Patents by Inventor Willem G. J. Langeveld
Willem G. J. Langeveld has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20160341847Abstract: The present specification describes security systems for screening threats contained on persons, and more specifically, to an integrated detection system that is highly portable and that employs Enhanced Metal Detection (EMD) along with Advanced Imaging Technology (using backscatter X-ray scanning) to achieve Automated Threat Recognition (ATR) improvements. In particular, the present specification describes a modular inspection system for detecting objects carried by or on a human subject that includes a plurality of sections having an X-ray source, two backscatter X-ray detector panels and at least one metal detector panel; a first strapping means to hold together two of the plurality of sections that are folded and form a portable first case; and a second strapping means to hold together two of the plurality of sections that are folded and form a portable second case such that the first and second cases can be wheeled to and from a checkpoint.Type: ApplicationFiled: July 15, 2013Publication date: November 24, 2016Applicant: Rapiscan Systems, Inc.Inventors: Luis E. Arroyo, Jr., Dan Strellis, Willem G. J. Langeveld
-
Patent number: 9435752Abstract: The present application discloses scanner systems that have a radiation generator arranged to generate radiation to irradiate an object, a detector arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and processors arranged to process each of the detector data sets thereby to generate a control output.Type: GrantFiled: February 3, 2011Date of Patent: September 6, 2016Assignee: Rapiscan Systems, Inc.Inventors: Edward James Morton, Joseph Bendahan, Willem G. J. Langeveld
-
Publication number: 20160223706Abstract: The present specification discloses methods for inspecting liquids, aerosols and gels (LAGs) for threats. The method includes scanning LAGs packed in plastic bags in a multiple step process. In a primary scan, the bag is scanned using dual energy CT technique with fan beam radiation. In case of an alarm, the alarming LAG container is scanned again using coherent X-ray scatter technique with cone beam radiation. The system has a mechanism to switch between two collimators to produce either fan beam or cone beam. The system also has a mechanism to position the target properly for scanning and prevent container overlap when scanning multiple LAG containers in a bag.Type: ApplicationFiled: January 14, 2016Publication date: August 4, 2016Inventors: Edward D. Franco, Willem G.J. Langeveld, Joseph Bendahan, Martin Janecek, Dan Strellis
-
Patent number: 9404875Abstract: The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.Type: GrantFiled: March 28, 2014Date of Patent: August 2, 2016Assignee: Rapiscan Systems, Inc.Inventor: Willem G. J. Langeveld
-
Patent number: 9052264Abstract: A scanner system comprises: a radiation generator arranged to generate radiation to irradiate an object, the radiation generator comprising a radiation source arranged to produce radiation and a filter arranged to provide variable filtering of the radiation from the source; a detector structure arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and a processing system arranged to process each of the detector data sets thereby to generate a control output arranged to control the radiation generator so as to vary the filtering, thereby to vary the radiation output by the radiation generator as the object is scanned.Type: GrantFiled: August 3, 2012Date of Patent: June 9, 2015Assignee: Rapiscan Systems, Inc.Inventors: Joseph Bendahan, Willem G. J. Langeveld
-
Publication number: 20140341340Abstract: The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.Type: ApplicationFiled: March 28, 2014Publication date: November 20, 2014Applicant: Rapiscan Systems, Inc.Inventor: Willem G.J. Langeveld
-
Publication number: 20140222402Abstract: The present specification discloses an X-ray scanning system having a shield surrounding an X-ray source of an X-ray inspection system, the shield comprising a first material or a combination of the first material and a second material; and a thickness that keeps a radiation dose below a predefined limit at a plurality of locations on a boundary of a defined exclusion zone, wherein the plurality of locations change as the X-ray source moves in a scan direction, and wherein the thickness of the shield varies non-uniformly as a function of a plurality of angles of radiation.Type: ApplicationFiled: February 6, 2014Publication date: August 7, 2014Applicant: Rapiscan Systems, Inc.Inventors: Willem G.J. Langeveld, Edward D. Franco
-
Patent number: 8781067Abstract: The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.Type: GrantFiled: April 10, 2013Date of Patent: July 15, 2014Assignee: Rapiscan Systems, Inc.Inventors: Willem G. J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
-
Publication number: 20130129043Abstract: The present application discloses scanner systems that have a radiation generator arranged to generate radiation to irradiate an object, a detector arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and processors arranged to process each of the detector data sets thereby to generate a control output.Type: ApplicationFiled: February 3, 2011Publication date: May 23, 2013Inventors: Edward James Morton, Joseph Bendahan, Willem G.J. Langeveld
-
Patent number: 8437448Abstract: The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.Type: GrantFiled: September 29, 2011Date of Patent: May 7, 2013Assignee: Rapiscan Systems, Inc.Inventors: Willem G. J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
-
Publication number: 20120257719Abstract: The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.Type: ApplicationFiled: September 29, 2011Publication date: October 11, 2012Inventors: Willem G.J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
-
Patent number: 8054937Abstract: The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.Type: GrantFiled: June 12, 2009Date of Patent: November 8, 2011Assignee: Rapiscan Systems, Inc.Inventors: Willem G. J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
-
Publication number: 20100034355Abstract: The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.Type: ApplicationFiled: June 12, 2009Publication date: February 11, 2010Inventors: Willem G.J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg