed region is secured to the first wafer layer such that said structure is suspended opposite the recessed region.
    Type: Application
    Filed: March 21, 2001
    Publication date: September 13, 2001
    Inventors: Kurt Peterson, Nadim Maluf, Wendell McCulley, John Logan, Erno Klaasen, Jan Noworolski
  • Apparatus for measuring multiple pressures
    Patent number: 6220101
    Abstract: The apparatus includes a housing; a plurality of sensors mounted on the housing, each of the sensors including a sensing element and an electrical output connected to said sensing element. The apparatus also includes a plurality of inputs connected to the sensors, respectively, to transmit to the sensors. A circuit is mounted in the housing and in electrical connection with the electrical outputs to provide a common signal conditioner for the sensors.
    Type: Grant
    Filed: February 2, 1999
    Date of Patent: April 24, 2001
    Assignee: SSI Technologies, Inc.
    Inventors: James Schloss, James Seefeldt, Carol Spicuzza, Gary Ryall, Wendell McCulley, Paul Rozgo, Jesse Marcelle
  • Single crystal silicon sensor with high aspect ratio and curvilinear structures
    Patent number: 6084257
    Abstract: In one aspect, the invention provides semiconductor sensor which includes a first single crystal silicon wafer layer. A single crystal silicon structure is formed in the first wafer layer. The structure includes two oppositely disposed substantially vertical major surfaces and two oppositely disposed generally horizontal minor surfaces. The aspect ratio of major surface to minor surface is at least 5:1. A carrier which includes a recessed region is secured to the first wafer layer such that said structure is suspended opposite the recessed region.
    Type: Grant
    Filed: May 24, 1995
    Date of Patent: July 4, 2000
    Assignee: Lucas NovaSensor
    Inventors: Kurt E. Petersen, Nadim Maluf, Wendell McCulley, John Logan, Erno Klaasen, Jan M. Noworolski